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Impact of Donor Traps on the 2DEG and Electrical Behavior of AlGaN/GaN MISFETs
Longobardi, Giorgia, Udrea, Florin, Sque, Stephen, Hurkx, Godefridus A. M., Croon, Jeroen, Napoli, Ettore, Sonsky, JanVolume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2013.2290471
Date:
January, 2014
File:
PDF, 430 KB
english, 2014