Volume 61; Issue 4

IEEE Transactions on Electron Devices

Volume 61; Issue 4

1

Performance Analysis of Graphene Nanoribbon Field Effect Transistors in the Presence of Surface Roughness

Sanaeepur, Majid, Goharrizi, Arash Yazdanpanah, Sharifi, Mohammad Javad

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.35 MB

english, 2014

2

Numerical Study of Very Small Floating Islands

Watanabe, Hiroshi, Yao, Kira, Lin, Jerry

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.29 MB

english, 2014

3

Monotron Oscillation in Double-Gap Coupling Output Cavities of Multiple-Beam Klystrons

Lin, Fu-Min, Li, Xiao-Peng

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 968 KB

english, 2014

4

Electrical Instability of Double-Gate a-IGZO TFTs With Metal Source/Drain Recessed Electrodes

Baek, Gwanghyeon, Bie, Linsen, Abe, Katsumi, Kumomi, Hideya, Kanicki, Jerzy

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.14 MB

english, 2014

5

Electrically Stable, Solution-Processed Amorphous Oxide IZO Thin-Film Transistors Through a UV-Ozone Assisted Sol-Gel Approach

Singh, Thokchom Birendra, Jasieniak, Jacek Jaroslaw, de Oliveira Tozi, Leonardo, Easton, Christopher David, Bown, Mark

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.42 MB

english, 2014

6

Complementary Magnetic Tunnel Junction Logic

Friedman, Joseph S., Sahakian, Alan V.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 649 KB

english, 2014

7

A Conjoined Electron and Thermal Transport Study of Thermal Degradation Induced During Normal Operation of Multigate Transistors

Mohamed, Mohamed, Aksamija, Zlatan, Vitale, Wolfgang, Hassan, Fawad, Park, Kyeong-Hyun, Ravaioli, Umberto

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.00 MB

english, 2014

8

Memristor: Part I—The Underlying Physics and Conduction Mechanism

Mazady, Anas, Anwar, Mehdi

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 600 KB

english, 2014

9

A Thickness-Mode AlGaN/GaN Resonant Body High Electron Mobility Transistor

Ansari, Azadeh, Rais-Zadeh, Mina

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.01 MB

english, 2014

10

Memristor: Part II–DC, Transient, and RF Analysis

Mazady, Anas, Anwar, Mehdi

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.22 MB

english, 2014

11

Modeling of the Gate Leakage Current in AlGaN/GaN HFETs

Goswami, Arunesh, Trew, Robert J., Bilbro, Griff L.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.36 MB

english, 2014

12

A Comprehensive Graphene FET Model for Circuit Design

Rodriguez, Saul, Vaziri, Sam, Smith, Anderson, Fregonese, Sebastien, Ostling, Mikael, Lemme, Max C., Rusu, Ana

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.72 MB

english, 2014

13

Top-Down Fabrication of Epitaxial SiGe/Si Multi-(Core/Shell) p-FET Nanowire Transistors

Barraud, Sylvain, Hartmann, Jean-Michel, Maffini-Alvaro, Virginie, Tosti, Lucie, Delaye, Vincent, Lafond, Dominique

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 965 KB

english, 2014

14

IEEE Transactions on Electron Devices publication information

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 149 KB

english, 2014

15

Table of contents

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 507 KB

english, 2014

16

A Warm Welcome to Two New T-ED Editors

Cressler, John D.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 266 KB

english, 2014

17

Design Metrics Improvement for SRAMs Using Symmetric Dual-$k$ Spacer (SymD-$k$) FinFETs

Pal, Pankaj Kumar, Kaushik, Brajesh Kumar, Dasgupta, Sudeb

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.72 MB

english, 2014

18

Low-Frequency Noise Sources in Advanced UTBB FD-SOI MOSFETs

Theodorou, Christoforos G., Ioannidis, Eleftherios G., Andrieu, Francois, Poiroux, Thierry, Faynot, Olivier, Dimitriadis, Charalabos A., Ghibaudo, Gerard

