Volume 29; Issue 5

Microelectronics Reliability

Volume 29; Issue 5

1

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 211 KB

english, 1989

2

Publications, notices, calls for papers, etc.

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 656 KB

english, 1989

3

Society of reliability engineers bulletin

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 68 KB

english, 1989

4

One method for sample size evaluation

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 149 KB

english, 1989

5

The effect of stress screening process on yield and cost

Torky I. Sultan

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 291 KB

english, 1989

6

Improvements in step stress tests

Héctor S. Trujillo Alvarado, Ernesto Bonat Hernández

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 151 KB

english, 1989

7

Cost-benefit analysis of a two unit cold standby system with random switchover and service time

H.R. Singh, S.K. Singh, Sindhu Shukla

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 301 KB

english, 1989

8

Two unit standby system with imperfect switching device and maximum activation time

S.K. Singh, R.P. Singh

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 244 KB

english, 1989

9

Admissibility of a test procedure based on preliminary test of significance for life data

S.K. Singh, S.K. Upadhyay, Umesh Singh

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 150 KB

english, 1989

10

Common cause failure consideration in a cold standby duplex system

H.R. Singh, S.K. Singh, Sindhu Shukla

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 285 KB

english, 1989

11

Cost analysis of a two unit cold standby system with preparation time for repair

H.R. Singh, S.K. Singh, Sindhu Shukla

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 262 KB

english, 1989

12

Enumeration of k-trees and their application to the reliability evaluation of communication networks

D. Mandaltsis, J.M. Kontoleon

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 229 KB

english, 1989

13

On the reliability evaluation of dynamic networks with m-level hierarchical routing

J.M. Kontoleon, D. Mandaltsis

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 336 KB

english, 1989

14

The dynamic scheduling of aircraft in high density terminal areas

Roger G. Dear, Yosef S. Sherif

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 546 KB

english, 1989

15

The reliability function and the availability of a duplication redundant system with a single service facility for preventive maintenance and repair

G.S. Mokaddis, S.S. Elias

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 305 KB

english, 1989

16

An improved method of estimating Bayes posterior probability density function in reliability data analysis

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 256 KB

english, 1989

17

Two units connected in series with general bulk service and random breakdown in unit 2

R. Nadarajan, D. Audsin Mohana Dhas

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 176 KB

english, 1989

18

On estimation of population mean in repeated surveys subsequent to preliminary test of significance

B.V.S. Sisodia, S. Kumar, V.N. Rai

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 158 KB

english, 1989

19

Analysis of a three-unit redundant system with two types of repair and inspection

L.R. Goel, Rakesh Gupta, R.K. Agnihotri

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 325 KB

english, 1989

20

Availability of a washing system in the paper industry

Dinesh Kumar, Jai Singh, P.C. Pandey

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 169 KB

english, 1989

21

Reliability analysis of a biogas plant having two dissimilar units

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 152 KB

english, 1989

22

Design of fault-tolerant computing systems using real-time performance monitors

Albert A. Heaney, Yosef S. Sherif

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 1.10 MB

english, 1989

23

Human reliability model with probabilistic learning in continuous time domain

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 368 KB

english, 1989

24

A single channel queue with bulk service subject to interruptions

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 241 KB

english, 1989

25

A petri net approach for the enumeration of all K-trees and K-cutsets and its application on K-terminal network reliability evaluation

J.M. Kontoleon, D. Mandaltsis

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 319 KB

english, 1989

26

System characteristics and economic analysis of the G/G/R machine repair problem with warm standbys using diffusion approximation

B.D. Sivazlian, K.-H. Wang

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 684 KB

english, 1989

27

Reliability of a system with warm standbys and repairmen

K.-H. Wang, B.D. Sivazlian

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 349 KB

english, 1989

28

Economic inventory and replacement management of a system in which components are subject to failure

B.D. Sivazlian, S.L. Danusaputro

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 638 KB

english, 1989

29

Microprocessor based systems for the higher technician: Author: R. Vears. Publishers: Heimemann Professional Publishing Limited, Halley Court, Jordan Hill, Oxford, OX2 8EJ, Oxon., England. Price: £ 12.95. (ISBN 0-434-92339-7) Published November 1988

