Volume 35; Issue 1

IEEE Electron Device Letters

Volume 35; Issue 1

1

Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias

Feng, Wei, Dou, Chun Meng, Niwa, Masaaki, Yamada, Keisaku, Ohmori, Kenji

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 507 KB

english, 2014

2

Low-Leakage-Current DRAM-Like Memory Using a One-Transistor Ferroelectric MOSFET With a Hf-Based Gate Dielectric

Cheng, Chun-Hu, Chin, Albert

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 379 KB

english, 2014

3

Research on a Highly Sensitive Magnetic-Catalytic CMOS-MEMS Compatible Gas Sensor

Shen, Chih-Hsiung, Ke, Shi-Ching

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 736 KB

english, 2014

4

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

I-Chung Chiu,, I-Chun Cheng,

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 803 KB

english, 2014

5

Reduction of Negative Bias and Light Instability of a-IGZO TFTs by Dual-Gate Driving

Hong, Sejin, Lee, Suhui, Mativenga, Mallory, Jang, Jin

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 1.35 MB

english, 2014

6

Electrical and Reliability Characteristics of High-$\kappa~{\rm HoTiO}_{3}~\alpha$-InGaZnO Thin-Film Transistors

Pan, Tung-Ming, Chen, Ching-Hung, Liu, Jiang-Hung, Her, Jim-Long, Koyama, Keiichi

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 429 KB

english, 2014

7

Separation of Corner Component in TAT Mechanism in Retention Characteristics of Sub 20-nm NAND Flash Memory

Lee, Kyunghwan, Kang, Myounggon, Seo, Seongjun, Kang, Duckseoung, Li, Dong Hua, Hwang, Yuchul, Shin, Hyungcheol

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 789 KB

english, 2014

8

High-Performance Metal-Insulator-Metal Tunnel Diode Selectors

Govoreanu, Bogdan, Adelmann, Christoph, Redolfi, Augusto, Zhang, Leqi, Clima, Sergiu, Jurczak, Malgorzata

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 1.06 MB

english, 2014

9

Impact of Donor Traps on the 2DEG and Electrical Behavior of AlGaN/GaN MISFETs

Longobardi, Giorgia, Udrea, Florin, Sque, Stephen, Hurkx, Godefridus A. M., Croon, Jeroen, Napoli, Ettore, Sonsky, Jan

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 430 KB

english, 2014

10

Improvement of Light Trapping in a-Si:H-Based Solar Cells by Inserting a ZnO/LiF Double Interlayer

Yang, Ji-Hwan, Myong, Seung Yeop, Lim, Koeng Su

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 492 KB

english, 2014

11

A Simple Low Cost Monolithic Transformer for High-Voltage Gate Driver Applications

Peng, Lulu, Wu, Rongxiang, Fang, Xiangming, Toyoda, Yoshiaki, Akahane, Masashi, Yamaji, Masaharu, Sumida, Hitoshi, Sin, Johnny K. O.

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 490 KB

english, 2014

12

Dual Floating Gate Unified Memory MOSFET With Simultaneous Dynamic and Non-Volatile Operation

Sarkar, Biplab, Ramanan, Narayanan, Jayanti, Srikant, Spigna, Neil Di, Lee, Bongmook, Franzon, Paul, Misra, Veena

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 469 KB

english, 2014

13

Two-Dimensional Tunnel Transistors Based on ${\rm Bi}_{2}{\rm Se}_{3}$ Thin Film

Zhang, Qin, Iannaccone, Giuseppe, Fiori, Gianluca

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 425 KB

english, 2014

14

Resistive Switching Performance Improvement of ${\rm Ta}_{2}{\rm O}_{5-x}/{\rm TaO}_{y}$ Bilayer ReRAM Devices by Inserting ${\rm AlO}_{\delta}$ Barrier Layer

Wu, Huaqiang, Li, Xinyi, Wu, Minghao, Huang, Feiyang, Yu, Zhiping, Qian, He

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 634 KB

english, 2014

15

Area and Thickness Scaling of Forming Voltage of Resistive Switching Memories

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 801 KB

english, 2014

16

Enhancing the Performance of Germanium Channel nMOSFET Using Phosphorus Dopant Segregation

Chen, Che-Wei, Tzeng, Ju-Yuan, Chung, Cheng-Ting, Chien, Hung-Pin, Chien, Chao-Hsin, Luo, Guang-Li, Wang, Pei-Yu, Tsui, Bing-Yue

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 401 KB

english, 2014

17

High Temperature Characteristics of GaN-Based Inverter Integrated With Enhancement-Mode (E-Mode) MOSFET and Depletion-Mode (D-Mode) HEMT

Xu, Zhe, Wang, Jinyan, Cai, Yong, Liu, Jingqian, Yang, Zhen, Li, Xiaoping, Wang, Maojun, Yu, Min, Xie, Bing, Wu, Wengang, Ma, Xiaohua, Zhang, Jincheng, Hao, Yue

