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Electrical and Reliability Characteristics of High-$\kappa~{\rm HoTiO}_{3}~\alpha$-InGaZnO Thin-Film Transistors
Pan, Tung-Ming, Chen, Ching-Hung, Liu, Jiang-Hung, Her, Jim-Long, Koyama, KeiichiVolume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2287349
Date:
January, 2014
File:
PDF, 429 KB
english, 2014