Volume 23; Issue 6

Microelectronics Reliability

Volume 23; Issue 6

1

Publications, notices, calls for papers, etc

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 83 KB

english, 1983

2

A new model of software reliability prediction

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 88 KB

english, 1983

3

Novel technique of determining aluminium quality for S.A.W. devices fabrication on YZ-LiNbO3

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 94 KB

english, 1983

4

Analysis of a two-unit hot standby system with three modes

L.R. Goel, Rakesh Gupta, Praveen Gupta

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 256 KB

english, 1983

5

Stochastic behaviour of a two-unit (dissimilar) hot standby system with three modes

L.R. Goel, Praveen Gupta

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 298 KB

english, 1983

6

Analysis of a two-unit cold standby system with three modes

L.R. Goel, Rakesh Gupta, S.K. Singh

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 255 KB

english, 1983

7

Reliability analysis of multi-unit cold standby system with two operating modes

L.R. Goel, Rakesh Gupta

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 311 KB

english, 1983

8

Reliability analysis of fault tolerant pipeline ring networks

Fabrizio Lombardi

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 305 KB

english, 1983

9

Evaporation induced corrosion of YZ-LiNb03

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 88 KB

english, 1983

10

A life cycle costing methodology for the assessment of process heat generation by solar energy

Yosef S. Sherie

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 226 KB

english, 1983

11

Modelling digital circuits with delays by Stochastic Petri Nets

B. Castagnolo, F. Corsi

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 333 KB

english, 1983

12

Mathematical models for marginal reliability analysis

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 517 KB

english, 1983

13

Measurement technique of electromigration

Y.Z. Lu, Y.C. Cheng

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 793 KB

english, 1983

14

RELVEC — a tool for control system reliability analysis

H.J. Hossi, I.M. Niemelä

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 301 KB

english, 1983

15

Bibliography of literature on nuclear system reliability

Balbir S. Dhillon

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 749 KB

english, 1983

16

Evaporation induced frequency shift in S.A.W. filter

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 89 KB

english, 1983

17

Simultaneous exposure and development technique for S.A.W. device fabrication

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 64 KB

english, 1983

18

Introduction to MOS LSI design: Authors: J. Mavor, M.A. Jack and P.B. Denyer. Publishers: Addison-Wesley Publishing Company, 53, Bedford Square, London, WC1B 3DZ, England. Price: £ 15.95. (ISBN 0 201 14402-6)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 110 KB

english, 1983

19

Electrostatic device damage : J. W. Molyneux Child and G. F. De Voil. Electron. Power, 246 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 99 KB

english, 1983

20

I challenge your beliefs about reliability Part V: planning and policies : John A. Connor. IEEE Trans. Reliab.R-31 (5), 418 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 99 KB

english, 1983

21

Surface mounting of leadless chip carriers on various printed circuit board type substrates : I. G. Lang. Electrocomponent Sci. Technol.10, 13 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 99 KB

english, 1983

22

Electromigration-induced failures in VLSI interconnects : P. B. Ghate. Solid St. Technol., 113 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 99 KB

english, 1983

23

Bipolar Schottky logic device failure modes due to contact metallurgical degradation : C. Canali, F. Fantini and M. Vanzi, G. Soncini and E. Zanoni. Microelectron. Reliab.22 (6), 1155 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 99 KB

english, 1983

24

Analog modeling simulates the faults of electromechanical components : H. D. Jackson. Electronics, 144 (10 March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 99 KB

english, 1983

25

A new package-related failure mechanism for leadless ceramic chip carriers (LC-3s) solder-attached to Alumina substrates : Robert T. Howard, Steven W. Sobeck and Christopher Sanetra. Solid St. Technol., 115 (February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 226 KB

english, 1983

26

Broader functions and improved reliability of printed circuit boards using dry film solder mask systems : M. Weinhold. Circuit World, 9 (2), 29 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 126 KB

english, 1983

27

Influence of emitter edge dislocations on reliability of planar NPN transistors : N. D. Stojadinovic. Microelectron. Reliab.22 (6), 1113 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 126 KB

english, 1983

28

Product quality level monitoring and control for logic chips and modules : D. S. Cleverley. IBM Jl Res. Dev.27 (1), 4 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 126 KB

english, 1983

29

Reliability analysis and investment decision in electric motors for irrigation : Inderpal Singh Kochar. Microelectron. Reliab.23 (1), 173 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 126 KB

english, 1983

30

Defect analysis using QC data : R. C. McBride. Semiconductor Int., 82 (February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 126 KB

english, 1983

31

Probabilistic analysis of a pulverizer system with commoncause failures : B. S. Dhillon and J. Natesan. Microelectron. Reliab.22 (6), 1121 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

32

Application of a software reliability model to decide software release time : J. G. Shanthikumar and S. Tufekci. Microelectron. Reliab.23 (1), 41 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

33

On hardware/software trade-offs in computer system design : Sanjaya Srivastava and Inder M. Soi. Microelectron. Reliab.23 (1), 133 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

34

Synthesis of techniques creates complete system self-test : Donald Komonytsky. Electronics, 110 (10 March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

