Exploring Pd–Si(001) and Pd–Si(111) thin-film reactions by...

Thin Solid Films 2013 / 3 Vol. 530

Exploring Pd–Si(001) and Pd–Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements

Richard, M.-I., Fouet, J., Guichet, C., Mocuta, C., Thomas, O.
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Volume:
530
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2012.11.030
Date:
March, 2013
File:
PDF, 791 KB
english, 2013
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