Volume 132

Ultramicroscopy

Volume 132

1

Correlative multi-scale characterization of a fine grained Nd–Fe–B sintered magnet

Sasaki, T.T., Ohkubo, T., Hono, K., Une, Y., Sagawa, M.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.35 MB

english, 2013

2

Understanding the detection of carbon in austenitic high-Mn steel using atom probe tomography

Marceau, R.K.W., Choi, P., Raabe, D.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 3.06 MB

english, 2013

3

Atomic engineering of platinum alloy surfaces

Li, Tong, Bagot, P.A.J., Marquis, E.A., Edman Tsang, S.C., Smith, G.D.W.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.13 MB

english, 2013

4

Nano-analysis of grain boundary and triple junction transport in nanocrystalline Ni/Cu

Reda Chellali, Mohammed, Balogh, Zoltan, Schmitz, Guido

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.28 MB

english, 2013

5

Optimal laser positioning for laser-assisted atom probe tomography

Koelling, S., Innocenti, N., Bogdanowicz, J., Vandervorst, W.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 811 KB

english, 2013

6

On the interaction of an ultra-fast laser with a nanometric tip by laser assisted atom probe tomography: A review

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 4.08 MB

english, 2013

7

Phase separation in equiatomic AlCoCrFeNi high-entropy alloy

Manzoni, A., Daoud, H., Völkl, R., Glatzel, U., Wanderka, N.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 972 KB

english, 2013

8

Quantitative dopant distributions in GaAs nanowires using atom probe tomography

Du, Sichao, Burgess, Timothy, Gault, Baptiste, Gao, Qiang, Bao, Peite, Li, Li, Cui, Xiangyuan, Kong Yeoh, Wai, Liu, Hongwei, Yao, Lan, Ceguerra, Anna V., Hoe Tan, Hark, Jagadish, Chennupati, Ringer, S

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 4.26 MB

english, 2013

9

Reconstructing atom probe data: A review

Vurpillot, Francois, Gault, Baptiste, Geiser, Brian P., Larson, D.J.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 4.48 MB

english, 2013

10

New atom probe approaches to studying segregation in nanocrystalline materials

Samudrala, S.K., Felfer, P.J., Araullo-Peters, V.J., Cao, Y., Liao, X.Z., Cairney, J.M.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 6.76 MB

english, 2013

11

Information extraction from FN plots of tungsten microemitters

Mussa, Khalil O., Mousa, Marwan S., Fischer, Andreas

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 720 KB

english, 2013

12

Field evaporation of oxides: A theoretical study

Karahka, Markus, Kreuzer, H.J.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 2.28 MB

english, 2013

13

Electrostatic simulations of a local electrode atom probe: The dependence of tomographic reconstruction parameters on specimen and microscope geometry

Loi, Shyeh Tjing, Gault, Baptiste, Ringer, Simon P., Larson, David J., Geiser, Brian P.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 792 KB

english, 2013

14

3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography

Kambham, Ajay Kumar, Kumar, Arul, Gilbert, Matthieu, Vandervorst, Wilfried

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.88 MB

english, 2013

15

Reduction of multiple hits in atom probe tomography

Thuvander, Mattias, Kvist, Anders, Johnson, Lars J.S., Weidow, Jonathan, Andrén, Hans-Olof

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 826 KB

english, 2013

16

A model to predict image formation in Atom probeTomography

Vurpillot, F., Gaillard, A., Da Costa, G., Deconihout, B.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 2.17 MB

english, 2013

17

Atomic scale investigation of redistribution of alloying elements in pearlitic steel wires upon cold-drawing and annealing

Li, Y.J., Choi, P., Goto, S., Borchers, C., Raabe, D., Kirchheim, R.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 8.18 MB

english, 2013

18

Tunable field emission characteristics of ZnO nanowires coated with varied thickness of lanthanum boride thin films

Zhao, C.X., Li, Y.F., Chen, Jun, Deng, S.Z., Xu, N.S.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 3.03 MB

english, 2013

19

Atom probe tomography investigation of lath boundary segregation and precipitation in a maraging stainless steel

Thuvander, Mattias, Andersson, Marcus, Stiller, Krystyna

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 3.28 MB

english, 2013

20

Contents

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 38 KB

english, 2013

21

Preface

Thompson, Gregory B., Weaver, Mark L., Martens, Richard

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.11 MB

english, 2013

22

Defining clusters in APT reconstructions of ODS steels

Williams, Ceri A., Haley, Daniel, Marquis, Emmanuelle A., Smith, George D.W., Moody, Michael P.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 2.63 MB

english, 2013

23

Hydrogen analysis in APT: Methods to control adsorption and dissociation of H2

Sundell, G., Thuvander, M., Andrén, H.-O.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.26 MB

english, 2013

24

Dielectric effect on electric fields in the vicinity of the metal–vacuum–dielectric junction

Chung, M.S., Mayer, A., Miskovsky, N.M., Weiss, B.L., Cutler, P.H.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 2.02 MB

english, 2013

25

Sr–Al–Si co-segregated regions in eutectic Si phase of Sr-modified Al–10Si alloy

Timpel, M., Wanderka, N., Schlesiger, R., Yamamoto, T., Isheim, D., Schmitz, G., Matsumura, S., Banhart, J.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 3.39 MB

english, 2013

26

IFC (Editorial Board)

