Volume 149; Issue 1-3

Nuclear Instruments and Methods

Volume 149; Issue 1-3

1

Editorial Board

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 117 KB

english, 1978

2

Editorial

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 94 KB

english, 1978

3

15N hydrogen profiling: Scientific applications

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 649 KB

english, 1978

4

The application of nuclear reactions for quantitative hydrogen analysis in a variety of different materials problems

G.J. Clark, C.W. White, D.D. Allred, B.R. Appleton, F.B. Koch, C.W. Magee

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 786 KB

english, 1978

5

Profiling hydrogen in materials using ion beams

J.F. Ziegler, C.P. Wu, P. Williams, C.W. White, B. Terreault, B.M.U. Scherzer, R.L. Schulte, E.J. Schneid, C.W. Magee, E. Ligeon, J.L. 'Ecuyer, W.A. Lanford, F.J. Kuehne, E.A. Kamykowski, W.O. Hofer,

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 1.53 MB

english, 1978

6

The H(t, n)3He reaction for depth profiling of hydrogen by neutron time-of-flight

J.C. Davis, H.W. Lefevre, C.H. Poppe, D.M. Drake, L.R. Veeser

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 371 KB

english, 1978

7

Using the proton backscattering method of light element profiling to achieve tailored low Z impurity distributions in solids

Robert S. Blewer

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 425 KB

english, 1978

8

The replacement of 3He implanted in Nb by subsequent 4He bombardment and vice versa

J. Roth, B.M.U. Scherzer, R. Behrisch, P. Børgesen

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 530 KB

english, 1978

9

Depth profiling of deuterium implanted into stainless steel at room temperature

C.J. Altstetter, R. Behrisch, J. Bøttiger, F. Pohl, B.M.U. Scherzer

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 361 KB

english, 1978

10

Depth profiling of helium concentrations in materials using the 4He(7Li, γ)11B reaction

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 316 KB

english, 1978

11

Charged particle analysis of light elements by total energy coincident measurement of complementary particles

R. Pretorius, M. Peisach

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 233 KB

english, 1978

12

Diffusion studies by means of nuclear reaction depth profiling

W. Möller, M. Hufschmidt, Th. Pfeiffer

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 288 KB

english, 1978

13

Low energy p-Be nuclear reactions for depth-profiling Be in alloys

P.P. Pronko, P.R. Okamoto, H. Wiedersich

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 417 KB

english, 1978

14

Recent developments in nuclear microprobe analysis, particularly the determination of beryllium distributions in metals

J.W. McMillan, P.M. Hirst, F.C.W. Pummery, J. Huddleston, T.B. Pierce

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 874 KB

english, 1978

15

The use of neutron induced reactions for light element profiling and lattice localization

J.P. Biersack, D. Fink, R. Henkelmann, K. Müller

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 360 KB

english, 1978

16

The use of hydrogen and deuterium implantation to investigate some aspects of defect-impurity interactions in metals

E. Ligeon, J.P. Bugeat, A.C. Chami

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 359 KB

english, 1978

17

Chemical influences on the stopping power

Wolfgang Neuwirth, Werner Pietsch, Ronald Kreutz

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 734 KB

english, 1978

18

Energy loss of He ions in solidified gases

W.K. Chu, M. Braun, J.A. Davies, N. Matsunami, D.A. Thompson

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 447 KB

english, 1978

19

Stopping power and straggling of 65–500 keV lithium ions in H2, He, CO2, N2, O2, Ne, Ar, Kr and Xe

H.H. Andersen, F. Besenbacher, H. Knudsen

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 590 KB

english, 1978

20

The calculation of low energy He ion stopping powers

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 492 KB

english, 1978

21

An improved method for measuring relative stopping powers of light ions in solids

H.H. Andersen, H. Knudsen, V. Martini

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 540 KB

english, 1978

22

Theoretical interpretations of the energy dependence of electronic stopping power

J.G. Brennan, D.J. Land, M.D. Brown, D.G. Simons

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 484 KB

english, 1978

23

Energy loss of light 300 keV ions in thin metal foils

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 383 KB

english, 1978

24

A new method for the determination of low-energy stopping powers of hydrogen and helium

