The use of Burr type XII distribution on software...

Microelectronics Reliability 1997 Vol. 37; Iss. 2

The use of Burr type XII distribution on software reliability growth modelling

A.A. Abdel-Ghaly, G.R. Al-Dayian, F.H. Al-Kashkari
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Volume:
37
Year:
1997
Language:
english
Pages:
9
DOI:
10.1016/0026-2714(95)00124-7
File:
PDF, 583 KB
english, 1997
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