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 78 KB

english, 2013

27

Mapping energetics of atom probe evaporation events through first principles calculations

Peralta, Joaquín, Broderick, Scott R., Rajan, Krishna

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.40 MB

english, 2013

28

Combined nano-SIMS/AFM/EBSD analysis and atom probe tomography, of carbon distribution in austenite/ε-martensite high-Mn steels

Seol, Jae-Bok, Lee, B.-H, Choi, P., Lee, S.-G., Park, C.-G.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 2.87 MB

english, 2013

29

Spatial decomposition of molecular ions within 3D atom probe reconstructions

Breen, Andrew, Moody, Michael P., Gault, Baptiste, Ceguerra, Anna V., Xie, Kelvin Y., Du, Sichao, Ringer, Simon P.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 3.10 MB

english, 2013

30

Effect of external stress on the Fe–Cr phase separation in 15-5 PH and Fe–15Cr–5Ni alloys

Danoix, F., Lacaze, J., Gibert, A., Mangelinck, D., Hoummada, K., Andrieu, E.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.42 MB

english, 2013

31

Atom probe tomography analysis of WC powder

Weidow, Jonathan

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.81 MB

english, 2013

32

Commemoration II for IFES 2012

Kreuzer, Hans-Jürgen

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 155 KB

english, 2013

33

Coupling atom probe tomography and photoluminescence spectroscopy: Exploratory results and perspectives

Rigutti, Lorenzo, Vella, Angela, Vurpillot, François, Gaillard, Aurore, Sevelin-Radiguet, Nicolas, Houard, Jonathan, Hideur, Ammar, Martel, Gilles, Jacopin, Gwénolé, Luna Bugallo, Andrés De, Deconihou

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.84 MB

english, 2013

34

Effect of Mg or Ag addition on the evaporation field of Al

Aruga, Yasuhiro, Nako, Hidenori, Tsuneishi, Hidemasa, Hasegawa, Yuki, Tao, Hiroaki, Ichihara, Chikara, Serizawa, Ai

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.10 MB

english, 2013

35

Phase transformation in SiOx/SiO2 multilayers for optoelectronics and microelectronics applications

Roussel, M., Talbot, E., Pratibha Nalini, R., Gourbilleau, F., Pareige, P.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 3.74 MB

english, 2013

36

Data mining for isotope discrimination in atom probe tomography

Broderick, Scott R., Bryden, Aaron, Suram, Santosh K., Rajan, Krishna

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 4.19 MB

english, 2013

37

Atomic insight into Ge1−xSnx using atom probe tomography

Kumar, Arul, Komalan, Manu P., Lenka, Haraprasanna, Kambham, Ajay Kumar, Gilbert, Matthieu, Gencarelli, Federica, Vincent, Benjamin, Vandervorst, Wilfried

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 4.28 MB

english, 2013

38

Influence of experimental parameters on the composition of precipitates in metallic alloys

Gasnier, Virgile, Gault, Baptiste, Nako, Hidenori, Aruga, Yasuhiro, Sha, Gang, Ringer, Simon P.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 2.70 MB

english, 2013

39

Atom probe tomography of thermally grown oxide scale on FeCrAl

Liu, Fang, Stiller, Krystyna

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.36 MB

english, 2013

40

Point process statistics in atom probe tomography

Philippe, T., Duguay, S., Grancher, G., Blavette, D.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.47 MB

english, 2013

41

In commemoration of Prof. Dr.-Ing. Johannes Mitterauer (1936–2012)

Wanderka, Nelia, Kruse, Norbert

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 174 KB

english, 2013

42

Analysis of implanted silicon dopant profiles

Prosa, T.J., Olson, D., Geiser, B., Larson, D.J., Henry, K., Steel, E.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.62 MB

english, 2013

43

Calibration of reconstruction parameters in atom probe tomography using a single crystallographic orientation

Suram, Santosh K., Rajan, Krishna

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 2.95 MB

english, 2013

44

Statistical analysis of composition fluctuations and short-range order in stoichiometric Ni–Cr–Mo alloys

Verma, A., Wanderka, N., Singh, J.B., Kumar, B., Banhart, J.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.90 MB

english, 2013

45

Defect analysis by statistical fitting to 3D atomicmaps

Balogh, Zoltán, Oberdorfer, Christian, Chellali, Mohammed Reda, Stender, Patrick, Nowak, Susann, Schmitz, Guido

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.67 MB

english, 2013

46

Blind deconvolution of time-of-flight mass spectra from atom probe tomography

Johnson, L.J.S., Thuvander, M., Stiller, K., Odén, M., Hultman, L.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 492 KB

english, 2013

47

Interactive visualization of APT data at full fidelity

Bryden, Aaron, Broderick, Scott, Suram, Santosh K., Kaluskar, Kaustubh, LeSar, Richard, Rajan, Krishna

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 8.25 MB

english, 2013

48

Applying computational geometry techniques for advanced feature analysis in atom probe data

Felfer, Peter, Ceguerra, Anna, Ringer, Simon, Cairney, Julie

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 2.98 MB

english, 2013

49

Quantitative methods for the APT analysis of thermally aged RPV steels

Styman, Paul D., Hyde, Jonathan M., Wilford, Keith, Smith, George D.W.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 5.36 MB

english, 2013