4949341 Built-in self test method for application specific...

Microelectronics Reliability 1991 Vol. 31; Iss. 2-3

4949341 Built-in self test method for application specific integrated circuit libraries

David Lopez, Toma Colunga
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Volume:
31
Year:
1991
Language:
english
Pages:
1
DOI:
10.1016/0026-2714(91)90281-b
File:
PDF, 88 KB
english, 1991
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