Allen Lurio, J.F. Ziegler, J.J. Cuomo

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 236 KB

english, 1978

25

Stopping cross sections for protons of 350–650 keV in Au, by a new method

D. Semrad, P. Bauer

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 227 KB

english, 1978

26

Precision stopping cross section measurement of gold for 4He

S. Matteson, J.M. Harris, R. Pretorius, M-A. Nicolet

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 469 KB

english, 1978

27

Lithium ion production and use for backscattering analysis in aluminum and aluminum oxide media

J.P. Thomas, M. Fallavier

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 469 KB

english, 1978

28

The energy straggling of protons in thin metal foils at 0.35, 1.0 and 1.75 MeV

W. Möller, U. Nocken

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 350 KB

english, 1978

29

Effective beam energy spreads with molecular ion beams

J.W. Butler, C.M. Davisson

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 588 KB

english, 1978

30

Analysis of straggling measurements by the backscattering technique

D.K. Brice, R.A. Langley

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 273 KB

english, 1978

31

Energy straggling of protons in carbon

Robert A. Langley, David K. Brice

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 261 KB

english, 1978

32

Study of energy loss ΔE(θ) as function of emergence angle for neon and argon ions on carbon foils

Gilles Beauchemin, Robert Drouin

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 411 KB

english, 1978

33

The application of high-resolution Rutherford backscattering techniques to near-surface analysis

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 987 KB

english, 1978

34

The determination of high-dose implantation profiles using low-angle Rutherford backscattering

C.E. Christodoulides, W.A. Grant, J.S. Williams

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 460 KB

english, 1978

35

The rotating sample technique for measurement of random backscattering yields from crystals and its application to β-alumina

P. Blood, L.C. Feldman, G.L. Miller, J.P. Remeika

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 308 KB

english, 1978

36

Tilting angle dependence of Rutherford backscattering: Uniformity of near surface layers

S.U. Campisano, G. Ciavola, E. Costanzo, G. Foti, E. Rimini

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 598 KB

english, 1978

37

Improved depth resolution of channeling measurements in Rutherford backscattering by a detector tilt

G. Mezey, E. Kotai, T. Lohner, T. Nagy, J. Gyulai, A. Manuaba

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 216 KB

english, 1978

38

Applications of the scattering spectrometry with fast protons (5–8 MeV) and heavy ions (15–25 MeV) to special analysis problems

P. Müller, W. Szymczak, G. Ischenko

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 398 KB

english, 1978

39

Polycrystalline film target texture and nuclear backscattering analysis

H.H. Andersen, K.N. Tu, J.F. Ziegler

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 381 KB

english, 1978

40

The use of nitrogen ion backscattering for the analysis of metal impurities in a Tokamak plasma

G. Dearnaley, G.M. McCracken, J.F. Turner, J. Vince

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 361 KB

english, 1978

41

Comparison of xenon retention in ion implanted silicon dioxide and oxygen-doped silicon

W. Wach, K. Wittmaack

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 508 KB

english, 1978

42

Kinetics of drift and thermal diffusion of gold electrodes into amorphous semiconductor thin films

J.P. Thomas, J.M. Mackowski, J. Tousset

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 391 KB

english, 1978

43

The use of 6Li and 35Cl ion beams in surface analysis

J. L'ecuyer, C. Brassard, C. Cardinal, B. Terreault

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 477 KB

english, 1978

44

The use of 12C(d, p)13C and 16O(d, p)17O reactions to profile carbon and oxygen in solids

J.A. Borders, J.M. Harris

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 441 KB

english, 1978

45

Oxygen distribution profiles in thin evaporated contacts on single crystal silicon

Sture Petersson, Herman Norde, G. Possnert, B. Orre

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 256 KB

english, 1978

46

Low-concentration oxygen depth profiling by the 16O(d, α)14N reaction

Samuel T. Picraux

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 435 KB

english, 1978

47

Nuclear reaction analysis of 16O concentration profiles with a high-resolution magnetic spectrometer

