Two unit redundant system with adjustable failure rate,...

Microelectronics Reliability 1994 Vol. 34; Iss. 8

Two unit redundant system with adjustable failure rate, critical human error (CHE) and inspection

R.K. Agnihotri, Shubhag Chand, V.B. Mudgal
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Volume:
34
Year:
1994
Language:
english
Pages:
6
DOI:
10.1016/0026-2714(94)90148-1
File:
PDF, 302 KB
english, 1994
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