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.21 MB

english, 2014

19

Analytical Modeling of Threshold Voltage and Interface Ideality Factor of Nanoscale Ultrathin Body and Buried Oxide SOI MOSFETs With Back Gate Control

Fasarakis, Nikolaos, Karatsori, Theano, Tassis, Dimitrios H., Theodorou, Christoforos G., Andrieu, Francois, Faynot, Olivier, Ghibaudo, Gerard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.51 MB

english, 2014

20

Optimal AlGaN/GaN HEMT Buffer Layer Thickness in the Presence of an Embedded Thermal Boundary

Babic, Dubravko I.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 588 KB

english, 2014

21

Accuracy of Microwave Transistor $f_{\rm T}$ and $f_{\rm MAX}$ Extractions

Teppati, Valeria, Tirelli, Stefano, Lovblom, Rickard, Fluckiger, Ralf, Alexandrova, Maria, Bolognesi, C. R.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 990 KB

english, 2014

22

Analysis of Harmonic Distortion in UDG-MOSFETs

Dutta, Arka, Koley, Kalyan, Saha, Samar K., Sarkar, Chandan Kumar

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.08 MB

english, 2014

23

Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High-$k$ Gated MOSFETs by a Modified Charge Pumping Technique

Lu, Chun-Chang, Chang-Liao, Kuei-Shu, Tsao, Che-Hao, Wang, Tien-Ko, Ko, Hsueh-Chao, Hsu, Yao-Tung

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.89 MB

english, 2014

24

Experimental Investigation on Alloy Scattering in sSi/${\rm Si}_{0.5}{\rm Ge}_{0.5}$/sSOI Quantum-Well p-MOSFET

Yu, Wenjie, Wu, Wangran, Zhang, Bo, Liu, Chang, Sun, Jiabao, Zhai, Dongyuan, Yu, Yuehui, Wang, Xi, Shi, Yi, Zhao, Yi, Zhao, Qing-Tai

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 762 KB

english, 2014

25

The Resistivity of Zinc Oxide Under Different Annealing Configurations and Its Impact on the Leakage Characteristics of Zinc Oxide Thin-Film Transistors

Lu, Lei, Wong, Man

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.80 MB

english, 2014

26

New Models for Impact Ionization in Submicrometer Devices

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 722 KB

english, 2014

27

Comprehensive Study of the Complex Dynamics of Forward Bias-Induced Threshold Voltage Drifts in GaN Based MIS-HEMTs by Stress/Recovery Experiments

Lagger, Peter, Reiner, Maria, Pogany, Dionyz, Ostermaier, Clemens

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.10 MB

english, 2014

28

Current Noise and AC Response of a Back-Gated Single-Molecule Junction

Zhu, Wen-Huan, Ding, Guo-Hui, Dong, Bing

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.17 MB

english, 2014

29

Toward Conformal Damage-Free Doping With Abrupt Ultrashallow Junction: Formation of Si Monolayers and Laser Anneal as a Novel Doping Technique for InGaAs nMOSFETs

Kong, Eugene Y.-J., Guo, Pengfei, Gong, Xiao, Liu, Bin, Yeo, Yee-Chia

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.07 MB

english, 2014

30

Characteristic Evolution From Rectifier Schottky Diode to Resistive-Switching Memory With Al-Doped Zinc Tin Oxide Film

Fan, Yang-Shun, Liu, Po-Tsun

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.14 MB

english, 2014

31

Investigation of Key Technologies for Poly-Si/TaN/HfLaON/IL ${\rm SiO}_{2}$ Gate-Stacks in Advanced Device Applications

Xu, Qiuxia, Xu, Gaobo, Li, Yongliang, Zhou, Huajie, Li, Junfeng, Niu, Jiebin, Ding, Mingzheng, Chen, Dapeng, Ye, Tianchun

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.79 MB

english, 2014

32

All-Solution-Processed Low-Voltage Organic Thin-Film Transistor Inverter on Plastic Substrate

