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Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs : J. Chung, M.-C. Jeng, J. E. Moon, P. K. Ko and C. Hu. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 92 (1989)
Volume:
30
Year:
1990
Language:
english
DOI:
10.1016/0026-2714(90)90531-q
File:
PDF, 132 KB
english, 1990