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Volume 34; Issue 6
Main
Microelectronics Reliability
Volume 34; Issue 6
Microelectronics Reliability
Volume 34; Issue 6
1
The distributed voting strategy for fault diagnosis and reconfiguration of linear processor arrays
Valentin Obac Roda
,
Ting Ting Y. Lin
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 708 KB
Your tags:
english, 1994
2
Bounding algorithms for two-terminal network reliability
G. Thangamani
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 418 KB
Your tags:
english, 1994
3
A new method for reliability evaluation of composite power systems
Susanta Patra
,
R.B. Misra
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 529 KB
Your tags:
english, 1994
4
Terminal-pair reliability of network system using flow augmenting path search algorithm
Moon Soo Choi
,
Chi-Hyuck Jun
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 543 KB
Your tags:
english, 1994
5
Optimization of data compression methods
P. Kacprzak
,
J. Bremont
,
M. Lamotte
,
P. Charpentier
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 354 KB
Your tags:
english, 1994
6
Reliability and availability analysis of warm standby systems with repair and multiple critical errors
Who Kee Chung
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 198 KB
Your tags:
english, 1994
7
EM algorithms for estimating software reliability based on masked data
M. Zhao
,
M. Xie
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 487 KB
Your tags:
english, 1994
8
A new technique of cancelation of the MOSFET leakage currents and parasitic capacitances
Adel E. El-Hennawy
,
Talal S. Al-Harbi
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 240 KB
Your tags:
english, 1994
9
Simulation and analysis of electromigration failure distributions
T. Smy
,
S.S. Winterton
,
S.K. Dew
,
M.J. Brett
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 526 KB
Your tags:
english, 1994
10
Availability of a series system with warm spares
Lirong Cui
,
Alan G. Hawkes
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 454 KB
Your tags:
english, 1994
11
Single sampling plans for attributes satisfying an arbitrary set of constraints—A graphical approach
Vassilis S. Kouikoglou
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 247 KB
Your tags:
english, 1994
12
Delay related reliability: A new performance index for computer communication network dynamics
K.K. Aggarwal
,
Shakti Kumar
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 356 KB
Your tags:
english, 1994
13
Preventative maintenance strategy for equipment under warranty
J.S. Dagpunar
,
N. Jack
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 175 KB
Your tags:
english, 1994
14
The up and down distributions of a Wheatstone bridge
Sun-Wah Kiu
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 401 KB
Your tags:
english, 1994
15
Reliability processes and corporate structures
Timothy M. Young
,
Frank M. Guess
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 569 KB
Your tags:
english, 1994
16
Bayesian prediction for the range with a burr distribution and a random sample size
S.K. Ashour
,
M.A.M.H. El-Wakeel
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 249 KB
Your tags:
english, 1994
17
The study of a maintenance float model with gamma failure and two repair centres
Gauri Shankar
,
Vandana Sahani
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 336 KB
Your tags:
english, 1994
18
Profit analysis of a two-unit man-machine system with random appearance and disappearance of the operator
Rakesh Gupta
,
Alka Chaudhary
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 252 KB
Your tags:
english, 1994
19
Optimal redundancy of K-out-of-n:G system with two kinds of CCFs
A.A. Chari
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 171 KB
Your tags:
english, 1994
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