4377819 Semiconductor device

Microelectronics Reliability 1983 Vol. 23; Iss. 6

4377819 Semiconductor device

Yoshio Sakai, Toshiaki Masuhara, Osamu Minato, Toshio Saski, Hisao Katto, Norikazu Hashimoto, Shin-ichi Maramatsu, Akihiro Tomozawa
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Volume:
23
Year:
1983
Language:
english
DOI:
10.1016/0026-2714(83)90973-3
File:
PDF, 70 KB
english, 1983
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