J.K. Hirvonen, W.H. Lucke

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 349 KB

english, 1978

48

Measurement of oxygen and nitrogen profiles in steel

Andrus Niiler, Robert Birkmire

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 339 KB

english, 1978

49

Beryllium analysis of simulated aerosol samples by proton scattering

G.M. Hudson, H.C. Kaufmann, J.W. Nelson, W.J. Courtney

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 1.21 MB

english, 1978

50

Determination of fluorine in food samples by the 19F(p, p′γ)19F reaction

R.E. Shroy, H.W. Kraner, K.W. Jones, J.S. Jacobson, L.I. Heller

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 331 KB

english, 1978

51

27Al(p, α0)24Mg resonance profiling of aluminum in silicon-on-sapphire materials

Kenneth L. Dunning

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 296 KB

english, 1978

52

Ion beam analyses in relation to the physical properties of diamond

J.P.F. Sellschop, H.J. Annegarn, R.J. Keddy, C.C.P. Madiba, M.J. Renan

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 619 KB

english, 1978

53

The measurement of pore size in porous and microporous materials using resonant ion beam backscattering

B.H. Armitage, J.D.F. Ramsay, F.P. Brady

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 507 KB

english, 1978

54

Analysis using ion induced gamma rays

J.R. Bird, M.D. Scott, L.H. Russell, M.J. Kenny

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 37 KB

english, 1978

55

The use of the 14N(d, p0)15N reaction for studies of nitrogen depth distribution in grains of barley and in samples of chromium steel

László Gönczi, Hans Berggren, Rolf Didriksson, Bo Sundqvist, Ulf Lindh

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 307 KB

english, 1978

56

Studies of defects and surfaces by channeling

John H. Barrett

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 756 KB

english, 1978

57

Surface studies of W(100) by MeV He scattering

R.A. Zuhr, L.C. Feldman, R.L. Kauffman, P.J. Silverman

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 421 KB

english, 1978

58

Surface layer analysis by MEIS using a solid state detector

D. Hoonhout, C.B.W. Kerkdijk, R.S. Bhattacharya, H.H. Kersten, W.C. Turkenburg, F.W. Saris

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 527 KB

english, 1978

59

Dechanneling theory for axial and planar conditions

Y.H. Ohtsuki, T. Ōmura, H. Tanaka, M. Kitagawa

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 204 KB

english, 1978

60

Channeling analysis of radiation disorder in ion implanted vanadium and molybdenum single crystals

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 394 KB

english, 1978

61

Channeling analysis of stacking defects in epitaxial Si layers

S.U. Campisano, G. Foti, E. Rimini, S.T. Picraux

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 726 KB

english, 1978

62

Channeling effect studies in V3 Si single crystals

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 295 KB

english, 1978

63

The effect of twins on dechanneling a charged particle beam

G. Foti, L. Csepregi, E.F. Kennedy, J.W. Mayer, P.P. Pronko, M.D. Rechtin

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 394 KB

english, 1978

64

Channeling dips for Si K and L X-ray yield

Allen Lurio, Johann Keller, Wei-Kan Chu

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 316 KB

english, 1978

65

Recent lattice location results for implanted impurities in beryllium metal

R. Vianden, E.N. Kaufmann

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 359 KB

english, 1978

66

Displacement of group III, IV, V, and VI impurities in Si by the analyzing beam

L.W. Wiggers, F.W. Saris

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 496 KB

english, 1978

67

Channeling studies on the trapping of deuterium in vanadium by oxygen interstitials

K. Ozawa, S. Yamaguchi, Y. Fujino, O. Yoshinari, M. Koiwa, M. Hirabayashi

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 392 KB

english, 1978

68

Application of particle channeling to the study of a cooperative Jahn-teller phase transition in nickel chromite

D. Kollewe, W.M. Gibson

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 407 KB

english, 1978

69

A structure modeling of metal-silicide layers by using axial and planar channeling techniques

Hiroshi Ishiwara, Masao Nagatomo, Seijiro Furukawa

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 369 KB

english, 1978

70

Channeling analysis of disorder structure in neon implanted silicon

A. Turos, L. Wieluński, M. Wieluński, B. Wojtowicz-Natanson

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 285 KB

english, 1978

71

On the determination of the nature of defect clusters in irradiated metals by Rutherford backscattering

M.K. Agrawal, D.K. Sood

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 213 KB

english, 1978

72

Statistical equilibrium spatial density in planar channeling

J.A. Ellison, S.T. Picraux

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 30 KB

english, 1978

73

Energy and temperature dependences of dechanneling by displaced atoms

Noriaki Matsunami, Taizan Goto, Noriaki Itoh

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 45 KB

english, 1978

74

Sensitivity, quality assurance, and cost in automated analysis via ion induced X-rays