35

A second-order moments method for uncertainty analysis : Peter S. Jackson. IEEE Trans. Reliab.R-31 (4), 382 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

36

Numerical calculation of mean mission duration : Jonathan D. Lessels. IEEE Trans. Reliab.R-31 (5), 420 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

37

An error analysis for reliability quantification : Yasuhiko Ikebe and Toshiyuki Inagaki. IEEE Trans. Reliab.R-31 (4), 385 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

38

Distribution of a life ratio and its application : Y. Hosono, H. Ohta and S. Kase. IEEE Trans. Reliab.R-31 (4), 373 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

39

Estimation of mixed Weibull parameters in life testing : Smiley W. Cheng and James C. Fu. IEEE Trans. Reliab.R-31 (4), 377 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 259 KB

english, 1983

40

ESCAF—a new and cheap system for complex reliability analysis and computation : A. Laviron, A. Carnino and J. C. Manaranche. IEEE Trans. Reliab.R-31 (4), 339 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

41

Recursive algorithm to evaluate the reliability of a consecutive-k-outof-n: F system: J. George Shanthikumar. IEEE Trans. Reliab.R-31 (5), 442 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

42

On discrete hazard functions : A. A. Salvia and R. C. Bollinger. IEEE Trans. Reliab.R-31 (5), 458 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

43

Reliability evaluation by network decomposition : K. K. Aggarwal, Y. C. Chopra and J. S. Bajwa. IEEE Trans. Reliab.R-31 (4), 355 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

44

Point estimation of the parameter of a truncated exponential distribution : Ronald Suich and Herbert C. Rutemiller. IEEE Trans. Reliab.R-31 (4), 393 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

45

Nonparametric accelerated life testing : A. P. Basu and Nader Ebrahimi. IEEE Trans. Reliab.R-31 (5), 432 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

46

Determining sample size when searching for rare items : Richard W. Madsen and James E. Holstein. IEEE Trans. Reliab.R-31 (5), 451 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

47

Fast algorithm for unavailability and sensitivity analysis of series-parallel systems : Andrea Bobbio and Amedeo Premoli. IEEE Trans. Reliab.R-31 (4), 359 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

48

Fatigue failure models—Birnbaum-Saunders vs inverse Gaussian : G. K. Bhattacharyya and Arthur Fries. IEEE Trans. Reliab.R-31 (5), 439 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

49

Moment identities for nonnegative variables via integrated survival curves : Francisco J. Samaniego. IEEE Trans. Reliab.R-31 (5), 455 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 260 KB

english, 1983

50

On Bayes estimation of reliability for the Birnbaum-Saunders fatigue life model : W. J. Padjett. IEEE Trans. Reliab.R-31 (5), 436 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

51

A cutset approach to reliability evaluation in communication networks : Suresh Rai. IEEE Trans. Reliab.R-31 (5), 428 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

52

Robust procedures for estimating the scale parameter and predicting future order statistics of the Weibull distribution : A. Adatia and L. K. Chan. IEEE Trans. Reliab.R-31 (5), 491 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

53

An analytic method for uncertainty analysis of nonlinear output functions, with applications to fault-tree analysis : David C. Cox. IEEE Trans. Reliab.R-31 (5), 465 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

54

Combinatorial reliability analysis of multiprocessor computers : Kai Hwang and Tian-Pong Chang. IEEE Trans. Reliab.R-31 (5), 469 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

55

Interactive multiobjective optimization by the Sequential Proxy Optimization Technique (SPOT) : Masatoshi Sakawa. IEEE Trans. Reliab.R-31 (5), 461 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

56

Component failure and compensators : Ata Al Hussaini and Robert J. Elliott. IEEE Trans. Reliab.R-31 (5), 449 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

57

Marginal distribution estimators for the Gamma-Prior parameters for a group of Poisson processes : Doris Lloyd Grosh. IEEE Trans. Reliab.R-31 (5), 487 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

58

Bounds on reliability of a noncoherent system using its length & width : Klaus D. Heidtmann. IEEE Trans. Reliab.R-31 (5), 424 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

59

A graphical method applicable to age-replacement problems : Bo Bergman and Bengt Klefsjö. IEEE Trans. Reliab.R-31 (5), 478 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

60

Fast solutions for consecutive-k-out-of-n: F system: F. K. Hwang. IEEE Trans. Reliab.R-31 (5), 447 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

61

Accuracy of univariate, bivariate and a “modified double Monte Carlo” technique for finding lower confidence limits of system reliability : Kathleen M. Depuy, Jon R. Hobbs, Albert H. Moore and J. W. Johnston, Jr.IEEE Trans. Reliab.R-31 (5), 474 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

62

Bayesian reliability and availability—a review : Frank A. Tillman, Way Kuo, C. L. Hwang and Doris Lloyd Grosh. IEEE Trans. Reliab.R-31 (4), 362 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

63

A Markov approach to wear-out modelling : Andrea Bobbio and Aldo Cumani. Microelectron. Reliab.23 (1), 113 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 255 KB

english, 1983

64

Investment analysis of introducing standby or redundancy into a production system : Inderpal Singh Kochar. Microelectron. Reliab.23 (1), 175 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

