Volume 30; Issue 3

Microelectronics Reliability

Volume 30; Issue 3

1

Publications, notices, calls for papers, etc.

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 48 KB

english, 1990

2

Compound availability measures for a two-unit standby system

P.K. Kapur, R.B. Garg, V.K. Bhalla

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 66 KB

english, 1990

3

Two models for two-dissimilar-unit cold standby redundant system with partial failure and two types of repairs

G.S. Mokaddis, Kh.M. El-Said

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 29 KB

english, 1990

4

A complex priority redundant system with phase type distribution

M. Gururajan, K. Shankar Bhat

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 249 KB

english, 1990

5

Cost analysis of a multi-component screening system in the paper industry

Dinesh Kumar, Jai Singh, P.C. Pandey

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 965 KB

english, 1990

6

MTSF and availability analysis of a complex system composed of two subsystems in series subjected to random shocks with single repair facility

J.P. Singh Joorel

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 171 KB

english, 1990

7

Testing equality of means in a bivariate normal population under possible presence of correlation coefficient

C.P.L. Srivastava, S.R. Srivastava

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 268 KB

english, 1990

8

Analysis of a protective system having two types of failure

S.K. Singh, R.P. Singh

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 190 KB

english, 1990

9

The limit condition of some time between failure models of software reliability

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 280 KB

english, 1990

10

Reliability analysis of a warm standby system with general distributions

E.J. Vanderperre

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 468 KB

english, 1990

11

Reliability analysis of a two-unit parallel system with dissimilar units and general distributions

E.J. Vanderperre

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 308 KB

english, 1990

12

The alternate approach to the reliability modeling of fault masking systems

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 238 KB

english, 1990

13

Excess repair time for a repairable system

G.K. Agrafiotis, P.R. Parthasarathy, M. Sharafali

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 615 KB

english, 1990

14

Performance control of systems with two decisive factors

Torky I. Sultan

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 255 KB

english, 1990

15

Estimated costs of system maintenance and repair

Torky I. Sultan

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 130 KB

english, 1990

16

Parallelization of expert systems with recursive applications

E. Yaprak, L. Anneberg

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 251 KB

english, 1990

17

Star-delta transformations of bidirectional branches in probabilistic flow networks

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 112 KB

english, 1990

18

Probabilistic analysis of a two-unit system with ‘start-up process time’ and imperfect switch

Yadavalli V.S. Sarma, R.P. Jaju

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 231 KB

english, 1990

19

Development of a new composite pseudo random number generator

Yosef S. Sherif, Roger G. Dear

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 331 KB

english, 1990

20

Development of a generic database for CAE/CAD/CAM system at an Air Force facility

Yosef S. Sherif, Albert A. Heaney

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 202 KB

english, 1990

21

Periodic replacement when minimal repair costs depend on the age and the number of minimal repair for a multi-unit system

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 452 KB

english, 1990

22

Availability measures of human-equipment standby redundant data-flow system with application to NASA deep space station

Tareq N. Issa, Don Hommertzheim

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 424 KB

english, 1990

23

Reliability analysis of a k-out-of-N:G parallel redundant system with multiple critical errors

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 351 KB

english, 1990

24

A note on experiment design for accelerated life tests

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 535 KB

english, 1990

25

Reliability fundamentals: Authors: Vasile M. Catuneanu Adrian N. Mihalache Publishers: Elsevier Science Publishers, Sara Burgerhartstraat 25, P.O. Box 211, 1000 AE Amsterdam, The Netherlands and Editura academiei RSR Calea Victoriei 125 R-79717, Bucharest, Romania. (ISBN 0-444-98879-3). Published 1989. Price: US$ 121.00, Df1. 230.00

Florin Popentiu

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 158 KB

english, 1990

26

Lithography in microelectronics: Edited by: T.M. Makhviladze Publishers: Nova Science Publishers, Inc., 283, Commack Road, Suite 300, COMMACK, New York 11725-3401, United States of America. Price: $ 62.00 (U.S. and Canada) $ 75.00 (Other countries) includes air delivery (ISBN 0-941743-30-6). Published 1989

