4764926 Integrated circuits

Microelectronics Reliability 1989 Vol. 29; Iss. 4

4764926 Integrated circuits

WilliamL Knight, Mark Paraskeva, DavidF Burrows
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Volume:
29
Year:
1989
Language:
english
DOI:
10.1016/0026-2714(89)90535-0
File:
PDF, 89 KB
english, 1989
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