Volume 530

Thin Solid Films

Volume 530

1

Atomistic interpretation of microstrain in diffraction line profile analysis

Leonardi, Alberto, Leoni, Matteo, Scardi, Paolo

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.04 MB

english, 2013

2

Grazing incidence X-ray diffraction for the study of polycrystalline layers

Simeone, David, Baldinozzi, Gianguido, Gosset, Dominique, Le Caer, Sophie, Bérar, Jean-François

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 494 KB

english, 2013

3

On X-ray diffraction study of preferred grain orientations in polycrystalline thin films — Multicomponent texture in KTaO3 films

Kužel, R., Buršík, J.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 661 KB

english, 2013

4

Strain inhomogeneity in copper islands probed by coherent X-ray diffraction

Beutier, G., Verdier, M., Parry, G., Gilles, B., Labat, S., Richard, M.-I., Cornelius, T., Lory, P.-F., Vu Hoang, S., Livet, F., Thomas, O., de Boissieu, M.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.48 MB

english, 2013

5

Stress measurement in coarse grained material with high-resolution X-ray beams

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 289 KB

english, 2013

6

Deformation modes of nanostructured thin film under controlled biaxial deformation

Djaziri, S., Faurie, D., Le Bourhis, E., Goudeau, Ph., Renault, P.-O., Mocuta, C., Thiaudière, D., Hild, F.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 710 KB

english, 2013

7

Solid State Nuclear Magnetic Resonance and X-ray Diffraction Line Profile Analysis of heavily deformed fluorite

Abdellatief, M., Abele, M., Leoni, M., Scardi, P.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 523 KB

english, 2013

8

Determination of composition, residual stress and stacking fault depth profiles in expanded austenite with energy-dispersive diffraction

Jegou, S., Christiansen, T.L., Klaus, M., Genzel, Ch., Somers, M.A.J.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 631 KB

english, 2013

9

Exploring Pd–Si(001) and Pd–Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements

Richard, M.-I., Fouet, J., Guichet, C., Mocuta, C., Thomas, O.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 791 KB

english, 2013

10

Mechanisms of copper direct bonding observed by in-situ and quantitative transmission electron microscopy

Martinez, M., Legros, M., Signamarcheix, T., Bally, L., Verrun, S., Di Cioccio, L., Deguet, C.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 587 KB

english, 2013

11

Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements

Murray, Conal E., Polvino, S.M., Noyan, I.C., Cai, Z., Maser, J., Holt, M.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 835 KB

english, 2013

12

Stress measurements in tungsten coated through silicon vias for 3D integration

Krauss, C., Labat, S., Escoubas, S., Thomas, O., Carniello, S., Teva, J., Schrank, F.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.05 MB

english, 2013

13

Diffraction residual stress analysis in technical components — Status and prospects

Manns, T., Scholtes, B.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.48 MB

english, 2013

14

In situ coherent X-ray diffraction of isolated core–shell nanowires

Haag, Sabine T., Richard, Marie-Ingrid, Favre-Nicolin, Vincent, Welzel, Udo, Jeurgens, Lars P.H., Ravy, Sylvain, Richter, Gunther, Mittemeijer, Eric J., Thomas, Olivier

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.14 MB

english, 2013

15

The effect of beta irradiation on morphology and micro hardness of polypropylene thin layers

Manas, David, Hribova, Martina, Manas, Miroslav, Ovsik, Martin, Stanek, Michal, Samek, David

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 619 KB

english, 2013

16

Multireflection grazing incidence diffraction used for stress measurements in surface layers

Marciszko, M., Baczmański, A., Wróbel, M., Seiler, W., Braham, C., Donges, J., Śniechowski, M., Wierzbanowski, K.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 443 KB

english, 2013

17

Stress gradients and grain interaction determination in electrodeposited coatings by synchrotron radiation

Ortolani, M., Azanza Ricardo, C.L., Lausi, A., Scardi, P.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 505 KB

english, 2013

18

Size&Strain VI

Thomas, O., Guinebretière, R.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 89 KB

english, 2013

19

Editorial Board

Journal:

Thin Solid Films

Year:

2013

File:

PDF, 55 KB

2013

20

Atomistic modeling of lattice relaxation in metallic nanocrystals

Gelisio, L., Beyerlein, K.R., Scardi, P.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.39 MB

english, 2013

21

In situ X-ray diffraction study of stacking fault formation in the near-surface region of transformation induced plasticity steels

Rafaja, David, Krbetschek, Christina, Borisova, Daria, Schreiber, Gerhard, Klemm, Volker

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.08 MB

english, 2013

22

Sin2 ψ analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure

Faurie, D., Geandier, G., Renault, P.-O., Le Bourhis, E., Thiaudière, D.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.42 MB

english, 2013

23

Deformation mechanisms in nanocrystalline metals: Insights from in-situ diffraction and crystal plasticity modelling

Van Petegem, S., Li, L., Anderson, P.M., Van Swygenhoven, H.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 579 KB

english, 2013

24

Comparison of strain/stress behaviour of a duplex stainless steel between mesoscopic and macroscopic scales by neutron measurements extended to the necking range

François, M., Panicaud, B., Le Joncour, L., Baczmański, A., Paradowska, A., Wroński, S., Gadalińska, E.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 304 KB

english, 2013

25

Twin boundary-induced intrinsic strengthening in Ni

Barabash, R.I., Rollett, A., Lebensohn, R.A., Barabash, O.M., Liu, W., Pang, J.W.L.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.42 MB

english, 2013