Analysis of Stochastic Petri Net model with non-exponential...

Microelectronics Reliability 1991 Vol. 31; Iss. 5

Analysis of Stochastic Petri Net model with non-exponential distributions using a generalized Markov Renewal Process

Qun Jin, Yoshio Sugasawa, Koichiro Seya
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Volume:
31
Year:
1991
Language:
english
Pages:
7
DOI:
10.1016/0026-2714(91)90038-9
File:
PDF, 367 KB
english, 1991
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