Methodology for the Study of Dynamic ON-Resistance in...

IEEE Transactions on Electron Devices 2013 / 10 Vol. 60; Iss. 10

Methodology for the Study of Dynamic ON-Resistance in High-Voltage GaN Field-Effect Transistors

Jin, Donghyun, del Alamo, Jesus A.
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2274477
Date:
October, 2013
File:
PDF, 1.90 MB
english, 2013
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