Volume 31; Issue 2-3

Microelectronics Reliability

Volume 31; Issue 2-3
4

On the effect of power-line disturbances on microcomputer performance

Valentin Obac Roda, Onofre Trindade Jr
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 442 KB
english, 1991
5

Reliability assessment of computer systems design

M.R. Bastos Martini, J. Moreira de Souza
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 515 KB
english, 1991
6

A method for evaluation of number class intervals of histogram

D.M. Brkić
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 246 KB
english, 1991
8

A practical method of binomial reliability assessment

Hong-Zhou Wang, Bao-Hua Ma
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 138 KB
english, 1991
9

Three-server bulk service queue with service interruptions and exponential repairs

I.P. Singh, Chhotu Ram
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 186 KB
english, 1991
12

Optimization of test parallelism with limited hardware overhead

Sheng Feng, Yashwant K. Malaiya
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 426 KB
english, 1991
13

Reliability analysis of a system with a human operator and subject to two failure modes

Ashok Kumar, S.C. Garg
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 364 KB
english, 1991
15

Applications of a search algorithm to reliability design problems

Krishna B. Misra, Usha Sharma
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 444 KB
english, 1991
16

An efficient approach for multiple criteria redundancy optimization problems

Krishna B. Misra, Usha Sharma
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 572 KB
english, 1991
19

Repair body cost minimization with unreliable Markovian restoration

Oleg Martynenko
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 285 KB
english, 1991
20

Excess noise as an indicator of digital integrated circuit reliability

B.K. Jones, Y.Z. Xu
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 448 KB
english, 1991
21

Reliability analysis of a series system with repair

Who Kee Chung
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 85 KB
english, 1991
22

Reliability analysis of a human operator under several levels of stress

Who Kee Chung
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 137 KB
english, 1991
23

Reliability analysis of a series repairable system with multiple failures

Who Kee Chung
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 125 KB
english, 1991
24

TMR neural simulation

C.A. Goben, M. Suliman, M.A. Manzoul
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 206 KB
english, 1991
25

Optimal replacement of a system with imperfect repair

Viliam Makiš, Andrew K.S. Jardine
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 259 KB
english, 1991
27

Reliability measures for fail safe computer-based systems

Zhibang Zhou, Chunxin Yuan
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 232 KB
english, 1991
28

A stuck fault model for dynamic CMOS combinational circuits

Asad A. Ismaeel
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 792 KB
english, 1991
30

Reliability model of cold standby systems with built-in-test

Jiajun Shao, Leonard R. Lamberson
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 368 KB
english, 1991
31

Analysis of a complex system composed of two sub-systems with their standbys

Rakesh Gupta, Sachendra Bansal
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 339 KB
english, 1991
32

The Sherif-Dear simple (SDS) Theorem in number theory

Yosef S. Sherif, Roger G. Dear
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 377 KB
english, 1991
34

Design of reconfigurable fault-tolerant VLSI/WSI processor array structures

A. Noore, H. Nariman, M.A. Manzoul
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 344 KB
english, 1991
35

Local area network implementation of petri net reachability analysis

L. Anneberg, E. Yaprak
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 353 KB
english, 1991
37

On multivariate generalized logistic distribution

Aisha Ragab
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 251 KB
english, 1991
38

Revised test that a distribution is new better than used

Jack R. Green, Aisha S. Ragab
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 140 KB
english, 1991
39

New definitions of basic R&M terms

Duncan Badenius
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 823 KB
english, 1991
41

Bibliography on electrical conduction in thick film resistors

Andrzej Dziedzic
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 628 KB
english, 1991
42

4900948 Apparatus providing signals for burn-in of integrated circuits

Harold Hamilton
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 88 KB
english, 1991
43

4907931 Apparatus for handling semiconductor wafers

ChesterL Mallory, EdricH Tong, Wayne Borglum
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 88 KB
english, 1991
46

4910735 Semiconductor integrated circuit with self-testing

Koichi Yamashita
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 95 KB
english, 1991
47

4912052 Method of testing semiconductor elements

Motosuke Miyoshi, Katsuya Okumura
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 95 KB
english, 1991
48

4912399 Multiple lead probe for integrated circuits in wafer form

HansJ Greub, ValdisE Garuts
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 187 KB
english, 1991
49

4914814 Process of fabricating a circuit package

JohnR Behun, WilliamR Miller, BertH Newman, Edward Yankowski
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 93 KB
english, 1991
51

4918335 Interconnection system for integrated circuit chips

LouisE Chall
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 190 KB
english, 1991
52

4918377 Integrated circuit reliability testing

MartinG Buehler, HosharR Sayah
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 98 KB
english, 1991
53

4918379 Integrated monolithic circuit having a test bus

Abraham Jongepier
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 98 KB
english, 1991
55

4918691 Testing of integrated circuit modules

Louis Chall
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 93 KB
english, 1991
56

4920445 Junction-breakdown protection semiconductor device

DongSoo Jun
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 94 KB
english, 1991
57

4920785 Hermeticity testing method and system

Edward Etess
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 94 KB
english, 1991
59

4924589 Method of making and testing an integrated circuit

GlennJ Leedy
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 92 KB
english, 1991
60

4926117 Burn-in board having discrete test capability

LelandR Nevill
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 92 KB
english, 1991
63

4929889 Data path chip test architecture

LarryD Seiler, JamesL Pappas, RobertC Rose
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 84 KB
english, 1991
64

4930101 Microprocessor controlled meter package for a printer

YuenW Wong, Doina Mazilu, PaulO Amdahl
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 84 KB
english, 1991
65

4930439 Mask-repairing device

Mitsuyoshi Sato, Takashi Kaito, Yoshitom Nakagawa
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 84 KB
english, 1991
72

4937475 Laser programmable integrated circuit

F Matthew Rhodes, JackI Raffel
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 85 KB
english, 1991
74

4937659 Interconnection system for integrated circuit chips

Louis Chall
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 171 KB
english, 1991
77

4947105 Method and circuit for testing integrated circuit modules

Bernhard Unger, Rainer Rauschert
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 86 KB
english, 1991
79

4947545 Automated burn-in system

Robert Gussman
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 88 KB
english, 1991
80

4949157 Large scale integrated circuit

Eiichi Minami
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 88 KB
english, 1991
82

4950498 Process for repairing pattern film

Takashi Kaito
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 178 KB
english, 1991
83

4950980 Test socket for electronic device packages

WayneK Pfaff
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 89 KB
english, 1991
85

4951253 Semiconductor memory system

Hirosh Sahara, Haruki Toda, Shigeo Oshima
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 89 KB
english, 1991
86

4952057 Optical fiber backscatter signature generator (OFBSG)

Neil Kamikawa, Arthur Nakagawa, Grant Tanaka, Ken Yamada
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 137 KB
english, 1991