Thomas A. Cahill

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 244 KB

english, 1978

75

Thick sample analysis by ion induced X-rays

P. Baeri, S.U. Campisano, G. Immé, E. Rimini, G. Della Mea

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 453 KB

english, 1978

76

Using proton-induced X-rays to determine three parameters of the depth profile of foreign atoms in bulk material

O. Benka, M. Geretschläger, A. Kropf

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 268 KB

english, 1978

77

Effect of fluorescence on the determination of depth distributions by ion induced X-rays

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 322 KB

english, 1978

78

The chemical state of particulate sulfur in ambient aerosols determined by pixe analysis

M.S. Ahlberg, A.C.D. Leslie, J.W. Winchester

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 346 KB

english, 1978

79

Use of ion-induced X-rays to locate ion-implanted impurities in gallium arsenide

M. Takai, K. Gamo, H. Yagita, K. Masuda, S. Namba, A. Mizobuchi

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 254 KB

english, 1978

80

Study of the X-ray emission induced by 4 to 30 MeV protons or alpha particles, with a view to analytical application

M. Poncet, C. Engelmann

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 377 KB

english, 1978

81

Sensitivity of the external beam pixe elemental analysis method

A. Katsanos, A. Hadjiantoniou

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 276 KB

english, 1978

82

Advantages of heavy ions for high-resolution microscopy

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 560 KB

english, 1978

83

Surface analysis by argon ion induced X-ray fluorescence

Ch. Heitz, M. Kwadow, D. Tenorio

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 275 KB

english, 1978

84

Comparison of the elemental composition of normal and diseased human tissues by PIXE analysis

J.A. Guffey, H.A. Van Rinsvelt, R.M. Sarper, Z. Karcioglu, W.R. Adams, R.W. Fink

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 339 KB

english, 1978

85

Detection sensitivities in proton and electron induced X-ray spectroscopy

Wilhad Reuter, Allen Lurio

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 25 KB

english, 1978

86

Ion induced optical emission for surface and depth profile analysis

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 865 KB

english, 1978

87

Ion-excited UV lines useful for materials analysis

A.R. Knudson, D.J. Nagel, J. Comas, K.W. Hill

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 231 KB

english, 1978

88

Backscattering of excited hydrogen from Mo in the presence of oxygen

E.O. Rausch, E.W. Thomas

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 422 KB

english, 1978

89

Orientation of fast ions excited in surface collisions

H.G. Berry, G. Gabrielse, A.E. Livingston

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 404 KB

english, 1978

90

The use of sputter-induced emission spectroscopy for the analysis of hydrogen in solids

I.S.T. Tsong, R.B. Liebert

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 339 KB

english, 1978

91

Hydrogen ion implantation profiles as determined by SIMS

Charles W. Magee, Chung P. Wu

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 358 KB

english, 1978

92

A simple axially-symmetric quadrupole SIMS spectrometer

W.O. Hofer, F. Thum

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 558 KB

english, 1978

93

Quantitative analysis of oxygen in thin epitaxial layers of GaAs by SIMS

A.M. Huber, G. Morillot, N.T. Linh, J.L. Debrun, M. Valladon

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 235 KB

english, 1978

94

Energy analyzed secondary ion mass spectroscopy and simultaneous Auger and XPS measurements of ion bombarded surfaces

A.R. Krauss, D.M. Gruen

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 569 KB

english, 1978

95

An attempt to understand preferential sputtering

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 474 KB

english, 1978

96

Isotope effect in the study of H-W(100) and O-W(100) chemisorption systems using SIMS

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 236 KB

english, 1978

97

An attempt to understand secondary photon emission

Roger Kelly, C.J. Good-Zamin, M.T. Shehata, D.B. Squires

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 322 KB

english, 1978

98

Improvements in the chemistry of secondary ion mass spectrometry — negative ion techniques

P. Williams, R.K. Lewis, C.A. Evans Jr., P.R. Hanley

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 63 KB

english, 1978

99

Low-energy ion scattering (LEIS) for composition and structure analysis of the outer surface

H.H. Brongersma, T.M. Buck

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 540 KB

english, 1978

100

Angular variations of backscattering yield with 20 keV proton bombardment

T. Ichinokawa, T. Kawamura, H. Nakamura, F. Fujimoto, K. Komaki

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 275 KB

english, 1978

101

Displacement of ion scattering peaks from positions predicted by binary scattering

