Testing whether F is “more NBU” than is G with randomly...

Microelectronics Reliability 1988 Vol. 28; Iss. 6

Testing whether F is “more NBU” than is G with randomly censored data

Martin T. Wells, Ram C. Tiwari
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Volume:
28
Year:
1988
Language:
english
Pages:
8
DOI:
10.1016/0026-2714(88)90291-0
File:
PDF, 314 KB
english, 1988
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