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Electrical measurements as early indicators of electromigration failure
B.K. Jones, Y.Z. Xu, T.C. Denton, P. ZobbiVolume:
35
Year:
1995
Language:
english
Pages:
13
DOI:
10.1016/0026-2714(94)p1834-y
File:
PDF, 478 KB
english, 1995