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Electrical Instability of Double-Gate a-IGZO TFTs With Metal Source/Drain Recessed Electrodes
Baek, Gwanghyeon, Bie, Linsen, Abe, Katsumi, Kumomi, Hideya, Kanicki, JerzyVolume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2307352
Date:
April, 2014
File:
PDF, 2.14 MB
english, 2014