Interface state generation due to electron tunneling into...

Interface state generation due to electron tunneling into thin oxides : Yoshio Ozawa, Masao Iwase and Akira Toriumi. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 22 (1989)

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Volume:
30
Year:
1990
Language:
english
DOI:
10.1016/0026-2714(90)90519-s
File:
PDF, 128 KB
english, 1990
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