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 44 KB

english, 1989

30

Statistical simulation methods for investigating the structure of reliability optimization : A. F. Rashed and M. Metwally. IEEE Trans. Reliab. 37, 81 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 104 KB

english, 1989

31

A literature survey of the human reliability component in a man-machine system : Kang W. Lee, Frank A. Tillman and James J. Higgins. IEEE Trans. Reliab. 37, 24 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 104 KB

english, 1989

32

A mathematical analysis of human-machine interface configurations for a safety monitoring system : Toshiyuki Inagaki and Yasuhiko Ikebe. IEEE Trans. Reliab. 37, 35 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 104 KB

english, 1989

33

Chemical-system reliability: a review : Balbir S. Dhillon and Subramanyam Naidu Rayapati. IEEE Trans. Reliab. 37, 199 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 104 KB

english, 1989

34

Design-safety enhancement through the use of hazard and risk analysis : R. J. Mulvihill. IEEE Trans. Reliab. 37, 149 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 104 KB

english, 1989

35

How to improve the effectiveness of hazard and operability analysis : Thomas C. McKelvey. IEEE Trans. Reliab. 37, 167 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 104 KB

english, 1989

36

An overview of collection, analysis, and application of reliability data in the process industries : Tony Bendell. IEEE Trans. Reliab. 37, 132 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 104 KB

english, 1989

37

Reliability prediction of MOS devices: experiments and model for charge build up and annealing : F. Wulf, D. Braunig and W. Nickel. Proc. IEEE/IRPS, 150 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 134 KB

english, 1989

38

Polymer encapsulants for microelectronics: mechanisms for protection and failure : James E. Anderson, Vlado Markovac and Philip R. Troyk. IEEE Trans. Compon. Hybrids mfg Technol. 11, 152 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 134 KB

english, 1989

39

Gold-silicon fiber shorts in VLSI devices : Roger E. Lund. Proc. IEEE/IRPS, 76 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 134 KB

english, 1989

40

High temperature lifetesting of silicon metal-thin insulator-semiconductor heterojunction emitter bipolar transistors : W. L. Guo, M. K. McRavvej-Farshi and M. A. Green. Solid-St. Electron. 31, 1071 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 134 KB

english, 1989

41

The impact of an external sodium diffusion source on the reliability of MOS circuitry : Patrick L. Hefley and J. W. McPherson. Proc. IEEE/IRPS, 167 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 134 KB

english, 1989

42

Detection of junction spiking and its induced latch-up by emission microscopy : Siak-Chiew Lim and Eng-Guan Tan. Proc. IEEE/IRPS, 119 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 134 KB

english, 1989

43

A method of detecting the nature of IC defects : M. J. Patyra and J. Zabrodzki. Microelectron. J. 19 (3), 41 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 134 KB

english, 1989

44

Moisture induced package cracking in plastic encapsulated surface mount components during solder reflow process : R. Lin, E. Blackshear and P. Serisky. Proc. IEEE/IRPS, 83 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 266 KB

english, 1989

45

A new bond failure wire crater in surface mount device : H. Koyama, H. Shiozaki, I. Okumura, S. Mizugashira, H. Higuchi and T. Ajiki. Proc. IEEE/IRPS, 59 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 133 KB

english, 1989

46

Reliability evaluation and prediction for silicon photodetectors : E. A. Weis, D. Caldararu, M. M. Snyder and N. Croitoru. IEEE Trans. Reliab. 37, 14 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 133 KB

english, 1989

47

Effect of metal line geometry on electromigration lifetime in Al-Cu submicron interconnects : Thomas Kwok. Proc. IEEE/IRPS, 185 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 133 KB

english, 1989

48

Reliability performance of etox based flash memories : Gautam Verma and Neal Mielke. Proc. IEEE/IRPS, 158 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 133 KB

english, 1989

49

Threshold voltage models of the narrow-gate effect in micron and submicron MOSFETs : Steve Shao-Shiun Chung and Chih-Tang Sah. Solid-St. Electron. 31, 1009 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 133 KB