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 510 KB

english, 1990

27

VLSI electronics microstructure science volume 21 beam processing technologies: Edited by: Norman G. Einspruch S. S. Cohen Raj N. Singh Publishers: Academic Press, Inc., 1250 Sixth Avenue, San Diego, California 92101, United States of America. Price: $ 110. 00. Publication date: 1989 (ISBN 0-12- 234121-X)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 106 KB

english, 1990

28

Particles on surfaces volume 1 detection, adhesion, and removal: Edited by: K. L. Mittal Publishers: Plenum Publishing Corporation, 233, Spring Street, New York, New York 10013, United States of America. Price: $ 82.50 (U.S. and Canada) $ 99.00 (other countries) (ISBN 0-306-43030-4). Published 1988

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 55 KB

english, 1990

29

Applied electromagnetics in materials: Edited by: K. Miya Publishers: Pergamon Press PLC, Headington Hill Hall, Oxford OX3 OBW, England. Price: £ 55.00 ($ 99.00). Published 1989. (ISBN 0-08 037191-4)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 48 KB

english, 1990

30

Natural language processing technologies in artificial intelligence: The science and industry perspective: Author: Klaus K. Obermeier Publisher: Ellts Horwood Limited, Chichester, England. Halstead Press: a division of John Wiley and Sons (ISBN 0-7458-0562-0 (Ellis Horwood Limited) (ISBN 0 - 470-21528-3) (Halsted Press) Published 1989

Florin Popentiu

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 50 KB

english, 1990

31

High reliability in the commercial arena : James E. “Gene” Bridgers. Proc. a. Reliab. Maintainab. Symp., 363 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 107 KB

english, 1990

32

Warranties: concept to implementation : James R. Brennan and Sherman A. Burton. Proc. a. Reliab. Maintainab. Symp., 1 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 70 KB

english, 1990

33

A performance measure for a VHSIC avionic system: mission dependent availability : Seung C. Chay and Joseph G. Henderson. Proc. a. Reliab. Maintainab. Symp., 191 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 97 KB

english, 1990

34

Reliability models for mechanical equipment : Jimmie J. Nelson, James D. Raze, James Bowman, Garry Perkins and Alonzo Wannamaker. Proc. a. Reliab. Maintainab. Symp., 146 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 97 KB

english, 1990

35

Thought-provoking gems from my reliability experience : C. M. Ryerson and Cornelia Ryerson. Proc. a. Reliab. Maintainab. Symp., 234 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 97 KB

english, 1990

36

The numbers game with the logistics support analysis record (LSAR) : John E. Eisamen, Jr. Proc. a. Reliab. Maintainab. Symp., 328 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 97 KB

english, 1990

37

Storage reliability : John P. Rooney. Proc. a. Reliab. Maintainab. Symp., 178 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 228 KB

english, 1990

38

The cost of poor repair process quality (COPRPQ) : Timothy Hall. Proc. a. Reliab. Maintainab. Symp., 301 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

39

Environmental stress screening: an integration of disciplines : Henry Caruso. Proc. a. Reliab. Maintainab. Symp., 479 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

40

Impact of new technology on repair : Roy E. Neubauer and William C. Laird. Proc. a. Reliab. Maintainab. Symp., 69 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

41

Mechanical durability prediction methods : Ronald G. Lambert. Proc. a. Reliab. Maintainab. Symp., 119 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

42

The “hedgehog” shape of an ESD failure : M. Brenman and J. Mejerovich. Microelectron. J., 20(3) 39 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

43

Legal liability and system safety applied to expert systems : William A. Hyman, Waymon L. Johnston and Steven Spar. Comput. ind. Engng 16(3), 355 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

44

A new concept in reliability modelling : K. K. Aggarwal. Proc. a. Reliab. Maintainab. Symp., 86 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