65

Steady-state availability of a system with two subsystems working alternately : C. Maruthachalam and K. Murari. Microelectron. Reliab.22 (5), 935 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

66

Calculating the failure frequency of a repairable system : Huang Xi Zhi. Microelectron. Reliab.22 (5), 945 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

67

Empirical prediction of overall reliability in computer communication networks : Sanjaya Srivastava and Inder M. Soi. Microelectron. Reliab.23 (1), 137 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

68

MVU estimators for some multivariate normal probability models: an application to stress-strength models : N. Singh. Microelectron. Reliab.23 (1), 5 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

69

Stochastic behaviour of a 2-unit standby redundant system with imperfect switchover and preventive maintenance : M. I. Mahmoud and M. A. W. Mahmoud. Microelectron. Reliab.23 (1), 153 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

70

Reliability and maintainability of a multicomponent series-parallel system under several repair disciplines : Masanori Kodama and Isao Sawa. Microelectron. Reliab.22 (6), 1135 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 258 KB

english, 1983

71

Switch failure in a two-unit standby redundant system : S. M. Gupta, N. K. Jaiswal and L. R. Goel. Microelectron. Reliab.23 (1), 129 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

72

Failure modes induced in TTL-LS bipolar logics by negative inputs : C. Canali, F. Fantini, G. Soncini, P. Venturi and E. Zanoni. Alta Freq.LI (6), 340 (November–December 1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

73

A model for the prediction of assembly, rework and test yields : B. J. Dooley. IBM Jl Res. Dev.27 (1), 59 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

74

A modified block replacement with two variables : Toshio Nakagawa. IEEE Trans. Reliab.R-31 (4), 398 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

75

EPROM Testing—Part II: Application to 16K N-channel devices: S. Alliney, D. Bertotti, F. Fantini and C. Morandi. Microelectron. Reliab.22 (5), 987 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

76

Dependability modeling of safety systems : J. C. Laprie and K. Medhaffer-Kanoun. Microelectron. Reliab.22 (5), 997 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

77

The software integrity of a computer system installed in a Royal Naval frigate : G. Hart. Microelectron. Reliab.22 (6), 1061 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 258 KB

english, 1983

78

A new approach for network reliability analysis : Bryan L. Deuermeyer. IEEE Trans. Reliab.R-31 (4), 350 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

79

Reliability analysis of a 2-out-of-n: F system with repairable primary and degradation units: Yasuhiro Yonehara, Masahiro Nakamura and Shunji Osaki. Microelectron. Reliab.22 (6), 1081 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

80

Weapons systems analysis, Part III: warfare gaming, tactics and techniques : Yosef S. Sherif. Microelectron. Reliab.22 (5), 951 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

81

Minimal pathset and minimal cutsets using search technique : V. K. Bansal, K. B. Misra and M. P. Jain. Microelectron. Reliab.22 (6), 1067 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

82

Maximum likelihood estimation of parameters of several continuous and discrete failure distributions : K. K. Govil and K. K. Aggarwal. Microelectron. Reliab.23 (1), 169 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

83

EPROM testing—Part I: theoretical considerations : S. Alliney, F. Fantini and C. Morandi. Microelectron. Reliab.22 (5), 965 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

84

Hardware vs software maintainability; a comparative study : Sanjaya Srivastava and Inder M. Soi. Microelectron. Reliab.22 (6), 1077 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 237 KB

english, 1983

85

Fundamental LTPD aspects : A. Singmin. Microelectron. Reliab.22 (6), 1099 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 108 KB

english, 1983

86

CAD systems for VLSI in Japan : Tsuneta Sudo, Tatsuo Ohtsuki and Satoshi Goto. Proc. IEEE71 (1), 129 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 108 KB

english, 1983

87

IC makers, users adopt ship-to-stock : Larry Waller. Electronics, 96 (10 March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 108 KB

english, 1983

88

A “Zero-Time” VLSI sorter : G. Miranker, L. Tang and C. K. Wong. IBM Jl Res. Dev.27 (2), 140 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 108 KB

english, 1983

89

New bubble-memory packaging cuts board space and manufacturing costs : Art Thorp. Electronics, 128 (24 March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 108 KB

english, 1983

90

Wet etching today : Pieter S. Burggraaf. Semiconductor Int., 48 (February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

91

The application of reactive ion etching to the definition of patterns in Al-Si-Cu alloy conductor layers and thick silicon oxide films : Andrew A. Chambers. Solid St. Technol., 83 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

92

VLSI metallization using aluminium and its alloys. Part I : D. Pramanik and A. N. Saxena. Solid St. Technol., 127 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

93

Pattern transfer; overview of equipment needs : Aaron D. Weiss. Semiconductor Int., 48 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

94

Wafer processing in the early 1980s : Mel H. Eklund. Semiconductor Int., 38 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

95

Semicustom-integrated-circuit design in the UK—a capability profile : M. A. Jack. Electron. Power, 217 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