english, 1989

50

Reliability of discrete MODFETs: life testing, radiation effects, and ESD : W. T. Anderson, A. Christou, F. A. Buot, J. Archer, G. Bechtel, H. Cooke, Y. C. Pao, M. Simons and E. W. Chase. Proc. IEEE/IRPS, 96 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 133 KB

english, 1989

51

Investigation of instability in multi-layer dielectric structures : S. Murakami, T. Kagami and Y. Sugawara. Proc. IEEE/IRPS, 139 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 260 KB

english, 1989

52

Statistical modeling of silicon dioxide reliability : Jack Lee, Ih-Chin Chen and Chenming Hu. Proc. IEEE/IRPS, 131 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 127 KB

english, 1989

53

Finding floppy-drive faults : Bradley J. Thompson. Test Measurement Wld, 81 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 127 KB

english, 1989

54

Thermal and stress analysis of semiconductor wafers in a rapid thermal processing oven : H. A. Lord. IEEE Trans. Semiconductor Mfg 1, 3, 105 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 127 KB

english, 1989

55

The detection of ionic contamination under SM components : B. N. Ellis. Circuit Wld 14, 4, 59 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 127 KB

english, 1989

56

A reliability study of relay suitable for surface mount process using high-temperature-resistant plastics : Masatoshi Ohba, Kiyoaki Kuzukawa and Kazuo Ozawa. IEEE Trans. Compon. Hybrids mfg Technol. 11, 85 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 127 KB

english, 1989

57

Bond pad structure reliability : Teo Boon Ching and Walter H. Schroen. Proc. IEEE/IRPS, 64 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 127 KB

english, 1989

58

Plastic packaging stress induced failures in TiW/Al-Si metal to silicide contacts : Hideki Kitagawa, Takayuki Maeda, Shinya Murata, Tatsuro Maki, Toshiyuki Kaeriyama, Adin Hyslop and Aki Nishimura. Proc. IEEE/IRPS, 71 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 127 KB

english, 1989

59

R&M engineering for off-the-shelf critical software : Fred Hall, Raymond A. Paul and Wendy E. Snow. Proc. a. Reliab. Maintainab. Symp., 218 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 263 KB

english, 1989

60

Relevancy in fault detection analysis : Miguel A. Ramirez. Proc. a. Reliab. Maintainab. Symp., 118 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 138 KB

english, 1989

61

Measuring software for its reuse potential : James A. Hess. Proc. a. Reliab. Maintainab. Symp., 202 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 138 KB

english, 1989

62

Parts renewal in continuous-time Monte Carlo reliability simulation : Franz Boehm, Uwe P. Hald and Elmer E. Lewis. Proc. a. Reliab. Maintainab. Symp., 345 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 138 KB

english, 1989

63

Battlefield damage assessment and repair (BDAR) of electronic equipment : Richard D. Chegar. Proc. a. Reliab. Maintainab. Symp., 164 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 138 KB

english, 1989

64

Effect of BIT on expendable weapon test results : R. Owen Holbrook. Proc. a. Reliab. Maintainab. Symp., 139 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 138 KB

english, 1989

65

CAD techniques for improved maintainability design : George S. Krause Jr and Rhine Jager. Proc. a. Reliab. Maintainab. Symp., 122 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 138 KB

english, 1989

66

What comes first—RAMCAD or a new RAM methodology? : Tyrone Jackson. Proc. a. Reliab. Maintainab. Symp., 32 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 273 KB

english, 1989

67

Software system safety and reliability : Mark D. Hansen and Ronald L. Watts. Proc. a. Reliab. Maintainab. Symp., 214 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 137 KB

english, 1989

68

Failure prediction by marginal checking : Robert A. Boenning and Frank H. Born. Proc. a. Reliab. Maintainab. Symp., 272 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 137 KB

english, 1989

69

Computer aided life cycle engineering : G. Braunberg, J. Naft, M. Pecht and R. L. Madison. Proc. a. Reliab. Maintainab. Symp., 26 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 137 KB

english, 1989

70

Collection of maintenance data: impact of PORTER on R&M : Don Heacox, Gary Munoz and Russ Wintersheimer. Proc. a. Reliab. Maintainab. Symp., 267 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 137 KB

