Noise and lifetime measurements in Si p+-i-n power diodes: P. Fang, L. He, A. D. Van Rheenen, A. van der Ziel and Q. Peng. Solid-St. Electron. 32(5), 345 (1989)
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Volume:
30
Year:
1990
Language:
english
DOI:
10.1016/0026-2714(90)90449-w
File:
PDF, 127 KB
Your tags:
english, 1990
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