4912399 Multiple lead probe for integrated circuits in...

Microelectronics Reliability 1991 Vol. 31; Iss. 2-3

4912399 Multiple lead probe for integrated circuits in wafer form

HansJ Greub, ValdisE Garuts
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Volume:
31
Year:
1991
Language:
english
Pages:
1
DOI:
10.1016/0026-2714(91)90248-6
File:
PDF, 187 KB
english, 1991
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