Tunnel FET technology: A reliability perspective
Datta, Suman, Liu, Huichu, Narayanan, VijaykrishnanVolume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.02.002
Date:
May, 2014
File:
PDF, 6.05 MB
english, 2014