High-Performance InAs-On-Insulator n-MOSFETs With Ni-InGaAs S/D Realized by Contact Resistance Reduction Technology
Kim, SangHyeon, Yokoyama, Masafumi, Nakane, Ryosho, Ichikawa, Osamu, Osada, Takenori, Hata, Masahiko, Takenaka, Mitsuru, Takagi, ShinichiVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2279363
Date:
October, 2013
File:
PDF, 2.32 MB
english, 2013