Depth profiling of helium concentrations in materials using...

Depth profiling of helium concentrations in materials using the 4He(7Li, γ)11B reaction

R.L. Schulte
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Volume:
149
Year:
1978
Language:
english
Pages:
4
DOI:
10.1016/0029-554x(78)90839-x
File:
PDF, 316 KB
english, 1978
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