96

Design for testability—a survey : Thomas W. Williams and Kenneth P. Parker. Proc. IEEE71 (1), 98 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

97

Meeting the testing challenge: today and tomorrow : Peter H. Singer. Semiconductor Int., 97 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

98

Packaging and assembly: the 1983 semiconductor technology forecast : Dan Rose. Semiconductor Int., 56 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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PDF, 123 KB

english, 1983

99

Knowledge databases, emulation extend automated-tester capabilities : Barrie Nicholson. Electronic Design News, 53 (14 April 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 251 KB

english, 1983

100

Device modeling : Walter L. Engl, Heinz K. Dirks and Bernd Meinerzhagen. Proc. IEEE71 (1), 10 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 130 KB

english, 1983

101

Software checks testability and generates tests of VLSI design : Tom Kirkland and Victor Flores. Electronics, 120 (10 March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 130 KB

english, 1983

102

Wafer gettering: the key to higher yields? : Peter H. Singer. Semiconductor Int., 67 (February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 130 KB

english, 1983

103

Plasma etching of oxides and nitrides : Aaron D. Weiss. Semiconductor Int., 56 (February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 130 KB

english, 1983

104

A transmission line model of a VLSI package : David J. Reed and David L. Shealy. Solid St. Technol., 127 (February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 130 KB

english, 1983

105

Wire-routing machines—new tools for VLSI physical design : Se June Hong and Ravi Nair. Proc. IEEE71 (1), 57 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

106

The use of solid-state circuitry within hazardous areas : R. J. Redding. Electron. Power, 328 (April 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

107

The cooling of electrical and electronic equipment in sealed enclosures : R. D. Johnson. Electron. Power, 332 (April 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 130 KB

english, 1983

108

Microbit brings self-testing on board complex microcomputers : Patrick P. Fasang. Electronics, 116 (10 March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 256 KB

english, 1983

109

Circuit analysis, logic simulation and design verification for VLSI : Albert E. Ruehli and Gary S. Ditlow. Proc. IEEE71 (1), 34 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 125 KB

english, 1983

110

Bonding temperature measurements during device assembly : N. T. Panousis, S. A. Gee and M. K. W. Fischer. Solid St. Technol., 91 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

111

Thermosonic gold wire bonding to copper conductors : V. A. Pitt and C. R. S. Needes. Solid St. Technol., 81 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 125 KB

english, 1983

112

Advances in automated wire and die bonding : Bruce W. Hueners and Douglas M. Day. Solid St. Technol., 69 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

113

Hierarchical design methodologies and tools for VLSI chips : C. Niessen. Proc. IEEE71 (1), 66 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

114

VLSI metallization using aluminium and its alloys. Part II : D. Pramanik and A. N. Saxena. Solid St. Technol., 131 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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PDF, 125 KB

english, 1983

115

Digital TV: makers bet on VLSI : Eric J. Lerner. IEEE Spectrum, 39 (February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

116

Hands-on investigations help exploit CMOS designs : Robert H. Cushman. Electronic Design News, 123 (14 April 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

117

Miniaturisation des amplificateurs monolithiques sur AsGa à 10 GHz : C. Rumelhard, Ph. Dueme, P. R. Jay and M. Le Brun. Revue tech. Thomson-CSF15 (1), 183 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

118

OYSTER: a study of integrated circuits as three-dimensional structures : George M. Koppelman and Michael A. Wesley. IBM Jl Res. Dev.27 (2), 149 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

119

Demand-paged memory management boosts 16-bit microsystem throughput : Gary Martin. Electronics, 120 (24 February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

120

Dynamic properties of microelectronic digital systems : Dr. Zdenek Mack. Tesla Electron., 2, 42 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

121

Properties of digital microelectronic systems from the viewpoint of signal transmission : Dr. Zdenek Mack. Tesla Electron., 1, 16 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

122

E-PROMs graduate to 256-K density with scaled n-channel process: M. Van Buskirk, M. Holler, G. Korsh, B. Lee, S. Lee, D. Tang, G. Teng, S. Fouts, P. Dang and W. Fisher. Electronics, 89 (24 February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

123

Circuits intégrés diviseurs de fréquence réalisés sur arséniure de gallium: M. Gloanec. Revue tech. Thomson-CSF15 (1), 213 (March 1983). (In French.)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

124

DMA controller adds muscle to offload microprocessor : David MacMillan. Electronics, 147 (10 February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

125

Specifying multilayer circuit boards to meet the demands of VLSI : Neal Hales. Electronics, 157 (10 February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

126

Telecommunications IC integrates still more line-card tasks : Steve Bootman. Electronics, 115 (24 February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

127

Managing VLSI complexity: an outlook : Carlo H. Sequin. Proc. IEEE71 (1), 149 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

128

Applications of ellipsometry to in situ study of the growth of hydrogenated amorphous films : J. Perrin and B. Drevillon. Acta electron.24 (3), 239 (1981/1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

129

X-ray double diffraction by thin monocrystalline layers : C. Schiller. Acta electron.24 (3), 267 (1981/1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