english, 1989

71

Supportability evaluation prediction process : Michael K. Lappin. Proc. a. Reliab. Maintainab. Symp., 102 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 137 KB

english, 1989

72

Army operational test and evaluation of TMDE+ : David L. Carson. Proc. a. Reliab. Maintainab. Symp., 151 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 137 KB

english, 1989

73

Automated generation of reliability models : Sally C. Johnson and Ricky W. Butler. Proc. a. Reliab. Maintainab. Symp., 17 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 137 KB

english, 1989

74

Tracking of reliability growth in early development : John C. Wronka. Proc. a. Reliab. Maintainab. Symp., 238 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 267 KB

english, 1989

75

The probability aspects of CALS (computer-aided logistic support) : Glen E. Benz. Proc. a. Reliab. Maintainab. Symp., 23 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 131 KB

english, 1989

76

Computer-aided reliability diagnostic system : Steve Harbater, Walter C. Tonelli and Anne L. Belsi. Proc. a. Reliab. Maintainab. Symp., 8 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 131 KB

english, 1989

77

A modified technique for computing network reliability : S. Hasanuddin Ahmad and A. T. M. Jamil. IEEE Trans. Reliab. R-36, 554 (1987)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 131 KB

english, 1989

78

Field operational R&M warranty : Proc. a. Reliab. Maintainab. Symp., 227 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 131 KB

english, 1989

79

COFT program—a tailored R&M approach : Douglas C. Hendricks, Frederick W. Kiehler and Hollis R. Filson. Proc. a. Reliab. Maintainab. Symp., 147 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 131 KB

english, 1989

80

A method for obtaining software reliability measures during development : Donald E. Brown. IEEE Trans. Reliab. R-36, 573 (1987)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 131 KB

english, 1989

81

Estimation in a random censoring model with incomplete information: exponential lifetime distribution : T. Elperin and I. Gertsbakh. IEEE Trans. Reliab. 37, 223 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 131 KB

english, 1989

82

A comparison of algorithms for terminal-pair reliability : Y. B. Yoo and Narsingh Deo. IEEE Trans. Reliab. 37, 210 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 131 KB

english, 1989

83

A fast algorithm for the performance index of a telecommunication network : K. K. Aggarwal. IEEE Trans. Reliab. 37, 65 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 131 KB

english, 1989

84

A direct algorithm for computing reliability of a consecutive-k cycle: D. Z. Du and F. K. Hwang. IEEE Trans. Reliab. 37, 70 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 260 KB

english, 1989

85

Reliability of new semiconductor devices for long-distance optical submarine-cable systems : Koichi Tatekura and Yasuhiko Niiro. IEEE Trans. Reliab. 37, 3 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

86

Optimal continuous-wear limit replacement under periodic inspections : Kyung S. Park. IEEE Trans. Reliab. 37, 97 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

87

A Bayes sensitivity analysis when using the beta distribution as a prior : Benjamin S. Duran and Jane M. Booker. IEEE Trans. Reliab. 37, 239 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

88

A test of the exponential MTBF and comparison of power functions in the random censoring case : Jee Soo Kim. IEEE Trans. Reliab. 37, 103 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

89

Reliability bounds for dependent failures : D. B. Parkinson. IEEE Trans. Reliab. 37, 54 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

90

Data bank for probabilistic risk-assessment of nuclear-fuel reprocessing plants : William S. Durant, C. Ray Lux and Wallace D. Galloway. IEEE Trans. Reliab. 37, 138 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

91

RAPID: recursive algorithmic PIvotal decomposition program for complex structural reliability analysis : Kyung S. Park and Byung C. Cho. IEEE Trans. Reliab. 37, 50 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

92

A method for microprocessor software reliability prediction : J. Luis Roca. IEEE Trans. Reliab. 37, 88 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

93

Optimal preventive maintenance with repair : S. H. Sim and J. Endrenyi. IEEE Trans. Reliab. 37, 92 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

94

Bounding network-reliability using consecutive minimal cutsets : J. George Shanthikumar. IEEE Trans. Reliab. 37, 45 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

