LDO regulator DC characteristic and susceptibility...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing

Wu, J., Boyer, A., Li, J., Bendhia, S., Vrignon, B.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.124
Date:
September, 2013
File:
PDF, 1.15 MB
english, 2013
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