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Volume 36; Issue 9
Main
Microelectronics Reliability
Volume 36; Issue 9
Microelectronics Reliability
Volume 36; Issue 9
1
Non-destructive identification of defects in integrated circuit packages by scanning acoustic microscopy
Jicheng Yang
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 413 KB
Your tags:
english, 1996
2
The power function distribution: A useful and simple distribution to assess electrical component reliability
M. Meniconi
,
D.M. Barry
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 241 KB
Your tags:
english, 1996
3
Statistical simulation of IC technology: A bipolar process example
T.J. Sanders
,
K. Rekab
,
S.H. Chung
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 556 KB
Your tags:
english, 1996
4
High temperature device simulation and thermal characteristics of GaAs MESFETs on CVD diamond substrates
L.H. Shu
,
A. Christou
,
D.F. Barbe
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 681 KB
Your tags:
english, 1996
5
Reliability analysis of a complex system with a deteriorating standby unit under common-cause failure and critical human error
S. Narmada
,
M. Jacob
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 210 KB
Your tags:
english, 1996
6
Load balancing in heterogenous distributed systems
T.V. Gopal
,
N.S.Karthic Nataraj
,
C. Ramamurthy
,
V. Sankaranarayanan
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 528 KB
Your tags:
english, 1996
7
Test sequencing and diagnosis in electronic system with decision table
Huiyang Zhou
,
Liangsheng Qu
,
Aihua Li
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 483 KB
Your tags:
english, 1996
8
GERT analysis of a two-unit warm standby system with repair
Gauri Shankar
,
Vandana Sahani
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 239 KB
Your tags:
english, 1996
9
CSCC for mean of an inverse Gaussian distribution under type I censoring
Gauri Shankar
,
S. Joseph
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 200 KB
Your tags:
english, 1996
10
Fixed-width confidence interval estimation of the inverse coefficient of variation in a normal population
Ajit Chaturvedi
,
Uma Rani
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 221 KB
Your tags:
english, 1996
11
Time-series models for reliability evaluation of power systems including wind energy
R. Billinton
,
Hua Chen
,
R. Ghajar
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 553 KB
Your tags:
english, 1996
12
Properties of a consistent estimation procedure in ultrastructural model when reliability ratio is known
Anil K. Srivastava
,
Shalabh
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 287 KB
Your tags:
english, 1996
13
System reliability estimation using simulation combined with network reductions
Jae-Joon Suh
,
Chi-Moon Han
,
Chi-Hyuck Jun
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 362 KB
Your tags:
english, 1996
14
A reliability analysis technique for object-oriented model using a reliability petri net
Kapsu Kim
,
Chisu Wu
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 758 KB
Your tags:
english, 1996
15
Confidence limits for steady-state availability of systems with a mixture of exponential and gamma operating time and lognormal repair time
P. Chandrasekhar
,
R. Natarajan
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 129 KB
Your tags:
english, 1996
16
Some reliability measures of a system of components sharing a common environment
G.C. Sharma
,
Mamta Agrawal
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 288 KB
Your tags:
english, 1996
17
Hardware fault latency: Model validation
B.C. Soh
,
T.S. Dillon
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 354 KB
Your tags:
english, 1996
18
Hardware fault latency: Problem formulation and solution
B.C. Soh
,
T.S. Dillon
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 689 KB
Your tags:
english, 1996
19
Reliability growth in the probability and possibility contexts
L.V. Utkin
,
S.V. Gurov
,
M.I. Shubinsky
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 449 KB
Your tags:
english, 1996
20
Computerization of the R-ABC algorithm
Yuanlong Shen
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 148 KB
Your tags:
english, 1996
21
Procedure of creating a reliability-functional model for a chosen computer system
I.J. Jóźwiak
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 359 KB
Your tags:
english, 1996
22
Estimation of capability index based on bootstrap method
Kuey Chung Choi
,
Kyung Hyun Nam
,
Dong Ho Park
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 513 KB
Your tags:
english, 1996
23
Remarks on maximum likelihood estimation for the Burr XII distribution
A.J. Watkins
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 52 KB
Your tags:
english, 1996
24
Smart power ICs technologies and applications: Authors: B. Murari, F. Bertotti and G. A. Vignola (editors) Publishers: Springer-Verlag GmbH & Co.KG Tiergartenstrasse 17, D-69121 Heidelberg, Germany. Price: Hardcover DM 198.00. (ISBN 3-540-60332-8) Published 1996
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1996
25
Choosing from redundant designs of power systems using system outage rate and cost
C.R. Vallarino
,
K.J. Elsey
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 336 KB
Your tags:
english, 1996
26
VLSI chip design with the hardware description language verilog An introduction based on a large RISC processor design: Author: U. Golze Publishers: Springer-Verlag GmbH & Co.KG Tiergartenstrasse 17, D-69121 Heidelberg, Germany. Price: Hardcover DM 68.00. (ISBN 3-540-60032-9) Published 1996
G.W.A.D.
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 77 KB
Your tags:
english, 1996
27
Announcement Call for papers
Journal:
Microelectronics Reliability
Year:
1996
Language:
english
File:
PDF, 171 KB
Your tags:
english, 1996
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