Reduction of Negative Bias and Light Instability of a-IGZO...

IEEE Electron Device Letters 2014 / 01 Vol. 35; Iss. 1

Reduction of Negative Bias and Light Instability of a-IGZO TFTs by Dual-Gate Driving

Hong, Sejin, Lee, Suhui, Mativenga, Mallory, Jang, Jin
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Volume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2290740
Date:
January, 2014
File:
PDF, 1.35 MB
english, 2014
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