A stuck fault model for dynamic CMOS combinational circuits

Microelectronics Reliability 1991 Vol. 31; Iss. 2-3

A stuck fault model for dynamic CMOS combinational circuits

Asad A. Ismaeel
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Volume:
31
Year:
1991
Language:
english
Pages:
21
DOI:
10.1016/0026-2714(91)90228-y
File:
PDF, 792 KB
english, 1991
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