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Volume 31; Issue 2-3
Main
Microelectronics Reliability
Volume 31; Issue 2-3
Microelectronics Reliability
Volume 31; Issue 2-3
1
Stochastic analysis of a two-unit deteriorating standby system with two switching devices
L.R. Goel
,
S.C. Sharma
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 329 KB
Your tags:
english, 1991
2
CHE failure in a two-unit standby system with slow switch, repair and post repair
L.R. Goel
,
Rakesh Gupta
,
P.K. Tyagi
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 214 KB
Your tags:
english, 1991
3
Cost analysis of a one-unit repairable system subject to on-line preventive maintenance and/or repair
M.N. Gopalan
,
N.N. Murulidhar
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 413 KB
Your tags:
english, 1991
4
On the effect of power-line disturbances on microcomputer performance
Valentin Obac Roda
,
Onofre Trindade Jr
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 442 KB
Your tags:
english, 1991
5
Reliability assessment of computer systems design
M.R. Bastos Martini
,
J. Moreira de Souza
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 515 KB
Your tags:
english, 1991
6
A method for evaluation of number class intervals of histogram
D.M. Brkić
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 246 KB
Your tags:
english, 1991
7
Analysis of d.c. and a.c. anomalous latch-up effects in commercial CMOS integrated circuits
Enrico Zanoni
,
Paolo Pavan
,
Giorgio Spiazzi
,
Bruno Bonati
,
Claudio Canali
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 720 KB
Your tags:
english, 1991
8
A practical method of binomial reliability assessment
Hong-Zhou Wang
,
Bao-Hua Ma
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 138 KB
Your tags:
english, 1991
9
Three-server bulk service queue with service interruptions and exponential repairs
I.P. Singh
,
Chhotu Ram
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 186 KB
Your tags:
english, 1991
10
Pre-emptive repeat priority repairs and failure of non-failed component during system failure of a complex system
I.P. Singh
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 209 KB
Your tags:
english, 1991
11
Availability and frequency of failures of a system in the presence of chance common-cause shock failures
S. Madhusudana Verma
,
A.A. Chari
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 361 KB
Your tags:
english, 1991
12
Optimization of test parallelism with limited hardware overhead
Sheng Feng
,
Yashwant K. Malaiya
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 426 KB
Your tags:
english, 1991
13
Reliability analysis of a system with a human operator and subject to two failure modes
Ashok Kumar
,
S.C. Garg
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 364 KB
Your tags:
english, 1991
14
An algorithm to solve integer programming problems: An efficient tool for reliability design
Krishna B. Misra
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 798 KB
Your tags:
english, 1991
15
Applications of a search algorithm to reliability design problems
Krishna B. Misra
,
Usha Sharma
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 444 KB
Your tags:
english, 1991
16
An efficient approach for multiple criteria redundancy optimization problems
Krishna B. Misra
,
Usha Sharma
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 572 KB
Your tags:
english, 1991
17
Multicriteria optimization for combined reliability and redundancy allocation in systems employing mixed redundancies
Krishna B. Misra
,
Usha Sharma
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 460 KB
Your tags:
english, 1991
18
Application of an efficient search technique for optimal design of a computer communication network
Usha Sharma
,
Krishna B. Misra
,
A.K. Bhattacharji
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 313 KB
Your tags:
english, 1991
19
Repair body cost minimization with unreliable Markovian restoration
Oleg Martynenko
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 285 KB
Your tags:
english, 1991
20
Excess noise as an indicator of digital integrated circuit reliability
B.K. Jones
,
Y.Z. Xu
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 448 KB
Your tags:
english, 1991
21
Reliability analysis of a series system with repair
Who Kee Chung
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 85 KB
Your tags:
english, 1991
22
Reliability analysis of a human operator under several levels of stress
Who Kee Chung
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 137 KB
Your tags:
english, 1991
23
Reliability analysis of a series repairable system with multiple failures
Who Kee Chung
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 125 KB
Your tags:
english, 1991
24
TMR neural simulation
C.A. Goben
,
M. Suliman
,
M.A. Manzoul
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 206 KB
Your tags:
english, 1991
25
Optimal replacement of a system with imperfect repair
Viliam Makiš
,
Andrew K.S. Jardine
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 259 KB
Your tags:
english, 1991
26
Monte Carlo simulation for improving electromigration lifetime by balancing temperature and structural gradients
X. Gui
,
M.Z. Wang
,
G.B. Gao
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 422 KB
Your tags:
english, 1991
27
Reliability measures for fail safe computer-based systems
Zhibang Zhou
,
Chunxin Yuan
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 232 KB
Your tags:
english, 1991
28
A stuck fault model for dynamic CMOS combinational circuits
Asad A. Ismaeel
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 792 KB