130

Dielectric/semiconductor interfaces analysis using spectroscopic ellipsometry : D. E. Aspnes and J. B. Theeten. Acta electron.24 (3), 217 (1981/1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

131

Alternating space-charge-limited currents in hydrogenated amorphous silicon : W. Den Boer and A. F. P. Pop. Solid St. Communs45 (10), 881 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

132

Etching characteristics of polysilicon, SiO2 and MoSi2 in NF3 and SF6 plasmas : C. S. Korman, T. P. Chow and D. H. Bower. Solid St. Technol., 115 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

133

Float-zoning of semiconductor silicon: a perspective : Horst G. Kramer. Solid St. Technol., 137 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

134

Croissance de monoscristaux de GaAs semi-isolant “non dopés”: trois façons de parvenir au résultat: M. Bonnet, N. Visentin, B. Lent and C. Raffet. Revue tech. Thomson-CSF15 (1), 39 (March 1983). (In French.)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

135

Diffusion characteristics of antimony and phosphorus spin-on sources : P. M. Prasad and V. P. Sundarsingh. Microelectron. J.14 (1), 49 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

136

Thermal nitridation of silicon and silicon dioxide for thin gate insulators. Part I : Judith A. Nemetz and Richard E. Tressler. Solid St. Technol., 79 (February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

137

Endor investigation of tellurium donors in silicon : J. R. Niklas and J. M. Spaeth. Solid St. Communs46 (2), 121 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

138

Amorphous-silicon devices start to shape up : Lewis Holmes. Electron. Power, 222 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

139

Electric subbands in p-type germanium inversion layers: S. Uchida, G. Landwehr and E. Bangert. Solid St. Communs45 (10), 869 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

140

Épitaxie en phase liquide de GaxIn1−xAsyP1−y: J. Ricciardi and B. De Cremoux. Revue tech. Thomson-CSF15 (1), 87 (March 1983). (In French.)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

141

Investigation on high speed CW edge-emitting LEDs grown on semiinsulating GaAs substrate : Bernhard Stegmuller and Helmut Grothe. Frequenz, 37 (4), 97 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

142

Characterization of LPCVD and thermal silicon nitride films : F. H. P. M. Habraken, A. E. T. Kuiper, A. Van Oostrom, Y. Tamminga and J. B. Theeten. Acta electron.24 (3), 203 (1981/1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

143

An approach to ensure stability of precision laser trimmed thick film resistors : Anil G. Joshi, Devinder Sharma and G. H. Sarma. Microelectron. Reliab.23 (1), 161 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

144

Passivation of gallium arsenide by reactively sputtered gallium nitride thin films : A. B. Bhattacharyya and E. Lakshmi. Micelelectron. J.14 (1), 43 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

145

An overview of thickness measurement techniques for metallic thin films : Sheldon C. P. Lim and Doug Ridley. Solid St. Technol., 99 (February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

146

The use of hybrid microelectronics in the construction of ion-selective electrodes : S. I. Leppavuori and P. S. Romppainen. Electrocomponent Sci. Technol.10, 129 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

147

Experience with polymer thick film technology : Raimo Hulkkonon, Eero Jarvinen and Vesa Sortti. Electrocomponent Sci. Technol.10, 135 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

148

Computer simulation of hybrid integrated circuits including combined electrical and thermal effects : Carl R. Zimmer. Electrocomponent Sci. Technol.10, 171 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

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english, 1983

149

Experimental and theoretical characterization of thick and thin films for microwave uses on 99.6% alumina substrates : J. P. Ramy, R. Schnitzler and C. Thebault. Electrocomponent Sci. Technol.10, 157 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

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english, 1983

150

New thick-film temperature sensors applied in some hybrid measurement devices : Janusz J. Gondek and Marek A. Wójcicki. Electrocomponent Sci. Technol.10, 95 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 124 KB

english, 1983

151

Capless annealing of silicon implanted gallium arsenide : J. D. Grange and D. K. Wickenden. Solid-St. Electron.26 (4), 313 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 124 KB

english, 1983

152

Ions expose masks with a precision of 0.1 micrometer : Kevin Smith. Electronics, 85 (7 April 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 124 KB

english, 1983

153

Ion beam etching with reactive gases : L. David Bollinger. Solid St. Technol., 99 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 124 KB

english, 1983

154

Semi-insulating gallium arsenide substrates for high-frequency FET and IC fabrication : Harvey Winston. Solid St. Technol., 145 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 233 KB

english, 1983

155

Implantation through a window with medium to high energy ions : A. G. Lutsch and D. N. Oliver. Microelectron. J.14 (1), 21 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 110 KB

english, 1983

156

Donor generation in monocrystalline silicon by Halogen implantation : G. Greeuw and J. F. Verwey. Solid-St. Electron.26 (3), 241 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 110 KB

english, 1983

157

Contribution to ion implantation through a narrow slit at higher energies : A. G. K. Lutsch and H. Runge. Microelectron. J.14 (1), 15 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 110 KB

english, 1983

158

Control of Boron diffusion in polysilicon for constructing overlapping polysilicon gate charge-coupled devices : A. Srivastava and J. T. Boyd. Microelectron. Reliab.23 (1), 179 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 110 KB