95

Censored life-data analysis using linguistic variables : Jyh-Hone Wang, John M. Liittschwager and Tzvi Raz. IEEE Trans. Reliab. 37, 111 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

96

Reliability optimization in cable system design using a fuzzy uniform-cost algorithm : Sushil Das Gupta and Muhammad Jawad Al-Musawi. IEEE Trans. Reliab. 37, 75 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 250 KB

english, 1989

97

Robust estimators of the 2-parameter gamma distribution : A. Adatia. IEEE Trans. Reliab. 37, 234 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

98

Performability evaluation of multicomponent fault-tolerant systems : Vincenzo Grassi, Lorenzo Donatiello and Guideppe Iazeolla. IEEE Trans. Reliab. 37, 216 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

99

Wafer scale integration: a review : P. K. Chaturvedi. Microelectron. J. 19(2), 4 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

100

Data sources for microcomputer component selection : Paul F. Petersen and R. P. Davis. Comput. ind. Engng 14, 381 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

101

Yield implications and scaling laws for submicrometer devices : Albert V. Ferris-Prabhu. IEEE Trans. Semiconductor Mfg 1(2), 49 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

102

Effects of annealing temperature on electromigration performance of multilayer metallisation systems : Hoang H. Hoang. Proc. IEEE/IRPS, 173 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

103

Simulation of focus effects in photolithography : Douglas A. Bernard. IEEE Trans. Semiconductor Mfg 1(3), 85 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 250 KB

english, 1989

104

A new low temperature polysilicon CVD process : Douglas Meakin. Semiconductor int., 74 (July 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

105

Determining shelf life of epoxy molding compounds : Karl Rosengarth and Preston Heinle. Semiconductor int., 212 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

106

Scheduling semiconductor wafer fabrication : Lawrence M. Wein. IEEE Trans. Semiconductor Mfg 1(3), 115 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

107

Analysis of package cracking during reflow soldering process : Makoto Kitano, Asao Nishimura, Sueo Kawai and Kunihiko Nishi. Proc. IEEE/IRPS, 90 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

108

ASIC photolithography: characterization challenges : K. Anderson, P. Sandholm and A. Zandra. Semiconductor int., 262 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

109

Submicron E-beam process control : Mirghani Widat-Alla, Al Wong, David Dameron and Chong-Cheng Fu. Semiconductor int., 252 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

110

Getting more out of handlers : Stephen F. Scheiber. Test Measurement Wld, 99 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

111

In situ tapered contact etch : Scott Roth, Wayne Ray and Glenn Wissen. Semiconductor int., 138 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

112

Statistical control of VLSI fabrication processes: a framework : Purnendu K. Mozumber, C. R. Shyamsundar and Andrzej J. Strojwas. IEEE Trans. Semiconductor Mfg 1(2), 62 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

113

Effects of contamination on aluminum films. Part 1: room temperature deposition : G. J. van der Kolk, M. J. Verkerk and W. A. M. C. Brankaert. Semiconductor int., 224 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

114

Liquid dropping resin for IC encapsulation : Shigenori Yamaoka, Akinobu Kusuhara and Yukihiro Okabe. IEEE Trans. Compon. Hybrids Mfg Technol. 11, 145 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

115

New directions in wet chemical processing : Peter H. Singer. Semiconductor int., 41 (July 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 249 KB

english, 1989

116

Choosing a wafer-probing technique : Stephen F. Scheiber. Test Measurement Wld, 59 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

117

Measuring response of mass flow controllers : Joseph C. Dille. Semiconductor int., 234 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

118

Low vs. high temperature epitaxial growth : Michael R. Goulding and John O. Borland. Semiconductor int., 90 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

119

Bromine based aluminium etching : Ole Krogh. Semiconductor int., 276 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

120

High reliability Al-Si alloy/Si contacts by rapid thermal sintering : Eiichi Umemura, Hiroshi Onoda and Shoji Madokoro. Proc. IEEE/IRPS, 230 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

121

Statistical control of VLSI fabrication processes: a software system : C. R. Shyamsundar, Purnendu K. Mozumber and Andrzej J. Strojwas. IEEE Trans. Semiconductor Mfg 1(2), 72 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