45

Managing Murphy's law: engineering a minimum-risk system : Trudy E. Bell. IEEE Spectrum 24 (June 1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 250 KB

english, 1990

46

Qualification of high reliability medical grade batteries : Douglas P. Eberhard and Russell C. Stinebring. Proc. a. Reliab. Maintainab. Symp., 356 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 118 KB

english, 1990

47

Nonplanar VLSI arrays with high fault-tolerance capabilities : Shahram Latifi and Ahmed El-Amawy. IEEE Trans. Reliab. 38(1), 51 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 118 KB

english, 1990

48

Effects of copper and titanium addition to aluminum interconnects on electro- and stress-migration open circuit failures : T. Hosoda, H. Yagi and H. Tsuchikawa. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 202 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 118 KB

english, 1990

49

HAST applications: acceleration factors and results for VLSI components : D. Danielson, G. Marcyk, E. Babb and S. Kudva. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 114 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 118 KB

english, 1990

50

Economic reliability testing of fiber optic systems : John Healy, Bruce Hoadley and Barry Lewin. Proc. a. Reliab. Maintainab. Symp., 396 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 118 KB

english, 1990

51

An investigation of the time dependence of current degradation in MOS devices : R. Rakkhit, M. C. Peckerar and C. T. Yao. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 103 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 118 KB

english, 1990

52

Human contamination as a source of IC failures : M. Brenman and J. Mejerovich. Microelectron. J. 20(3), 43 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 118 KB

english, 1990

53

Time-dependent dielectric breakdown of 210 Å oxides : K. C. Boyko and D. L. Gerlach. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 1 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 244 KB

english, 1990

54

Component failures based on flow distributions : Finn Jensen. Proc. a. Reliab. Maintainab. Symp., 91 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

55

Analysis of aluminum gallium arsenide laser diodes failing due to nonradiative regions behind the facets : William J. Fritz, Laura B. Bauer and Clint S. Miller. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 59 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

56

Noise and lifetime measurements in Si p+-i-n power diodes: P. Fang, L. He, A. D. Van Rheenen, A. van der Ziel and Q. Peng. Solid-St. Electron. 32(5), 345 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

57

Large-area fault clusters and fault tolerance in VLSI circuits: a review : C. H. Stapper. IBM J. Res. Dev. 33 (2), 162 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

58

Overheating effects in metallic point contacts : M. Asen, K. Keck and P. Bouillon. Solid-St. Commun. 70(9), 869 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

59

Ageing effects in GaAs Schottky barrier diodes : K. A. Christianson. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 65 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

60

Small-area fault clusters and fault tolerance in VLSI circuits : C. H. Stapper. IBM J. Res. Dev. 33(2), 174 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 249 KB

english, 1990

61

Filmless, sealed super-small chip trimmer potentiometers take on new importance : Yoshiyuki Ishii. JEE (Japan) 36 (April 1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 122 KB

english, 1990

62

Chip type aluminum electrolytic capacitors feature SMT-compatibility, low profiles : Kyoji Okushima. JEE (Japan) 42 (April 1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 122 KB

english, 1990

63

Bellcore system hardware reliability prediction : Allen L. Black. Proc. a. Reliab. Maintainab. Symp., 373 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 122 KB

english, 1990

64

Survey of available software-safety analysis techniques : Mark D. Hansen. Proc. a. Reliab. Maintainab. Symp., 46 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 122 KB

english, 1990

65

Why there is a need for a software-safety program : Gerald W. McDonald. Proc. a. Reliab. Maintainab. Symp., 30 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 122 KB

english, 1990

66

Software reliability from a system perspective : K. C. Ferrara, S. J. Keene and C. Lane. Proc. a. Reliab. Maintainab. Symp., 332 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 122 KB

english, 1990

67

Reliability computation of multistage interconnection networks : Christopher Botting, Suresh Rai and Dharma P. Agrawal. IEEE Trans. Reliab. 38(1), 138 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 122 KB

english, 1990

68

Reliability evaluation of hypercube multicomputers : Jong Kim, Chita R. Das, Woei Lin and Tse-Yung Feng. IEEE Trans. Reliab. 38(1), 121 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 122 KB

english, 1990

69

A reliability model for total field incidents : William J. Kerscher III, Tony Lin, Hal Stephenson, E. Harold Vannoy and Jerome Wioskowski. Proc. a. Reliab. Maintainab. Symp., 22 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 249 KB

english, 1990

70

Cost-effective software safety analysis : Lewis Bass and Daniel L. Martin. Proc. a. Reliab. Maintainab. Symp., 35 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