english, 1983

159

Plasma-enhanced deposition of tungsten, molybdenum and tungsten silicide films : C. C. Tang, J. K. Chu and D. W. Hess. Solid St. Technol., 125 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 110 KB

english, 1983

160

4378599 Semiconductor laser having broadband laser gain

TheodoorC Damen, MichelA Duguay, Julia Stone

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 110 KB

english, 1983

161

4378586 Protective circuitry for semiconductor switches

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 141 KB

english, 1983

162

4378383 Method of making conductive paths through a lamina in a semiconductor device

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 73 KB

english, 1983

163

4378260 Process for producing a semiconductor device

Takeshi Fukuda, Yoshita Ichinose

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 73 KB

english, 1983

164

4378255 Method for producing integrated semiconductor light emitter

Nick Holonyak, WynD Laidig

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 73 KB

english, 1983

165

437794 Integrated gas sensitive unit comprising a gas sensitive semiconductor element and a resistor for gas concentration measurement

Toshiyasu Hishii, Tokuo Takeuchi, Nobuaki Shohata, Toshio Takaba, Koichi Saito

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 68 KB

english, 1983

166

4377903 Method for manufacturing an I2L semiconductor device

Koichi Kanzaki, Minoru Taguchi

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 139 KB

english, 1983

167

4377902 Method of manufacturing semiconductor device using laser beam crystallized poly/amorphous layer

Kazuyoshi Shinada, Satoshi Shinozaki

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 71 KB

english, 1983

168

4377900 Method of manufacturing semiconductor device

Terumoto Nonaka, Tadahiko Hotta

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 71 KB

english, 1983

169

4377819 Semiconductor device

Yoshio Sakai, Toshiaki Masuhara, Osamu Minato, Toshio Saski, Hisao Katto, Norikazu Hashimoto, Shin-ichi Maramatsu, Akihiro Tomozawa

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 70 KB

english, 1983

170

4377438 Method for producing semiconductor device

Takahiko Moriya, Yoshikazu Hazuki, Masahiro Kashiwagi

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 61 KB

english, 1983

171

4377030 Metallization of selectively implanted AIII-BV compound semiconductors

Ewald Pettenpaul, Jakob Huber, Herbert Weidlich

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 126 KB

english, 1983

172

4377028 Method for registering a mask pattern in a photoetching apparatus for semiconductor devices

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 66 KB

english, 1983

173

4376989 Semiconductor dynamic memory

Yoshihiro Takemae

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 66 KB

english, 1983

174

4376985 Semiconductor memory device

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 139 KB

english, 1983

175

4376947 Electrically programmable floating gate semiconductor memory device

Te-Long Chiu, Jih-Chang Lien

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 73 KB

english, 1983

176

4376688 Method for producing semiconductor films

GeraldP Ceasar, Scott Grimshaw

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 73 KB

english, 1983

177

4376664 Method of producing a semiconductor device

Osamu Hataishi, Yoshinobu Momma

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 73 KB

english, 1983

178

4376657 Method of making fault-free surface zone in semiconductor devices by step-wise heat treating

Kazutoshi Nagasawa, Seigo Kishino, Yoshiaki Matsushita, Masaru Kanamori

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 139 KB

english, 1983

179

4376581 Method of positioning disk-shaped workpieces, preferably semiconductor wafers

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 72 KB

english, 1983

180

4376336 Method for fabricating a semiconductor device

Norio Endo, Hisakazu Iizuka

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 72 KB

english, 1983

181

Volume contents and author index

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 420 KB

english, 1983

182

Software bugs and communications system performance

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 404 KB

english, 1983

183

Reliability system with two types of repair facilities

K. Murari, Vibha Goyal

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 546 KB

english, 1983

184

Modelling human performance reliability in a two stage combined manual and decision task

M.A. Rahim, A. Raouf

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 370 KB

english, 1983

185

Defect Complexes in Semiconductor Structures: Lecture Notes in Physics, Volume 175. Proceedings of the International School Held in Matrafured, Hungary September 13 – 17, 1982 Editors: J. Giber, F. Beleznay, I. C. Szep and J. Laszlo. Publishers: Springer-Verlag, Postfach 105160, Haberstrasse 7, D-6900 Heidelberg 1, Federal Republic of Germany. Price: Soft cover: DM 42.- (approx. US $ 18.10). (ISBN 3-540-11986-8)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 99 KB

english, 1983

186

Les problemes de Brasabilite dans l'industrie electronique spatiale: Marc Billot and Serge Clement. Microelectron. Reliab.22 (5), 919 (1982). (In French)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 126 KB

english, 1983

187

Mounting of micropackages in vapour phase soldering and study of ageing mechanism : Christian M. Val and Jacques D. Agniel. Electrocomponent Sci. Technol.10, 111 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 126 KB

english, 1983

188

Comparison of mean time to first failure and mean up time : Chanan Singh and Sohrab Asgarpoor. Microelectron. Reliab.23 (1), 79 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 126 KB

english, 1983

189

Reliability growth models for hardware and software systems based on nonhomogeneous Poisson processes: a survey : Shigeru Yamada and Shunji Osaka. Microelectron. Reliab.23 (1), 91 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 126 KB

english, 1983

190

Systems in reduced efficiency and alternating periods : C. Maruthachalam and K. Murari. Microelectron. Reliab.22 (5), 229 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 258 KB

english, 1983

191

Enumeration of all simple paths in a directed graph using Petri Net: a systematic approach : G. S. Hura. Microelectron. Reliab.23 (1), 157 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

