Volume 22; Issue 3

Microelectronics Reliability

Volume 22; Issue 3

1

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 120 KB

english, 1982

2

Publications, notices, calls for papers, etc

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 395 KB

english, 1982

3

International Symposium on Physicochemical Aspects of Polymer Surfaces New York City 24th – 28th August 1981

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 139 KB

english, 1982

4

Topological layout of links for optimizing the s-t reliability in a computer communication system

K.K. Aggarwal, Y.C. Chopra, J.S. Bajwa

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 262 KB

english, 1982

5

Maintenance of reliable real time systems: Hardware versus software tradeoffs

Inder M. Soi, K.K. Aggarwal

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 468 KB

english, 1982

6

Designing reliable communication networks in a planned failure environment

Inder M. Soi, K.K. Aggarwal

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 267 KB

english, 1982

7

An n-unit standby redundant system with r repair facilities and preventive maintenance

R. Subramanian, R. Natarajan

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 481 KB

english, 1982

8

Operational repairable equipments and the duane model

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 362 KB

english, 1982

9

Une modelisation bayesienne du taux de defaillance en fiabilite

Journal:

Microelectronics Reliability

Year:

1982

File:

PDF, 618 KB

1982

10

s-expected busy period of 1-server 2-unit warm standby system subject to different repair strategies

M.N. Gopalan, J. Natesan

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 243 KB

english, 1982

11

A system with two subsystems working in alternating periods

K. Murari, C. Maruthachalam

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 308 KB

english, 1982

12

Quadrilateral-star transformation—I. Transformation equations

J.P. Gadani, K.B. Misra

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 256 KB

english, 1982

13

Quadrilateral-star transformation—II. Algorithmic aspects

J.P. Gadani, K.B. Misra

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 398 KB

english, 1982

14

Accelerated temperature testing of transistors does not cause excess flicker noise

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 3.50 MB

english, 1982

15

A petri net approach to enumerate all system success paths for reliability evaluation of a complex system

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 119 KB

english, 1982

16

Petri net approach to the analysis of a structured program

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 227 KB

english, 1982

17

An intermittently used n-unit complex system

Y.V.S. Sarma, R. Natarajan

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 200 KB

english, 1982

18

Optimal structure of sensor systems composed of nonidentical sensors

Takehisa Kohda, Hiromitsu Kumamoto, Koichi Inoue, Isao Takami

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 387 KB

english, 1982

19

A semi-regenerative process of two-unit warm standby system

Kohyu Uematsu, Masashi Kowada

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 216 KB

english, 1982

20

Principles of manufacturing data management

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 1.51 MB

english, 1982

21

Weapons systems analysis, part I: System effectiveness

Y.S. Sherif, N.A. Kheir

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 1.67 MB

english, 1982

22

An alternate approach to syndrome algebra for diagnostics

Winfrid Schneeweiss

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 238 KB

english, 1982

23

On the canonical representation of homogeneous markov processes modelling failure - time distributions

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 699 KB

english, 1982

24

Bounds of age replacement time

T. Nakagawa, K. Yasui

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 194 KB

english, 1982

25

Etch delineation of defects in phosphosilicate glass layers

Shyam G. Garg, Joseph H. Nevin, Richard A. Bailey, Stephen A. Sefick

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 3.04 MB

english, 1982

26

Software reliability - bibliography

Balbir S. Dhillon

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 611 KB

english, 1982

27

Bibliography of literature on transit system reliability

Balbir S. Dhillon

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 388 KB

english, 1982

28

Foundations for microstrip circuit design: T.C. Edwards Publishers : John Wiley & Sons Baffins Lane, Chichester, West Sussex, England, P019 1UD. Price : £12.75. (ISBN 0 471 27944 7)

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 54 KB

english, 1982

29

Life testing and reliability estimation: S.K. Sinha and B.K. Kale Publishers: Wiley Eastern Limited 4835/24, Ansari Road, Daryaganj, New Delhi 110002, India. Price : £ 4. 50. (ISBN 0 85226 820 3)

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 63 KB

english, 1982

30

Failure diagnosis and performance monitoring: by L.F. Pau Publisher: Marcel Dekker, Inc., Copyrighted 1981 - U.S.A., 1975 - France

Richard M. Jacobs

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 74 KB

english, 1982

31

Editorial

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 48 KB

english, 1982

32

Modification of cutsets for reliability evaluation of communication systems

K.K. Aggarwal, Y.C. Chopra, J.S. Bajwa

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 297 KB

english, 1982

33

Topological layout of links for optimising the overall reliability in a computer communication system

K.K. Aggarwal, Y.C. Chopra, J.S. Bajwa

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 326 KB

english, 1982

34

Effect of gamma irradiation on the low-frequency (1/̷) noise of linear ics: Reliability physics study

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 200 KB

english, 1982

35

Cost-benefit analysis of a 1-server 2-unit system subject to different repair strategies

M.N. Gopalan, J. Natesan

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 263 KB

english, 1982

36

Petri net as a modeling tool

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 652 KB

english, 1982

37

Reliability study of duplex-hybrid systems

F. Lombardi, V.Obac Roda, Md.M. Islam

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 378 KB

english, 1982

38

s̱-expected busy period of the service facility of a 1-server n-unit system subject to arbitrary failure and different repair strategies

M.N. Gopalan, J. Natesan

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 322 KB

english, 1982

39

Stochastic models for predicting human reliability

Balbir S. Dhillon

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 174 KB

english, 1982

40

Dc leakage currents in trichloroethylene oxides

Kiran M. Bhatt, Joseph H. Nevin

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 185 KB

english, 1982

41

A repairable multistate system with several degraded states and common-cause failures

Mitsuo Yamashiro

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 137 KB

english, 1982

42

Transit vehicle reliability models

Balbir S. Dhillon

Journal:

Microelectronics Reliability

Year:

1982

Language:

english

File:

PDF, 182 KB

english, 1982