71

Motivating reliable switching system performance : L. A. Fletcher, D. E. Burns and W. P. Cochrane. Proc. a. Reliab. Maintainab. Symp., 383 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

72

Operability and maintainability hazards in communications systems : Michael W. Hulet and Kenneth F. Morehouse. Proc. a. Reliab. Maintainab. Symp., 379 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

73

Performance analysis of fault-tolerant systems in parallel execution of conversations : K. H. Kim, Shin Heu and Seung M. Yang. IEEE Trans. Reliab. 38(1), 96 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

74

Reliability analysis of redundant-path interconnection networks : Anujan Varma and C. S. Raghavendra. IEEE Trans. Reliab. 38(1), 130 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

75

Modeling and analysis of systems with multimode components and dependent failures : Khiem V. Le and Victor O. K. Li. IEEE Trans. Reliab. 38(1), 68 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

76

Software reliability and redundancy optimization : Dong-Hae Chi, Hsin-Hui Lin and Way Kuo. Proc. a. Reliab. Maintainab. Symp., 41 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 256 KB

english, 1990

77

Integrated reliability growth testing : Alan W. Benton and Larry H. Crow. Proc. a. Reliab. Maintainab. Symp., 160, (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 129 KB

english, 1990

78

Modeling server-unreliability in closed queuing networks : C. S. Ramanjaneyula and V. V. S. Sarma. IEEE Trans. Reliab. 38(1), 90 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 129 KB

english, 1990

79

A corollary to: Duane's postulate on reliability growth : Daniel G. Frank. Proc. a. Reliab. Maintainab. Symp., 167 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 129 KB

english, 1990

80

Invariant permutations for consecutive k-out-of-n cycles: F. K. Hwang. IEEE Trans. Reliab. 38(1), 65 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 129 KB

english, 1990

81

Reliability testing of a software-driven system : Don N. Hagist. Proc. a. Reliab. Maintainab. Symp., 347 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 129 KB

english, 1990

82

Approximate availability analysis of VAXcluster systems : Oliver C. Ibe, Richard C. Howe and Kishor S. Trivedi. IEEE Trans. Reliab. 38(), 146 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 129 KB

english, 1990

83

Reliability database development for use with an object-oriented fault tree evaluation program : A. Sharif Heger, F. A. Patterson-Hine, Robert J. Harringtton and Billy V. Koen. Proc. a. Reliab. Maintainab. Symp., 283 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 129 KB

english, 1990

84

Integration of reliability—and tolerance effect analysis : Ir. A. C. Brombacher, H. A. de Boer and J. Van't Loo. Proc. a. Reliab. Maintainab. Symp., 441 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 129 KB

english, 1990

85

R&M through avionics/electronics integrity program : Wilbur W. Bhagat. Proc. a. Reliab. Maintainab. Symp., 216 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 259 KB

english, 1990

86

Prediction for system reliability and availability : Gerard Collas. Proc. a. Reliab. Maintainab. Symp., 337 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 131 KB

english, 1990

87

Reliability analysis of interconnection networks using hierarchical composition : James T. Blake and Kishor S. Trivedi. IEEE Trans. Reliab. 38(1), 111 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 131 KB

english, 1990

88

SPAREL: a model for reliability and sparing in the world of redundancies : Arne Nordin and Fritz F. Maier. Proc. a. Reliab. Maintainab. Symp., 313 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 131 KB

english, 1990

89

Reliability issues with multiprocessor distributed database systems: a case study : Chi-Ming Chen and Jose D. Ortiz. IEEE Trans. Reliab. 38(1), 153 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 131 KB

