Human contamination as a source of IC failures : M. Brenman...

Human contamination as a source of IC failures : M. Brenman and J. Mejerovich. Microelectron. J. 20(3), 43 (1989)

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Volume:
30
Year:
1990
Language:
english
DOI:
10.1016/0026-2714(90)90445-s
File:
PDF, 118 KB
english, 1990
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