A theoretical derivation of the log-normal distribution of time-dependent dielectric breakdown in thin oxides : Yuh Yaw and R. S. Muller. Solid-St. Electron. 32(7), 541 (1989)
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Volume:
30
Year:
1990
Language:
english
DOI:
10.1016/0026-2714(90)90523-p
File:
PDF, 128 KB
Your tags:
english, 1990
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