122

A new soft-error phenomenon in VLSIs The alpha-particle-induced source/drain penetration (ALPEN) effect : Eiji Takeda, Dai Hisamoto and Tohru Toyabe. Proc. IEEE/IRPS, 109 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

123

Functional programming aspects of wafer scale integration : M. J. Shute. Microelectron. J. 19(3), 31 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

124

Optimum number of errors corrected before releasing a software system : D. S. Bai and W. Y. Yun. IEEE Trans. Reliab. 37, 41 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

125

A review of IC fabrication design and assembly defects manifested as field failures in Air Force avionic equipment : Thomas J. Green. Proc. IEEE/IRPS, 226 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

126

Designing electronics for automated inspection : D. Thompson and T. Stroebel. Circuit Wld 14(4), 13 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 251 KB

english, 1989

127

Evidence for acceptor surface states in GaAs planar-type devices : P. Dansas, M. Bouchemat, C. Bru, D. Pascal and S. Laval. Solid-St. Electron. 31, 1327 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

128

Electronic band structure of monolayer thin semiconductor superlattices : G. P. Srivastava. Vacuum 38, 233 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

129

Properties of diffused resistors in solar-grade semicrystalline silicon : A. El-Emawy, A. Zekry, M. El-Koosy and H. Fikry. Solid-St. Electron. 31, 1179 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

130

Impurity concentration dependence of the 1f noise parameter α in silicon: M. M. Jevtic. Solid-St. Electron. 31, 1049 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

131

Alpha-particle-induced soft-error mechanism in semi-insulating GaAs substrate : Y. Umemoto, N. Matsunaga and K. Mitsusada. Proc. IEEE/IRPS, 102 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

132

Generation-annealing of oxide and interface traps at 150 and 298 K in oxidized silicon stressed by Fowler-Nordheim electron tunneling : Charles Ching-Hsiang Hsu and C. Tang Sah. Solid-St. Electron. 31, 1003 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

133

Kinetic study of electromigration failure in Cr/Al-Cu thin film conductors covered with polyimide and the problem of the stress dependent activation energy : J. R. Lloyd, M. Shatzkes and D. C. Challener. Proc. IEEE/IRPS, 216 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

134

The effect of interface states, at mid-gap, in p-silicon/SiO2 junctions: K. M. Brunson, D. Sands, M. H. Tayarani-Najaran and C. B. Thomas. Vacuum 38, 377 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 129 KB

english, 1989

135

A new method for the determination of channel depth and doping profile in buried-channel MOS transistors : K. Iniewski and A. Jakubowski. Solid-St. Electron. 31, 1259 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 254 KB

english, 1989

136

Scanning low energy electron loss microscopy (SLEELM): metals on semiconductors : Vacuum 38, 209 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

137

On space-charge-limited conduction in semi-insulating GaAs : J. J. Mares, J. Kristofik and V. Smid. Solid-St. Electron. 31, 1309 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

138

Dielectric spectroscopy of silicon barrier devices : Andrew K. Jonscher and Mark N. Robinson. Solid-St. Electron. 31, 1277 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

139

Electron energy loss spectroscopy applied to semiconductor space charge layers : Hans Lüth. Vacuum 38, 223 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

140

Effect of RuO2 on the behaviour of silver at thick-film terminations : Takashi Yamaguchi and Makiko Kageyama. IEEE Trans. Compon. Hybrids mfg Technol. 11, 134 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

141

Effect of oxide glass on the sintering behaviour and electrical properties in Ag thick films : Young Sir Chung and Ho-Gi Kim. IEEE Trans. Compon. Hybrids mfg Technol. 11, 195 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

142

Utilizing scanning electron microscopy to observe the initiation and development of slip bands and fracture in a nickel based metallic glass : S. J. Harbert and A. Wolfenden. Micron microsc. acta 19, 105 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 128 KB

english, 1989

143

A comparison between noise measurements and conventional electromigration reliability testing : J. G. Cottle, T. M. Chen and K. P. Rodbell. Proc. IEEE/IRPS, 203 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

