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Volume 28; Issue 6
Main
Microelectronics Reliability
Volume 28; Issue 6
Microelectronics Reliability
Volume 28; Issue 6
1
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 127 KB
Your tags:
english, 1988
2
Publications, notices, calls for papers, etc.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 431 KB
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english, 1988
3
Memo to all Indian authors
G.W.A.D
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 23 KB
Your tags:
english, 1988
4
MTBRD analysis of fail-safe systems
Zhibang Zhou
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 286 KB
Your tags:
english, 1988
5
MTBRD evaluation of an actual fail-safe system
Zhibang Zhou
,
Benchu Wang
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 193 KB
Your tags:
english, 1988
6
Non-linear regression for predicting software reliability
Huang Xizi
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 134 KB
Your tags:
english, 1988
7
Availability of the feeding system in the sugar industry
Dinesh Kumar
,
Jai Singh
,
I.P. Singh
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 229 KB
Your tags:
english, 1988
8
A cyclic queueing system with three servers and optional two-way feedback
K.C. Madan
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 177 KB
Your tags:
english, 1988
9
Power reduction methods for NMOS dynamic random access memories
R.Venkatapathi Naidu
,
S. Mahapatra
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 472 KB
Your tags:
english, 1988
10
Device failure analysis in VLSI circuits due to missing flashes in mask fabrication process—A case study
A. Srivastava
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 930 KB
Your tags:
english, 1988
11
Reliability analysis of a repairable system in a changing environment subject to a general alternating renewal process
Jinhua Cao
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 197 KB
Your tags:
english, 1988
12
Optimization of maintenance facility for a repairable system subject to availability constraint
B.N. Shetty
,
G.S. Sekhon
,
O.P. Chawla
,
K.C. Kurien
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 249 KB
Your tags:
english, 1988
13
On a two-unit cold standby redundant system with random switching time
M.A.W. Mahmoud
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 212 KB
Your tags:
english, 1988
14
Testing whether F is “more NBU” than is G with randomly censored data
Martin T. Wells
,
Ram C. Tiwari
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 314 KB
Your tags:
english, 1988
15
Estimation of series system reliability for exponentially distributed component life times
Dipak K. Dey
,
Anita Singh
,
Ashok Singh
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 319 KB
Your tags:
english, 1988
16
Parallel processing, distributed systems and local area networks
L.H. Canter
,
Y.S. Sherif
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 484 KB
Your tags:
english, 1988
17
Shrinkage testimators for the variance of a normal distribution at single and double stages
B.N. Pandey
,
H.J. Malik
,
Rakesh Srivastava
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 613 KB
Your tags:
english, 1988
18
Uncertainty propagation in fault-tree analyses using an exact method of moments
Ali M. Rushdi
,
Kamel F. Kafrawy
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 818 KB
Your tags:
english, 1988
19
On the determination of overall computer network reliability with m-level hierachical routing
D. Mandaltsis
,
J.M. Kontoleon
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 369 KB
Your tags:
english, 1988
20
The hybrid approach for improving the reliability of ring systems
Valentin Obac Roda
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 372 KB
Your tags:
english, 1988
21
Sensors and transducers: Author: Keith Brindley Publishers: Heinemann Professional Publishing, 22, Bedford Square, London, WC1B 3HH. Price: £ 12.95. (ISBN 0 434 90181 4) Published 1988
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 42 KB
Your tags:
english, 1988
22
Tolerance design of electronic circuits: Authors: Robert Spence and Randeep Soin Publishers: Addison-Wesley Publishers Limited, Finchampstead Road, Wokingham, Berkshire, RG11 2NZ. Price: £ 18.95. (ISBN 0 201 18242 4) Published 1988
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 96 KB
Your tags:
english, 1988
23
Electronic alarm circuits manual: Author: R.M. Marston Publishers: Heinemann Professional Publishing, 22, Bedford Square, London, WC1B 3HH. Price: £ 9.95. (ISBN 0-434-91214-X). Published 1988
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1988
24
Practical electronics handbook — Second edition: Author: Ian Sinclair Publishers: Heinemann Professional Publishing, 22, Bedford Square, London, WC1B 3HH. Price: £ 7.95. (ISBN 0-434-91845-8) Second Edition 1988
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 44 KB
Your tags:
english, 1988
25
Handbook of contamination control in microelectronics: Principles, Applications and Technology Edited by: Donald L. Tolliver Publishers: Noyes Publications, Mill Road at Grand Avenue, Park Ridge, New Jersey 07656, United States of America Price: US $ 78.00. (ISBN 0-8155-1151-5) Published 1988
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 46 KB
Your tags:
english, 1988
26
VLSI electronics — Microstructure science: Edited by:- Norman G. Einspruch and R.K. Watts Publishers: Academic Press, Inc., 1250 Sixth Avenue, San Diego, CA 92101, United States of America Price: US $ 69.00. (ISBN 0-12-234116-3) Published 1987
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 96 KB
Your tags:
english, 1988
27
LSI interfacing: Author: Mike James Publishers: Heinemann Professional Publishing, 22, Bedford Square, London, WC1B 3HH. Price: £ 12.95. (ISBN 0-434-90889-4) Published 1988
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1988
28
Rigid-flex printed wiring design for production readiness: Author: Walter S. Rigling Publishers: Marcel Dekker, Inc., 270 Madison Avenue, New York, NY 10016, United States of America. Price: US $ 69.75. (US and Canada) US $ 83.50 (All Other countries). (ISBN 0 - 8247-7707-7). Published 1988
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 41 KB
Your tags:
english, 1988
29
The conquest of the microchip: Author: Hans Queisser Publishers: Harvard University Press, Cambridge, Massachusetts United States of America. Price: US $ 24.95. (ISBN 0-674-16296-X) Published 1988
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 41 KB
Your tags:
english, 1988
30
4724378 Calibrated automatic test system
DonaldF Murray
,
StevenK Sullivan
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 85 KB
Your tags:
english, 1988
31
4724380 Integrated circuit having a built-in self test design
David Burrows
,
Mark Paraskeva
,
WilliamL Knight
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 85 KB
Your tags:
english, 1988
32
4730232 High density microelectronic packaging module for high speed chips
FrankA Lindberg
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 85 KB
Your tags:
english, 1988
33
4730316 Digital integrated circuits
PeterLL Desyllas
,
Finbar Naven
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1988
34
4730317 Digital integrated circuits
PeterLL Desyllas
,
Finbar Naven
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1988
35
4730749 Singulatory apparatus
Jonathan Buesing
,
JamesP Buettner
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1988
36
4731759 Integrated circuit with built-in indicator of internal repair
Takayuk Watanabe
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1988
37
4734641 Method for the thermal characterization of semiconductor packaging systems
Dee Byrd
,
Michael Williams
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1988
38
4734872 Temperature control for device under test
George Eager
,
Pater Selverstone
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 47 KB
Your tags:
english, 1988
39
4734923 Lithographic system mask inspection device
RobertD Frankel
,
John Hoose
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 47 KB
Your tags:
english, 1988
40
Title section, volume contents and author index, volume 28, 1988
Journal:
Microelectronics Reliability
Year:
1988
Language:
english
File:
PDF, 404 KB
Your tags:
english, 1988
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