Improvements in step stress tests

Microelectronics Reliability 1989 Vol. 29; Iss. 5

Improvements in step stress tests

Héctor S. Trujillo Alvarado, Ernesto Bonat Hernández
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Volume:
29
Year:
1989
Language:
english
Pages:
3
DOI:
10.1016/0026-2714(89)90162-5
File:
PDF, 151 KB
english, 1989
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