Volume 37; Issue 2

Microelectronics Reliability

Volume 37; Issue 2

1

The single-server machine interference model with balking, reneging and an additional server for longer queues

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 181 KB

english, 1997

2

Asymptotic expansion in the limit theorem for the convergence to laplace distribution

M.M. El Fahham, H.S. El Said

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 322 KB

english, 1997

3

The use of Burr type XII distribution on software reliability growth modelling

A.A. Abdel-Ghaly, G.R. Al-Dayian, F.H. Al-Kashkari

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 583 KB

english, 1997

4

MY-STAR: A methodology and system for tracing and analyzing requirements

Tuyet-Lan Tran, Joseph S. Sherif, Carmen Mikulski, Monica Wang

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 580 KB

english, 1997

5

On classifications of multivariate life distributions in the discrete setup

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 424 KB

english, 1997

6

Reliability and cost: Questions for the engineer

Ronald C. Suich

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 629 KB

english, 1997

7

Analysis of a two-dissimilar unit cold standby redundant system subject to inspection and random change in units

G.S. Mokaddis, M.L. Tawfek, S.A.M. Elhssia

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 343 KB

english, 1997

8

Cost analysis of a two dissimilar-unit cold standby redundant system subject to inspection and two types of repair

G.S. Mokaddis, M.L. Tawfek, S.A.M. Elhssia

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 415 KB

english, 1997

9

Robotic systems probabilistic analysis

B.S. Dhillon, A.R.M. Fashandi

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 614 KB

english, 1997

10

A parallel algorithm evaluating the reliability of a system with known minimal cuts (paths)

Jacek Malinowski, Wolfgang Preuss

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 468 KB

english, 1997

11

Safety analysis of a multi-phased control system

S.V. Gurov, S.P. Habarov, L.V. Utkin

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 597 KB

english, 1997

12

A new partial bound enumeration technique for solving reliability redundancy optimization

Li Jianping, Jia Xishen

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 478 KB

english, 1997

13

Marked graphs and Euler graphs

K. Thirusangu, K. Rangarajan

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 540 KB

english, 1997

14

Erratum

Journal:

Microelectronics Reliability

Year:

1997

File:

PDF, 26 KB

1997

15

Software quality assurance and measurement A worldwide perspective: Edited by: Norman Fenton, Robin Whitty and Yoshinori Iizura Publisher: International Thomson Computer Press Berkshire House High Holborn London WC1V 7AA, UK XIX + 320 pages, includes references and index 1995 Price: 35 £ ISBN 1-85032-174-4

Florin Popentiu

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 126 KB

english, 1997

16

Electromigration & electronic device degradation: Editor: Aris Christou. Publisher: John Wiley & Sons Ltd, Baffins Lane, Chichester, West Sussex PO19 1UD, England. Price: 85 GBP (ISBN: 0-471-58489-4). Published in 1994

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 70 KB

english, 1997

17

Call for papers

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 402 KB

english, 1997

18

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 77 KB

english, 1997

19

Estimation of the reliability function using the delay-time models

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 366 KB

english, 1997

20

A single-server M/G/1 queueing system subject to breakdowns—some reliability and queueing problems

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 453 KB

english, 1997

21

Preservation results for ordered random variables, with applications to reliability theory

A.N. Ahmed, A.A. Soliman, S.E. Khider

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 441 KB

english, 1997

22

Limit distributions for dependent thinning of dissipative point processes

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 504 KB

english, 1997

23

Survey of reliability and availability evaluation of complex networks using Monte Carlo techniques

Hongzhou Wang, Hoang Pham

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 1.80 MB

english, 1997

24

A note on the preservation of the NBUC class under formation of parallel systems with dissimilar components

Jun Cai, Yanhong Wu

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 170 KB

english, 1997

25

Reliability evaluation of a repairable network with limited capacity and structural redundancy

Alexander A. Hagin

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 627 KB

english, 1997

26

Physical architecture of VLSI systems: EDITORS: Robert J. Hannemann Allan D. Kraus Michael Pecht PUBLISHERS: JOHN WILEY & SONS, INC. 605 Third Avenue, New York NY 10158-0012 U.S.A. ISBN: 0-471-53299-1 Published in 1994

Zoran Stamenković

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 74 KB

english, 1997