Feng, Linrun, Tang, Wei, Zhao, Jiaqing, Cui, Qingyu, Jiang, Chen, Guo, Xiaojun

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.26 MB

english, 2014

33

Studies of Safe Operating Area of InGaP/GaAs Heterojunction Bipolar Transistors

Lee, Chien-Ping, Tao, Nick G. M., Lin, Barry Jia-Fu

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.05 MB

english, 2014

34

Low-Temperature Bonded Cu/In Interconnect With High Thermal Stability for 3-D Integration

Chien, Yu-San, Huang, Yan-Pin, Tzeng, Ruoh-Ning, Shy, Ming-Shaw, Lin, Teu-Hua, Chen, Kou-Hua, Chiu, Chi-Tsung, Chuang, Ching-Te, Hwang, Wei, Chiou, Jin-Chern, Tong, Ho-Ming, Chen, Kuan-Neng

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1006 KB

english, 2014

35

Heat Dissipation in Resistive Switching Devices: Comparison of Thermal Simulations and Experimental Results

Yalon, Eilam, Riess, Ilan, Ritter, Dan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.26 MB

english, 2014

36

Numerical Computation of Dispersion Curves in Arbitrary Cylindrical Metal SWSs Without Approximating the Boundary Shape With Fourier Series Expansion

Zhang, Dian, Zhang, Jun, Zhong, Hui-Huang, Jin, Zhen-Xing

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.68 MB

english, 2014

37

Fast 3-D Electrothermal Device/Circuit Simulation of Power Superjunction MOSFET Based on SDevice and HSPICE Interaction

Chvala, Ales, Donoval, Daniel, Marek, Juraj, Pribytny, Patrik, Molnar, Marian, Mikolasek, Miroslav

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.55 MB

english, 2014

38

Fast Analytical Modeling of Dynamic Thermal Behavior of Semiconductor Devices and Circuits

Kwok, Kai H., d'Alessandro, Vincenzo

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.25 MB

english, 2014

39

Simulation and Investigation of Random Grain-Boundary-Induced Variabilities for Stackable NAND Flash Using 3-D Voronoi Grain Patterns

Yang, Ching-Wei, Su, Pin

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.45 MB

english, 2014

40

Current Components and Their Temperature Dependence of Green and Blue Light-Emitting Diodes: A Quantitative Comparison

Kim, Da-Woon, Lee, Young-Chan, Ryu, Jong-Ok, Kim, Sang-Bae

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 3.26 MB

english, 2014

41

Influence of Mechanical Bending on Flexible InGaZnO-Based Ferroelectric Memory TFTs

Petti, Luisa, Munzenrieder, Niko, Salvatore, Giovanni A., Zysset, Christoph, Kinkeldei, Thomas, Buthe, Lars, Troster, Gerhard

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.46 MB

english, 2014

42

Stack Gate Technique for Dopingless Bulk FinFETs

Liao, Yi-Bo, Chiang, Meng-Hsueh, Lai, Yu-Sheng, Hsu, Wei-Chou

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.68 MB

english, 2014

43

Modeling Quasi-Static Characteristics of Devices Consisting of Silicon, Dielectrics, and Conductors Based on Their Helmholtz Free Energy

Sattar, Md Abdus, Gunther, Norman, Rahman, Mahmudur

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.81 MB

english, 2014

44

[Blank page - back cover]

Journal:

IEEE Transactions on Electron Devices

Year:

2014

File:

PDF, 8 KB

2014

45

IEEE Transactions on Electron Devices information for authors

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 110 KB

english, 2014

46

Special issue on wide bandgap semiconductor power devices for energy efficiency and renewable energy utilization

Journal:

IEEE Transactions on Electron Devices

Year:

2014

File:

PDF, 732 KB

2014

47

Special issue on variation aware technology and circuit co design

Journal:

IEEE Transactions on Electron Devices

Year:

2014

File:

PDF, 639 KB

2014

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