Robust testing of CMOS logic circuits : Niraj K. Jha....

Microelectronics Reliability 1990 Vol. 30; Iss. 3

Robust testing of CMOS logic circuits : Niraj K. Jha. Comput. Electr. Engng 15(1), 19 (1989)

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Volume:
30
Year:
1990
Language:
english
DOI:
10.1016/0026-2714(90)90488-9
File:
PDF, 127 KB
english, 1990
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