english, 1990

90

Dynamic analyses in mass spectrometry of SF6 plasma during etching of silicon : Nobuki Mutsukura and Guy Turban. Vacuum 39(6), 579 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 131 KB

english, 1990

91

Software reliability growth process—a life cycle approach : Dev G. Raheja. Proc. a. Reliab. Maintainab. Symp., 52 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 131 KB

english, 1990

92

Models and algorithms for reliability-oriented task-allocation in redundant distributed-computer systems : Sol M. Shatz and Jia-Ping Wang. IEEE Trans. Reliab. 38(1), 16 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 258 KB

english, 1990

93

Repair actions for self-diagnostic machines : Zoltan Papp. Proc. a. Reliab. Maintainab. Symp., 56 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

94

Built-in test strategies for military systems : Donald H. Merlino and John Hadjilogiou. Proc. a. Reliab. Maintainab. Symp., 59 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

95

Robust testing of CMOS logic circuits : Niraj K. Jha. Comput. Electr. Engng 15(1), 19 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

96

Redundancy strategy for dependent subsystems : Ze'ev Porat. Proc. a. Reliab. Maintainab. Symp., 96 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

97

An expert system to facilitate fault isolation : Steven M. Buswell and Paul A. Sesto. Proc. a. Reliab. Maintainab. Symp., 74 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

98

Hill-climbing heuristics for optimal hardware dimensioning and software allocation in fault-tolerant distributed systems : Fausto Distante and Vincenzo Piuri. IEEE Trans. Reliab. 38(1), 28 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

99

A method for generating weighted random test patterns : J. A. Waicukauski, E. Lindbloom, E. B. Eichelberger and O. P. Forlenza. IBM J. Res. Dev. 33(2), 149 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

100

Reliability analysis of a class of fault tolerant systems : Hoang Pham and Shambhu J. Upadhyaya. Proc. a. Reliab. Maintainab. Symp., 114 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

101

Monte Carlo evaluation of a dynamic reliability problem with an application to a case of partial cuts : Tsunehiko Tanaka, Hiromitsu Kumamoto and Koichi Inoue. Proc. a. Reliab. Maintainab. Symp., 108 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

102

Effect of mechanical stress for thin SiO2 films in TDDB and CCST characteristics : Y. Ohno, A. Ohsaki, T. Kaneoka, J. Mitsuhashi, M. Hirayama and T. Kato. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 34 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

103

A class of fault-tolerant multiprocessor networks : Arif Ghafoor. IEEE Trans. Reliab., 38(1), 5 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

104

The passivation of silicon devices by a-Si:H films : Yuliang He. Solid-St. Electron. 32(5), 355 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

105

Si/Ti/TiB2/Al structures investigated as contacts in microelectronic devices : T. Larsson, U. Wennstrom, H. Norstrom, H.-O. Blom, S. Berg and I. Engstrom. Solid-St. Electron. 32(5), 385 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

106

Ultrahigh reliability estimates through simulation : Robert M. Geist and Mark K. Smotherman. Proc. a. Reliab. Maintainab. Symp., 350 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

107

Stacking fault growth of f.c.c. crystal: the Monte-Carlo simulation approach : Jian-Min Jin and Nai-Ben Ming. Solid-St. Commun. 70(7), 759 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

108

Into the nineties: VLSI trends and education : John B. Butcher. Microelectron. J. 20(1–2), 1 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

109

Trends in semiconductor memories : H. E. Maes, G. Groeseneken, H. Lebon and J. Witters. Microelectron. J. 20(1–2), 9 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 127 KB

english, 1990

110

BiCMOS circuitry: the best of both worlds : Brian Santo. IEEE Spectrum 50 (May 1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 250 KB

english, 1990

111

On-chip measurement of package-related metal shift using an integrated silicon sensor : Andre Bossche. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 127 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 124 KB

english, 1990

112

Design of a self-reconfiguring interconnection network for fault-tolerant VLSI processor arrays : Stephen Pateras and Janusz Rajski. IEEE Trans. Reliab. 38(1), 40 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 124 KB