192

Determine project risk using statistical methods : Rick Palkovic. Electronic Design News, 213 (31 March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

193

Constructing fault-trees by stepwise refinement : J. M. Joller. IEEE Trans. Reliab.R-31 (4), 333 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

194

HP-41C programs for Bayesian binomial and exponential interval estimation with a uniform prior on the reliability : M. O. Locks. IEEE Trans. Reliab.R-31 (4), 329 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

195

A time-variable ratio useful in reliability theory : G. K. Agrafiotis. IEEE Trans. Reliab.R-31 (4), 376 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

196

Direct computation for consecutive-k-out-of-n: F systems: Richard C. Bollinger. IEEE Trans. Reliab.R-31 (5), 444 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

197

Methodical aspects of logic synthesis : Hans Martin Lipp. Proc. IEEE71 (1), 88 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 260 KB

english, 1983

198

The Wijngaard-Stidham bisection method and replacement models : L. C. Thomas. IEEE Trans. Reliab.R-31 (5), 482 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

199

The effect of preventive maintenance to a standby system with two types of failures : M. I. Mahmoud and M. A. W. Mahmoud. Microelectron. Reliab.23 (1), 149 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

200

Reliability, maintainability and cost-effectiveness: a bibliographical note : H. T. Lau. Microelectron. Reliab.23 (1), 21 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

201

Improved implementation of search technique to find spanning trees : V. K. Bansal, K. B. Misra and M. P. Jain. Microelectron. Reliab.23 (1), 141 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

202

Moments of n-unit redundant systems with time dependent failure rates : Balbir S. Dhillon and J. Natesan. Microelectron. Reliab.23 (1), 61 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

203

Failure diagnosis on the LT1280 : P. L. Barry. IBM Jl Res. Dev.27 (1), 41 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

204

Reliability of digital communication system with channel redundancy : Mushfiqur Rahman. IEEE Trans. Reliab.R-31 (4), 410 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

205

A replacement policy based on limits for the repair cost rate : Frank Beichelt. IEEE Trans. Reliab.R-31 (4), 401 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

206

On the design of algorithms for VLSI systolic arrays : Dan I. Moldovan. Proc. IEEE71 (1), 113 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

207

An extension of the block preventive maintenance policy for stochastically failing items : Lebert R. Alley and Lee-Eng Shirley Lin. Microelectron. Reliab.22 (5), 1027 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

208

Panorama des technoligies de circuits intégrés Si, GaAs et Josephson: limites et évolution: Nguyen T. Linh. Revue tech. Thomson-CSF15 (1), 139 (March 1983). (In French)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 108 KB

english, 1983

209

VLSI design automation: an introduction : Michael Feuer. Proc. IEEE71 (1), 5 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 108 KB

english, 1983

210

VLSI—the technological giant—and the developing countries : A. B. Bhattacharyya. Proc. IEEE71 (1), 144 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 108 KB

english, 1983

211

Microelectronics in China 1979–82—a review : S. McClelland. Microelectron. J.14 (1), 69 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 108 KB

english, 1983

212

Assembly equipment users speak out : Pieter S. Burggraaf. Semiconductor Int., 68 (January 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 108 KB

english, 1983

213

Reducing PCB testing : John Stickland. Electron. Prodn, 22 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 232 KB

english, 1983

214

Bubble-memory support chips allow tailored-system design : Richard Pierce. Electronic Design News, 201 (31 March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

215

An LSI technology fully compatible EAROM cell : Guido Torelli. Alta Freq., LI (6), 345 (November–December 1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

216

Chip-carriers change their course : Jerry Lyman. Electronics, 114 (10 February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

217

Density upgrading in tape automated bonding : K. Kurzweil and G. Dehaine. Electrocomponent Sci. Technol.10, 51 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

218

Multi-chip module technology : R. A. Rinne and D. R. Barbour. Electrocomponent Sci. Technol.10, 31 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 123 KB

english, 1983

219

Digitizing, layout, rule checking—the everyday tasks of chip designers : Jean Pierre Avenier. Proc. IEEE71 (1), 49 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 130 KB

english, 1983

220

Ohmic contacts to III–V compound semiconductors: a review of fabrication techniques : A. Piotrowska, A. Guivarch and G. Pelous. Solid-St. Electron.26 (3), 179 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 130 KB

english, 1983

221

IC process modeling and topography design : Andrew R. Neureuther. Proc. IEEE71 (1), 121 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 130 KB

english, 1983

222

Solder attachment of leadless ceramic chip carriers : P. M. Hall. Solid St. Technol., 103 (March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 125 KB

english, 1983

223

Automatic hardware synthesis : Sajjan G. Shiva. Proc. IEEE71 (1), 76 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 125 KB

english, 1983

224

Two chips endow 32-bit processor with fault-tolerant architecture : C. B. Peterson, R. C. Duzett, D. L. Budde, D. G. Carson, M. T. Imel, C. A. Jasper, D. B. Johnson, R. H. Kravitz, C. K. Ng, D. K. Wilde and J. R. Young. Electronics, 159 (7 April 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 247 KB

english, 1983

225

16-bit bipolar microprocessor marches to standard instruction set : S. Mor, H. Hingarh, M. Vora, D. Wilnai, D. Maxwell and T. Longo. Electronics, 134 (7 April 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

