New atom probe approaches to studying segregation in nanocrystalline materials
Samudrala, S.K., Felfer, P.J., Araullo-Peters, V.J., Cao, Y., Liao, X.Z., Cairney, J.M.Volume:
132
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2012.12.013
Date:
September, 2013
File:
PDF, 6.76 MB
english, 2013