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 597 KB

english, 2014

18

Fabrication and Characterization of a Planar Triode Structure Based on Honeycomb Carbon Nanotubes

Qu, Ke, Lei, Wei, Li, Chi, Di, Yunsong, Chen, Jing, Zhang, Yan, Ding, Shuyi, Zhao, Ning, Cui, Yunkang, Zhang, Xiaobing, Wang, Baoping

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 884 KB

english, 2014

19

Two-Dimensional Numerical Simulation of Bottom-Gate and Dual-Gate Amorphous In-Ga-Zn-O MESFETs

Zhao, Chumin, Bie, Linsen, Zhang, Rui, Kanicki, Jerzy

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 885 KB

english, 2014

20

Improvement of $V_{\rm th}$ Instability in Normally-Off GaN MIS-HEMTs Employing ${\rm PEALD}\hbox{-}{\rm SiN}_{\rm x}$ as an Interfacial Layer

Choi, Woojin, Ryu, Hojin, Jeon, Namcheol, Lee, Minseong, Cha, Ho-Young, Seo, Kwang-Seok

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 815 KB

english, 2014

21

A Memristor SPICE Model Accounting for Volatile Characteristics of Practical ReRAM

Berdan, Radu, Lim, Chuan, Khiat, Ali, Papavassiliou, Christos, Prodromakis, Themis

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 656 KB

english, 2014

22

Flexible Self-Aligned Double-Gate IGZO TFT

Munzenrieder, Niko, Voser, Pascal, Petti, Luisa, Zysset, Christoph, Buthe, Lars, Vogt, Christian, Salvatore, Giovanni A., Troster, Gerhard

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 681 KB

english, 2014

23

Body-Tied Germanium Tri-Gate Junctionless PMOSFET With In-Situ Boron Doped Channel

Chen, Che-Wei, Chung, Cheng-Ting, Tzeng, Ju-Yuan, Chang, Pang-Sheng, Luo, Guang-Li, Chien, Chao-Hsin

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 635 KB

english, 2014

24

A Novel SNOS Gate-Controlled, Normally-Off p-i-n Switch

Zhou, Xianda, Feng, Hao, Sin, Johnny K. O.

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 733 KB

english, 2014

25

Barrier Properties of CVD Mn Oxide Layer to Cu Diffusion for 3-D TSV

Lee, Kang-Wook, Wang, Hao, Bea, Ji-Cheol, Murugesan, Mariappan, Sutou, Yuji, Fukushima, Takafumi, Tanaka, Tetsu, Koike, Junichi, Koyanagi, Mitsumasa

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 422 KB

english, 2014

26

Crosstalk-Free Single Photon Avalanche Photodiodes Located in a Shared Well

Vila, Anna, Vilella, Eva, Alonso, Oscar, Dieguez, Angel

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 912 KB

english, 2014

27

Performance Enhancement on an InGaP/InGaAs PHEMT With an Electrophoretic Deposition Gate Structure

Chen, Chun-Chia, Chen, Huey-Ing, Chou, Po-Cheng, Liou, Jian-Kai, Chiou, Yung-Jen, Tsai, Jung-Hui, Liu, Wen-Chau

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 980 KB

english, 2014

28

${\rm HfO}_{2}$ Based High-$k$ Inter-Gate Dielectrics for Planar NAND Flash Memory

Breuil, Laurent, Lisoni, Judit G., Blomme, Pieter, Van den Bosch, Geert, Van Houdt, Jan

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 549 KB

english, 2014

29

The Effect of Incomplete Ionization on the Turn-Off Behavior of FS IGBTs

Hsieh, Alice Pei-Shan, Camuso, Gianluca, Udrea, Florin, Tang, Yi, Ng, Chiu, Ranjan, Niraj, Charles, Alain

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 1.08 MB

english, 2014

30

Control of Cu Conductive Filament in Complementary Atom Switch for Cross-Point Selector Device Application

Woo, Jiyong, Lee, Daeseok, Cha, Euijun, Lee, Sangheon, Park, Sangsu, Hwang, Hyunsang

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 760 KB

english, 2014

31

Threshold Voltage and IR Drop Compensation of an AMOLED Pixel Circuit Without a $V_{\rm DD}$ Line

Lee, Jae-Pyo, Jeon, Ho-Sik, Moon, Dong-Sung, Bae, Byung Seong

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 458 KB

english, 2014

32

A Fast $I{-}V$ Screening Measurement for TDDB Assessment of Ultra-Thick Inter-Metal Dielectrics

Elhami Khorasani, Arash, Griswold, Mark, Alford, T. L.