226

Two programmable ICs enhance line-card functionality : Fred H. Cherrick and Bhupendra K. Ahuja. Electronics, 116 (2 March 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

227

Advances in customization free VLSI system designers : Roderic Beresford. Electronics. 134 (10 February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 127 KB

english, 1983

228

Self-consistent theory of diagonal and off-diagonal disorder in the screened impurity band of doped semiconductors : Norberto Majlis and Enrique V. Anda. Solid St. Communs45 (7), 561 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

229

Developments in crystal growth from high-temperature solutions : Hans J. Scheel. Prog. Crystal Growth Char., 5, 277 (1982)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

230

Effects of MBE growth conditions on carbon contamination in GaAs : O. Tejayadi, Y. L. Sun, J. Klem, R. Fischer, M. V. Klein and H. Morkoc. Solid St. Communs46 (3), 251 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

231

Chemical impurities and structural imperfections in semiconductor silicon. Part I : Howard R. Huff. Solid St. Technol., 89 (February 1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

232

Thermodynamical calculation of multiexciton complexes system in lightly doped Si: a contribution of excited states of the multiexciton complexes : A. L. Karuzskii, L. Yu. Shchurova and B. G. Zhurkin. Solid St. Communs46 (3), 247 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 130 KB

english, 1983

233

A simulative approach to electron conduction in thick-film resistors : C. Jacoboni, M. Prudenziati and A. Rizzi. Electrocomponent Sci. Technol.10, 103 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

234

Temperature verification of hybrid microelectronic circuit design : Sedat Širbegović, Milan Mazalica and Ratko Krčmar. Electrocomponent Sci. Technol.10, 63 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

235

Current noise in thick and thin film resistors : S. Demolder, A. Van Calster and M. Vandendriessche. Electrocomponent Sci. Technol.19, 81 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

236

Thin film transistors and thin film transistor circuits : Andre Van Calster. Electrocomponent Sci. Technol.10, 185 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

237

Ceramic on metal substrates produced by plasma spraying for thick film technology : Leszek Goklonka and Lech Pawklowski. Electrocomponent Sci. Technol.10, 143 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

238

Evaluation of Du Pont copper-compatible resistor system : M. V. Coleman and G. E. Gurnett. Electrocomponent Sci. Technol.10, 163 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 134 KB

english, 1983

239

Germanium selenide as a negative inorganic resist for ion beam microfabrication : K. Balasubramanyam, I. Adesida, A. L. Ruoff and E. D. Wolf. Microelectron. J.14 (1), 35 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 110 KB

english, 1983

240

Ion range statistics by a Fourier series : A. G. K. Lutsch. Microelectron. J.14 (1), 5 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 110 KB

english, 1983

241

4377904 Method of fabricating a narrow band-gap semiconductor CCD imaging device

RichardA Chapman, Dennis Buss, Michael Kinch

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 68 KB

english, 1983

242

4377865 Semiconductor laser

Takashi Sugino, Masaru Wada, Hirokazu Shimizu, Kunio Itoh

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 141 KB

english, 1983

243

4377856 Static semiconductor memory with reduced components and interconnections

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 70 KB

english, 1983

244

4377817 Semiconductor image sensors

Jun-ichi Nishizawa, Tadahiro Ohmi

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 132 KB

english, 1983

245

4377816 Semiconductor element with zone guard rings

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 61 KB

english, 1983

246

4377605 Method for forming an insulating layer on a polycrystalline silicon layer of a semiconductor device usng a two-step thermal oxidation technique

Takashi Yamamoto

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 61 KB

english, 1983

247

4376659 Process for forming semiconductor alloys having a desired bandgap

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 69 KB

english, 1983

248

4376658 Method of producing structures composed of photosensitive resist for integrated semiconductor circuits

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 69 KB

english, 1983

249

4376307 Semiconductor laser or intensifier

TullioE Rozzi, JohannesH Van Heuven

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 102 KB

english, 1983

250

Multi-chip module test and diagnostic methodology : J. J. Curtin and J. A. Waicukauski. IBM Jl Res. Dev.27 (1), 27 (1983)

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 129 KB

english, 1983

251

Effect of intermittent repair in a two unit redundant system with standby failure

A.K. Rastogi, Ashok Kumar, L.R. Goel

Journal:

Microelectronics Reliability

Year:

1983

Language:

english

File:

PDF, 236 KB

english, 1983

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