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Volume 35; Issue 1
Main
Microelectronics Reliability
Volume 35; Issue 1
Microelectronics Reliability
Volume 35; Issue 1
1
Analysis of reliability bounds for two-unit parallel and standby reparable systems
Rakesh Gupta
,
Alka Chaudhary
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 128 KB
Your tags:
english, 1995
2
MINQUE and PSD-MINQMBE in the two way cross classification random effect model without interaction
Shaban Abdel-Magid
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 106 KB
Your tags:
english, 1995
3
Non-parametric distribution of the reliability function for some basic system configurations
K.K. Sharma
,
Hare Krishna
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 133 KB
Your tags:
english, 1995
4
A new increasing failure rate model for life time data
S.A. Siddiqui
,
Deoki Nandan
,
Sanjay Gupta
,
Manish Subharwal
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 139 KB
Your tags:
english, 1995
5
Cost analysis, availability and MTTF of a three state standby complex system under common cause and human failures
D. Pandey
,
Mendus Jacob
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 204 KB
Your tags:
english, 1995
6
An integro-differential equation related to Gaver's parallel system
E.J. Vanderperre
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 155 KB
Your tags:
english, 1995
7
Stochastic analysis of systems with primary and secondary failures
Surendra M. Gupta
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 326 KB
Your tags:
english, 1995
8
A new mathematical approach to multi-area power system reliability evaluation
Rajesh Pathak
,
Chanan Singh
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 455 KB
Your tags:
english, 1995
9
Efficient estimation of the mean of an exponential distribution when two outliers are present
T.Leo Alexander
,
N. Balakrishnan
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 276 KB
Your tags:
english, 1995
10
Inferences on availability ratio
Hare Krishna
,
K.K. Sharma
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 207 KB
Your tags:
english, 1995
11
Posbist reliability behavior of fault-tolerant systems
Cai Kai-Yuan
,
Wen Chuan-Yuan
,
Zhang Ming-Lian
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 354 KB
Your tags:
english, 1995
12
Bayesian approach to prediction with outliers from the Burr type X model
Zeinhum F. Jaheen
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 157 KB
Your tags:
english, 1995
13
Reliability considerations of a selective-repeat ARQ policy for a data communication system
Kazumi Yasui
,
Toshio Nakagawa
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 186 KB
Your tags:
english, 1995
14
Bayes estimates of pointwise and interval availability with type I censored samples
H. Krishna
,
K.K. Sharma
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 172 KB
Your tags:
english, 1995
15
The optimal replacement of a Markovian deteriorative system under stochastic shocks
Qiying Hu
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 309 KB
Your tags:
english, 1995
16
A new method to compute reliability of repairable series systems by arbitrary distributions
Sergey V. Gurov
,
Lev V. Utkin
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 261 KB
Your tags:
english, 1995
17
Some variants of polygon-to-chain reductions in evaluating reliability of undirected network
Moon Soo Choi
,
Chi-Hyuck Jun
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 339 KB
Your tags:
english, 1995
18
Electrical measurements as early indicators of electromigration failure
B.K. Jones
,
Y.Z. Xu
,
T.C. Denton
,
P. Zobbi
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 478 KB
Your tags:
english, 1995
19
On the design of a reliability circuit simulator
Jan Verweij
,
Meindert Lunenborg
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 166 KB
Your tags:
english, 1995
20
Explicit transient and steady state queue length probabilities of a queueing model with server on vacation providing service intermittently
Sharda
,
Indra
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 389 KB
Your tags:
english, 1995
21
Further extensions to the Sherif-Dear simple theorem in number theory and some remarks
Fatin Sezgin
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 265 KB
Your tags:
english, 1995
22
Editorial Board
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 57 KB
Your tags:
english, 1995
23
Report by the editor-in-chief
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 353 KB
Your tags:
english, 1995
24
Publications, notices, call for papers, etc.
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 334 KB
Your tags:
english, 1995
25
Calendar of international conferences, symposia, lectures and meetings of interest
Journal:
Microelectronics Reliability
Year:
1995
Language:
english
File:
PDF, 150 KB
Your tags:
english, 1995
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