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 422 KB

english, 2014

33

Thin-Film Heterojunction Field-Effect Transistors With Crystalline Si Channels and Low-Temperature PECVD Contacts

Hekmatshoar, Bahman

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 406 KB

english, 2014

34

High-Frequency Modulation of GaAs/AlGaAs LEDs Using Ga-Doped ZnO Current Spreading Layers

Chen, Shang-Fu, Syu, He-Long, Huang, Chi-Chen, Lee, Yueh-Lin, Ho, Chong-Long, Wu, Meng-Chyi

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 499 KB

english, 2014

35

Enhanced Field Emission of ${\rm TiO}_{2}$ Nanowires With UV Illumination

Wang, Sin Hui, Tsai, Tsung Ying, Chang, Shoou Jinn, Weng, Wen Yin, Chang, Sheng Po, Hsu, Cheng Liang

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 588 KB

english, 2014

36

An Explicit Surface-Potential-Based Model for Amorphous IGZO Thin-Film Transistors Including Both Tail and Deep States

Deng, Wanling, Huang, Junkai, Ma, Xiaoyu, Ning, Tao

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 503 KB

english, 2014

37

Comparative Study of High-$k/{\rm GaSb}$ Interfaces for Use in Antimonide Based MOSFETs

Bhuwalka, Krishna K., Wang, Shih Wei, Noriega, Odille C., Holland, Martin C., Contreras-Guerrero, Rocio, Edirisooriya, Madavie, Doornbos, Gerben, Wang, Chien-Hsun, Myers, Thomas H., Droopad, Ravi, Pas

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 486 KB

english, 2014

38

Interfacial Failure in Flexible Electronic Devices

Chen, Hang, Lu, Bing-Wei, Lin, Yuan, Feng, Xue

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 404 KB

english, 2014

39

Unified Analytic Model for Current–Voltage Behavior in Amorphous Oxide Semiconductor TFTs

Lee, Sungsik, Striakhilev, Denis, Jeon, Sanghun, Nathan, Arokia

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 838 KB

english, 2014

40

Doping-Free Intrinsic Amorphous Silicon Thin-Film Solar Cell Having a Simple Structure of ${\rm Glass}/{\rm SnO}_{2}/{\rm MoO}_{3}/{\rm i}\hbox{-}{\rm a}\hbox{-}{\rm Si}/{\rm LiF}/{\rm Al}$

Yang, Ji-Hwan, Kang, Sang Jung, Hong, Yunho, Lim, Koeng Su

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 654 KB

english, 2014

41

Analytical Theory for Extracting Specific Contact Resistances of Thick Samples From the Transmission Line Method

Eidelloth, Stefan, Brendel, Rolf

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 311 KB

english, 2014

42

Improvement of RF Performance by Using Tunnel Diode Body Contact Structure in PD SOI nMOSFETs

Lu, Kai, Chen, Jing, Luo, Jiexin, Liu, Jun, Wu, Qingqing, Chai, Zhan, Wang, Xi

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 542 KB

english, 2014

43

CMOS On-Chip Stable True-Random ID Generation Using Antenna Effect

Tang, Fang, Chen, Denis G., Wang, Bo, Bermak, Amine, Amira, Abbes, Mohamad, Saqib

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 803 KB

english, 2014

44

High Mobility Bilayer Metal–Oxide Thin Film Transistors Using Titanium-Doped InGaZnO

Hsu, Hsiao-Hsuan, Chang, Chun-Yen, Cheng, Chun-Hu, Chiou, Shan-Haw, Huang, Chiung-Hui

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 1.44 MB

english, 2014

45

Elementary Aspects for Circuit Implementation of Reconfigurable Nanowire Transistors

Trommer, Jens, Heinzig, Andre, Slesazeck, Stefan, Mikolajick, Thomas, Weber, Walter Michael

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 1.10 MB

english, 2014

46

0.5 THz Performance of a Type-II DHBT With a Doping-Graded and Constant-Composition GaAsSb Base

Xu, Huiming, Wu, Barry, Iverson, Eric W., Low, Thomas S., Feng, Milton

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 474 KB

english, 2014

47

Suppression of Read Disturb Fail Caused by Boosting Hot Carrier Injection Effect for 3-D Stack NAND Flash Memories

Choe, Byeong-In, Lee, Jung-Kyu, Park, Byung-Gook, Lee, Jong-Ho

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 760 KB

english, 2014

48

Table of contents

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 157 KB

english, 2014

49

Table of contents

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 166 KB

english, 2014

50

IEEE Electron Device Letters information for authors

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 113 KB

english, 2014

51

2014 Symposium on VLSI Technology

Journal:

IEEE Electron Device Letters

Year:

2014

File:

PDF, 852 KB

2014

52

[Blank page - back cover]

Journal:

IEEE Electron Device Letters

Year:

2014

File:

PDF, 5 KB

2014

53

IEEE Electron Device Letters publication information

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 148 KB

english, 2014

54

IEEE Electron Devices Society Meetings Calendar (As of 10/11/2013)

Journal:

IEEE Electron Device Letters

Year:

2014

File:

PDF, 766 KB

2014

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