Stress induced leakage current generated by hot-hole...

Microelectronic Engineering 2013 / 09 Vol. 109

Stress induced leakage current generated by hot-hole injection

Teramoto, Akinobu, Park, Hyeonwoo, Inatsuka, Takuya, Kuroda, Rihito, Sugawa, Shigetoshi, Ohmi, Tadahiro
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Volume:
109
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2013.03.116
Date:
September, 2013
File:
PDF, 612 KB
english, 2013
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