english, 1990

113

New anatomies for semiconductor wafers : John C. C. Fan. IEEE Spectrum 34 (April 1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 124 KB

english, 1990

114

Management method for LSI wafer fabrication facilities : Tsutomu Tsuyama, Toshimasa Harada, Jun Nakazato and Kouichi Kubouchi. Proc. a. Reliab. Maintainab. Symp., 183 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 124 KB

english, 1990

115

Smart power and high voltage integrated circuits and related MOS technologies : P. Rossel, J. Buxo, M. Bafleur and H. Tranduc. Microelectron. J. 20(1–2), 77 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 124 KB

english, 1990

116

A framework for knowledge-based computer-integrated manufacturing : Jeff Y.-C. Pan, Jay M. Tenenbaum and Jay Glicksman. IEEE Trans. Semiconductor Mfg 2(2), 33 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 124 KB

english, 1990

117

Fact and fiction in yield modeling : C. H. Stapper. Microelectron. J. 20(1–2), 129 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 232 KB

english, 1990

118

High-performance optics—fundamental constituent of equipment for VLSI circuit fabrication : Klaus-Dieter Gattnar, Klaus Merkel, Hans-Joachim Schilling and Wolfgang Seide. Jena Rev. 1, 6 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 109 KB

english, 1990

119

Three-dimensional process and device modeling : S. Selberherr and E. Langer. Microelectron. J. 20(1–2), 113 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 109 KB

english, 1990

120

Multiplexing input options of VLSI circuits implemented in four-phase dynamic logic technology : D. C. Patel. Microelectron. J. 20(3), 1 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 109 KB

english, 1990

121

Application-specific integrated circuits (ASICs)—a main-stream line of VLSI device fabrication : Peter Winkler and Michael Hentschel. Jena Rev. 1, 18 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 109 KB

english, 1990

122

New effects resulting from the co-operation between process engineering and equipment design in IC fabrication : Ulf Gottschling, Jena Rev. 1, 10 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 109 KB

english, 1990

123

Three-dimensional integrated circuit: technology and application prospect : Yoichi Akasaka. Microelectron. J. 20(1–2), 105 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 109 KB

english, 1990

124

p-MOSFET gate current and device degradation: Tong-Chern Ong, Koichi Seki, Ping K. Ko and Chenming Hu. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp. 178 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

125

ESD phenomena in graded junction devices : C. Duvvury, R. N. Rountree, H. J. Stiegler, T. Polygreen and D. Corum. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 71 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

126

Interface state generation due to electron tunneling into thin oxides : Yoshio Ozawa, Masao Iwase and Akira Toriumi. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 22 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

127

Process optimization tweaking tool (POTT) and its application in controlling oxidation thickness : Richard L. Guldi, C. Dean Jenkins, Gregg M. Damminga, Thomas A. Baum and Thomas A. Foster. IEEE Trans. Semiconductor Mfg 2(2), 54 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

128

A study of the majority carrier mobility in hydrogenated boron-doped silicon : A. Chari and M. Aucouturier. Solid-St. Commun. 71(2), 105 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

129

Silicon-hydrogen bonds and microvoids in hydrogenated amorphous silicon and Staebler-Wronski effect : G. G. Qin and G. L. Kong. Solid-St. Commun. 71(1), 41 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

130

A theoretical derivation of the log-normal distribution of time-dependent dielectric breakdown in thin oxides : Yuh Yaw and R. S. Muller. Solid-St. Electron. 32(7), 541 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

131

A study of the breakdown testing of thermal silicon oxides and the effects of preoxidation surface treatment : D. B. Kao, J. M. Delarios, C. R. Helms and B. E. Deal. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 9 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

132

Interface degradation and dielectric breakdown of thin oxides due to homogeneous charge injection : M. Kerber and U. Schwalke. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 17 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 128 KB

english, 1990

133

Study of bandgap narrowing in the space-charge region of heavily doped silicon MOS capacitors : H. C. Chen, Sheng S. Li and K. W. Teng. Solid-St. Electron. 32(5), 339 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 260 KB

english, 1990

134

Extensions of the effective thickness theory of oxide breakdown : Donald J. Coleman, Jr., William R. Hunter, George A. Brown and Ih-Chin Chen. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 39 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