Your tags:
english, 1991
29
Reliability analysis of a non-identical unit parallel system with common-cause failures
B.S. Dhillon
,
H.C. Viswanath
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 434 KB
Your tags:
english, 1991
30
Reliability model of cold standby systems with built-in-test
Jiajun Shao
,
Leonard R. Lamberson
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 368 KB
Your tags:
english, 1991
31
Analysis of a complex system composed of two sub-systems with their standbys
Rakesh Gupta
,
Sachendra Bansal
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 339 KB
Your tags:
english, 1991
32
The Sherif-Dear simple (SDS) Theorem in number theory
Yosef S. Sherif
,
Roger G. Dear
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 377 KB
Your tags:
english, 1991
33
Regression models for estimating survival of patients with non-Hodgkin's Lymphoma
Mustafa Alidrisi
,
Seraj Abed
,
Osman Ozkul
,
Sufian El-Assouli
,
Majed Amer
,
Ahmad Saber
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 288 KB
Your tags:
english, 1991
34
Design of reconfigurable fault-tolerant VLSI/WSI processor array structures
A. Noore
,
H. Nariman
,
M.A. Manzoul
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 344 KB
Your tags:
english, 1991
35
Local area network implementation of petri net reachability analysis
L. Anneberg
,
E. Yaprak
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 353 KB
Your tags:
english, 1991
36
Optimizing the thermalsonic bonding process for thick film hybrid IC by the Taguchi Method
Jeng Yann-Chyn
,
Huang Ming-Fon
,
Li Chang-Chung
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 497 KB
Your tags:
english, 1991
37
On multivariate generalized logistic distribution
Aisha Ragab
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 251 KB
Your tags:
english, 1991
38
Revised test that a distribution is new better than used
Jack R. Green
,
Aisha S. Ragab
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 140 KB
Your tags:
english, 1991
39
New definitions of basic R&M terms
Duncan Badenius
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 823 KB
Your tags:
english, 1991
40
Physicochemical investigations and nonstandard electrical measurements of inks and thick films—Bibliography
Andrzej Dziedzic
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 818 KB
Your tags:
english, 1991
41
Bibliography on electrical conduction in thick film resistors
Andrzej Dziedzic
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 628 KB
Your tags:
english, 1991
42
4900948 Apparatus providing signals for burn-in of integrated circuits
Harold Hamilton
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1991
43
4907931 Apparatus for handling semiconductor wafers
ChesterL Mallory
,
EdricH Tong
,
Wayne Borglum
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1991
44
4908226 Selective area nucleation and growth method for metal chemical vapor deposition using focused ion beams
Randall Kubena
,
ThomasM Mayer
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 184 KB
Your tags:
english, 1991
45
4908690 Semiconductor integrated circuit device with high reliability wiring layers
Masayuk Hata
,
Hiromasa Nakagawa
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1991
46
4910735 Semiconductor integrated circuit with self-testing
Koichi Yamashita
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1991
47
4912052 Method of testing semiconductor elements
Motosuke Miyoshi
,
Katsuya Okumura
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 95 KB
Your tags:
english, 1991
48
4912399 Multiple lead probe for integrated circuits in wafer form
HansJ Greub
,
ValdisE Garuts
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 187 KB
Your tags:
english, 1991
49
4914814 Process of fabricating a circuit package
JohnR Behun
,
WilliamR Miller
,
BertH Newman
,
Edward Yankowski
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 93 KB
Your tags:
english, 1991
50
4917466 Method for electrically connecting IC chips, a resinous bump-forming composition used therein and a liquid-crystal display unit electrically connected thereby
Akio Nakamura
,
Naoki Kodama
,
Osami Hayashi
,
Hirofumi Saita
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 93 KB
Your tags:
english, 1991
51
4918335 Interconnection system for integrated circuit chips
LouisE Chall
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 190 KB
Your tags:
english, 1991
52
4918377 Integrated circuit reliability testing
MartinG Buehler
,
HosharR Sayah
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1991
53
4918379 Integrated monolithic circuit having a test bus
Abraham Jongepier
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 98 KB
Your tags:
english, 1991
54
4918385 Method and process for testing the reliability of integrated circuit (IC) chipsand novel IC circuitry for accomplishing same
RobertW Shreeve
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 192 KB
Your tags:
english, 1991
55
4918691 Testing of integrated circuit modules
Louis Chall
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 93 KB
Your tags:
english, 1991
56
4920445 Junction-breakdown protection semiconductor device
DongSoo Jun
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 94 KB
Your tags:
english, 1991
57
4920785 Hermeticity testing method and system
Edward Etess
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 94 KB
Your tags:
english, 1991
58
4922134 Testable redundancy decoder of an integrated semiconductor memory
Kurt Hoffmann
,
Oskar Kowarik
,
Rainer Kraus
,
Bernhard Lustig
,
Hans-Dieter Oberle
