Test sequencing and diagnosis in electronic system with...

Microelectronics Reliability 1996 Vol. 36; Iss. 9

Test sequencing and diagnosis in electronic system with decision table

Huiyang Zhou, Liangsheng Qu, Aihua Li
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Volume:
36
Year:
1996
Language:
english
Pages:
9
DOI:
10.1016/0026-2714(95)00142-5
File:
PDF, 483 KB
english, 1996
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