135

Voltage shifts of Fowler-Nordheim tunneling J-V plots in thin gate oxide MOS structures due to trapped charges : S. J. Oh and Y. T. Yeow. Solid-St. Electron. 32(6), 507 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

136

Photoluminescence of the residual shallow acceptor in Inx Ga1 − x grown on GaAs (001) by molecular beam epitaxy: Zhong-Ying Xu, Ji Zong Xu, T. G. Andersson and Zong-Gui Chen. Solid-St. Commun. 70(5), 505 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

137

Observation of coherent Zener tunneling in Si inversion layers : U. Kunze. Solid-St. Commun. 70(5), 573 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

138

Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs : J. Chung, M.-C. Jeng, J. E. Moon, P. K. Ko and C. Hu. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 92 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

139

Heterostructure semiconductor device analysis: a globally convergent solution method for the nonlinear Poisson equation : Gregory B. Tait. Solid-St. Electron. 32(5), 369 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

140

Temperature dependence of the conductivity in uniaxially stressed Si inversion layers at low temperatures : N. Paquin, M. Pepper, A. Gundlach and R. Ruthven. Solid-St. Commun. 70(8), 793 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 132 KB

english, 1990

141

Polarity dependence of thin oxide wearout : D. J. Dumin, K. J. Dickerson, M. D. Hall and G. A. Brown. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 28 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 237 KB

english, 1990

142

Ion-implanted-induced structural modifications in Y1Ba2Cu3O7−δ superconductor: S. N. Yedave, P. D. Kodali, S. T. Bendre, R. Viswanathan, S. M. Kanetkar, S. M. Chaudhari and S. B. Ogale. Solid-St. Commun. 70(12), 1131 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 104 KB

english, 1990

143

Pulsed laser deposition of barium titanate films on silicon : Rashmi Nawathey, R. D. Vispute, S. M. Chaudhari, S. M. Kanetkar and S. B. Ogale. Solid-St. Commun. 71(1), 9 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 104 KB

english, 1990

144

The growth and characterization of ZnSe epilayers grown by VPE and MOCVD : Yan-Kuin Su, Chung-Cheng Chang and Chung-Chuang Wei. Prog. Crystal Growth Charact. 17, 241 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 104 KB

english, 1990

145

Effect of argon implantation on antimony implanted silicon : G. S. Virdi, S. K. Chattopadhyaya, N. Nath and W. S. Khokle. Solid-St. Electron. 32(6), 433 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 104 KB

english, 1990

146

New applications of focused ion beam technique to failure analysis and process monitoring of VLSI : K. Nikawa, K. Nasu, M. Murase, T. Kaito, T. Adachi and S. Inoue. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 43 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 104 KB

english, 1990

147

A new reliability problem associated with Ar ion sputter cleaning of interconnect vias : Hideki Tomioka, Shin-Ichi Tanabe and Koichiro Mizukami. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 53 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 104 KB

english, 1990

148

An altered layer model for ion assisted deposition under net growth conditions : G. Carter, I. V. Katardjiev and M. J. Nobes. Vacuum 39(6), 571 (1989)

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 104 KB

english, 1990

149

4845425 Full chip integrated circuit tester

JohannesG Beha, RussellW Dreyfus, JeffreyA Kash, GaryW Rubloff

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 80 KB

english, 1990

150

4845426 Temperature conditioner for tests of unpackaged semiconductors

Charles Nolan, Stuart Sahr

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 80 KB

english, 1990

151

4847553 Needle card contacting mechanism for testing micro-electronic components

Siegfried Seinecke

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 80 KB

english, 1990

152

4847810 Memory having redundancy circuit

Tomoyuki Tagami

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 43 KB

english, 1990

153

4847838 Circuit for testing the bus structure of a printed wiring card

Journal:

Microelectronics Reliability

Year:

1990

Language:

english

File:

PDF, 43 KB

english, 1990

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