A study of the breakdown testing of thermal silicon oxides and the effects of preoxidation surface treatment : D. B. Kao, J. M. Delarios, C. R. Helms and B. E. Deal. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 9 (1989)

The file will be sent to you via the Telegram messenger. It may take up to 1-5 minutes before you receive it.

Note: Make sure you have linked your account to Z-Library Telegram bot.

The file will be sent to your Kindle account. It may take up to 1–5 minutes before you receive it.

Please note: you need to verify every book you want to send to your Kindle. Check your mailbox for the verification email from Amazon Kindle.