Accelerated temperature testing of transistors does not...

Accelerated temperature testing of transistors does not cause excess flicker noise

S.K. Khobare
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Volume:
22
Year:
1982
Language:
english
Pages:
3
DOI:
10.1016/0026-2714(82)90019-1
File:
PDF, 3.50 MB
english, 1982
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