144

Application of copper conductor and ruthenium containing oxides-glass resistor to high-frequency hybrid ICs for a protable cellular radio : Toshio Ogawa, Mituru Fujii, Tadamichi Asai, Akira Ikegami and Takae Kobayashi. IEEE Trans. Compon. Hybrids mfg Technol. 11, 211 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

145

Ultra-low dielectric constant porous silica thick films for high-speed IC packaging : Umar Mohideen, T. R. Gururaja, Leslie E. Cross and Rustum Roy. IEEE Trans. Compon. Hybrids mfg Technol. 11, 159 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

146

Troubleshooting ion implantation processes : Charles B. Yarling and W. Andrew Keenan. Semiconductor int., 164 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

147

Real-time monitoring of ion implantation : Gilbert A. Gruber and Norma B. Riley. Semiconductor int., 178 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

148

Low-frequency noise in GaAs layers grown by molecular beam epitaxy : Munecazu Tacano, Yoshinobu Sugiyama, Takashi Taguchi and Hajime Soga. Solid-St. Electron. 31, 1215 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

149

Laser-based pattern generation : Pieter Burggraaf. Semiconductor int., 116 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

150

Particle control in high-current ion implanters : Wes Weisenberger. Semiconductor int., 188 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

151

The effect of nitrogen implantation on the tribological properties of gold-based alloys and electroplated palladium : Patrick W. Leech. IEEE Trans. Compon. Hybrids mfg Technol. 11, 16 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

152

Discrete wire bonding using laser energy : P. Chalco, A. Gupta, B. Hussey, R. Hodgson and G. Arjavalingam. Semiconductor int., 130 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

153

New microwave ion source for multiply charged ion beam production : K. Tokiguchi, K. Amemiya, H. Koike, N. Sakudo and T. Seki. Vacuum 38, 487 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

154

Rapid thermal annealing effects on gate oxide of ion implanted devices : F. Hashemi and C. A. Paz De Araujo. Semiconductor int., 152 (May 1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

155

Preparation of titanium nitride films by reactive ion plating and the influence of discharge current density on the film properties : A. Rousseau and J. Guille. Vacuum 38, 443 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

156

Lf noise in ion-implanted indium phosphide layers: Munecazu Tacano, Kinya Oigawa and Yoshinobu Sugiyama. Solid-St. Electron. 31, 1243 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

157

Atomic beam scattering : N. V. Richardson. Vacuum 38, 279 (1988)

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 123 KB

english, 1989

158

4811082 High performance integrated circuit packaging structure

ScottL Jacobs, Perwai Nihal, Burhan Ozmat, Henri Schnurmann

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 77 KB

english, 1989

159

4811344 Device for the testing and checking of the operation of blocks within an integrated circuit

Gerard Chauvel, Jean Ciroux

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 77 KB

english, 1989

160

4812421 Tab-type semiconductor process

RichardH Jung, PhilipR Logsdon

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 166 KB

english, 1989

161

4812678 Easily testable semiconductor LSI device

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 88 KB

english, 1989

162

4812742 Integrated circuit package having a removable test region for testing for shorts and opens

KennethN Abel, JohnE Rudy

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 88 KB

english, 1989

163

4812750 Environmental stress screening apparatus

JerryL Keel, ThomasM Hines, Glen Davis, WilliamE Parks

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 88 KB

english, 1989

164

4812755 Base board for testing integrated circuits

Nakaie Toshiyuki, Oonishi Tethuo

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 160 KB

english, 1989

165

4812756 Contactless technique for semicondutor wafer testing

Huntington Curtis, Min-Su Fung, Roger Verkuil

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 72 KB

english, 1989

166

4813024 Integrated circuit for the confidential storage and processing of data, comprising a device against fraudulent use

Gilles Lisimaque, Serge Fruhauf

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 72 KB

english, 1989

167

4813043 Semiconductor test device

Hidesh Maeno, Tetsuo Tada

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 72 KB

english, 1989

168

Profit evaluation of a two unit cold standby system with a proviso of rest

S.K. Singh, R.P. Singh

Journal:

Microelectronics Reliability

Year:

1989

Language:

english

File:

PDF, 220 KB

english, 1989