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 186 KB
Your tags:
english, 1991
59
4924589 Method of making and testing an integrated circuit
GlennJ Leedy
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1991
60
4926117 Burn-in board having discrete test capability
LelandR Nevill
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1991
61
4927505 Metallization scheme providing adhesion and barrier properties
RavinderK Sharma
,
Harry Geyer
,
Douglas Mitchell
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 92 KB
Your tags:
english, 1991
62
4929081 System for detecting defects in a regularly arranged pattern such as an integrated circuit or the like
Yoko Yamamoto
,
Hitoshi Tanaka
,
Noboru Mikami
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 177 KB
Your tags:
english, 1991
63
4929889 Data path chip test architecture
LarryD Seiler
,
JamesL Pappas
,
RobertC Rose
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1991
64
4930101 Microprocessor controlled meter package for a printer
YuenW Wong
,
Doina Mazilu
,
PaulO Amdahl
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1991
65
4930439 Mask-repairing device
Mitsuyoshi Sato
,
Takashi Kaito
,
Yoshitom Nakagawa
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1991
66
4931726 Apparatus for testing semiconductor device
Susumu Kasukabe
,
Masasi Ookubo
,
Yutaka Akiba
,
Minoru Tanaka
,
Hitoshi Yokono
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1991
67
4932028 Error log system for self-testing in very large scale integrated circuit (VLSI) units
Haluk Katircioglu
,
JohnA De Beule
,
Debaditya Mukherjee
,
GaryC Whitlock
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 86 KB
Your tags:
english, 1991
68
4933042 Method for packaging integrated circuit chips employing a polymer film overlay layer
CharlesW Eichelberger
,
Robert Wojnarowski
,
Kenneth Wells
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 86 KB
Your tags:
english, 1991
69
4933860 Method for fabricating a radio frequency integrated circuit and product formed thereby
LouisC Liu
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 86 KB
Your tags:
english, 1991
70
4935378 Method for manufacturing a semiconductor device having more than two conductive layers
Seiichi Mori
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 86 KB
Your tags:
english, 1991
71
4937203 Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer
CharlesW Eichelberger
,
Robert Wojnarowski
,
Kenneth Wells
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 85 KB
Your tags:
english, 1991
72
4937475 Laser programmable integrated circuit
F Matthew Rhodes
,
JackI Raffel
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 85 KB
Your tags:
english, 1991
73
4937655 Film segment having integrated circuit chip bonded thereto and fixture therefor
Tatsuya Miyazaki
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 85 KB
Your tags:
english, 1991
74
4937659 Interconnection system for integrated circuit chips
Louis Chall
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 171 KB
Your tags:
english, 1991
75
4937826 Method and apparatus for sensing defects in integrated circuit elements
TusharR Gheewala
,
Robert Lipp
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 86 KB
Your tags:
english, 1991
76
4945302 Process and a circuit board for performing tests during burn-in of integrated semi-conductor circuits
ViggoK Janum
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 86 KB
Your tags:
english, 1991
77
4947105 Method and circuit for testing integrated circuit modules
Bernhard Unger
,
Rainer Rauschert
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 86 KB
Your tags:
english, 1991
78
4947375 Addressing of redundant columns and rows of an integrated circuit memory
JeanMarie Gaultier
,
Jean Devin
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 174 KB
Your tags:
english, 1991
79
4947545 Automated burn-in system
Robert Gussman
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1991
80
4949157 Large scale integrated circuit
Eiichi Minami
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1991
81
4949341 Built-in self test method for application specific integrated circuit libraries
David Lopez
,
Toma Colunga
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 88 KB
Your tags:
english, 1991
82
4950498 Process for repairing pattern film
Takashi Kaito
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 178 KB
Your tags:
english, 1991
83
4950980 Test socket for electronic device packages
WayneK Pfaff
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 89 KB
Your tags:
english, 1991
84
4951122 Resin-encapsulated semiconductor device
Kunihiro Tsubosaki
,
Gen Murakami
,
Toshiyuki Sakuta
,
Masamichi Ishihara
,
Satoru Ito
,
Yasuo Mori
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 89 KB
Your tags:
english, 1991
85
4951253 Semiconductor memory system
Hirosh Sahara
,
Haruki Toda
,
Shigeo Oshima
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 89 KB
Your tags:
english, 1991
86
4952057 Optical fiber backscatter signature generator (OFBSG)
Neil Kamikawa
,
Arthur Nakagawa
,
Grant Tanaka
,
Ken Yamada
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 137 KB
Your tags:
english, 1991
87
4952272 Method of manufacturing probing head for testing equipment of semiconductor large scale integrated circuits
Hironobu Okino
,
Akio Fujiwara
,
Yutaka Akiba
,
Susumu Kasukabe
,
Tsuyoshi Fujita
,
Masao Mitani
,
Kazuo Hirota
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 50 KB
Your tags:
english, 1991
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