A new technique of cancelation of the MOSFET leakage...

Microelectronics Reliability 1994 Vol. 34; Iss. 6

A new technique of cancelation of the MOSFET leakage currents and parasitic capacitances

Adel E. El-Hennawy, Talal S. Al-Harbi
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Volume:
34
Year:
1994
Language:
english
Pages:
7
DOI:
10.1016/0026-2714(94)90068-x
File:
PDF, 240 KB
english, 1994
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