H.F. Helbig, P.J. Adelmann, A.C. Miller, A.W. Czanderna

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 457 KB

english, 1978

102

Oscillatory scattered ion yields from nonconductive materials

D.L. Christensen, V.G. Mossotti, T.W. Rusch, R.L. Erickson

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 262 KB

english, 1978

103

Comparison of a time-of-flight system with an electrostatic analyzer in low-energy ion scattering

T.M. Buck, G.H. Wheatley, G.L. Miller, D.A.H. Robinson, Y.-S. Chen

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 323 KB

english, 1978

104

Surface analysis using medium energy ion and neutral scattering

Said A. Agamy, James E. Robinson

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 270 KB

english, 1978

105

The charge states of He and Ne backscattered from Ni in the energy range of 1.5–15 keV

W. Eckstein, V.A. Molchanov, H. Verbeek

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 450 KB

english, 1978

106

Investigation of ion impact desorption of atoms and molecules by low energy ion scattering (ISS)

E. Taglauer, U. Beitat, W. Heiland

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 315 KB

english, 1978

107

New developments in non-vacuum analysis

G. Deconninck, F. Bodart

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 411 KB

english, 1978

108

Investigation of dislocations by backscattering spectrometry and transmission electron microscopy

W.F. Tseng, J. Gyulai, T. Koji, S.S. Lau, J. Roth, J.W. Mayer

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 360 KB

english, 1978

109

Use of ion beam techniques to characterize thin plasma grown GaAs and GaAlAs oxide films

Robert L. Kauffman, L.C. Feldman, R.P.H. Chang

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 295 KB

english, 1978

110

Kinetic aspects of solid-phase epitaxial growth of amorphous Si

Z. L Liau, S.S. Lau, M-A. Nicolet, J.W. Mayer, R.J. Blattner, P. Williams, C.A. Evans Jr.

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 455 KB

english, 1978

111

Marker studies of silicide formation, silicon self-diffusion and silicon epitaxy using radioactive silicon and Rutherford backscattering

R. Pretorius, C.L. Ramiller, M-A. Nicolet

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 379 KB

english, 1978

112

Profiles of ion-implanted Be in GaAs by means of (p, α) nuclear reaction and SIMS methods

G.K. Hubler, J. Comas, L. Plew

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 335 KB

english, 1978

113

On the annealing behaviour of dysprosium ion implanted nickel: A combined study using Rutherford backscattering, transmission electron microscopy, and total current spectroscopy

L.T. Chadderton, E. Johnson, S.A. Komolov

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 785 KB

english, 1978

114

Interface studies of metal-semiconductor contacts by means of SIMS, nuclear reaction and RBS

J.P. Ponpon, J.J. Grob, A. Grob, R. Stuck, P. Siffert

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 411 KB

english, 1978

115

Analysis of boron predeposited silicon wafers by combined ion beam techniques and X-ray microanalysis

A. Armigliato, G.G. Bentini, G. Ruffini, G. Battaglin, G. Della Mea, A.V. Drigo

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 494 KB

english, 1978

116

Analysis of anodically oxidized InP by MeV 4He+ channeling effect measurements and Auger electron spectrometry

R.J. Wagner, S.S. Lau, R.P. Küllen, D.L. Lile, N.K. Wagner

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 298 KB

english, 1978

117

A shutter-controlled microbeam combined with scanning system for two-dimensional backscattering images

P. Bayerl, P. Eichinger

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 281 KB

english, 1978

118

The Heidelberg proton microprobe

Fritz Bosch, Ahmed El Goresy, Bernd Martin, Bogdan Povh, Rainer Nobiling, Dirk Schwalm, Kurt Traxel

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 743 KB

english, 1978

119

A miniature electrostatic lens for forming MeV millibeams

W.M. Augustyniak, D. Betteridge, W.L. Brown

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 828 KB

english, 1978

120

Analysis of the lateral distribution of trace elements in biological and other materials by proton-induced X-ray fluorescence using a microbeam scanner

H.R. Wilde, M. Roth, C.D. Uhlhorn, B. Gonsior

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 608 KB

english, 1978

121

Ion and electron beam interaction on surfaces — A detection mechanism for obtaining visual ion beam images

Joseph Fine, R. Gorden Jr.

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 594 KB

english, 1978

122

The gas proportional scintillation counter: Evaluation of performances with interest for analysis by ion beam techniques

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 258 KB

english, 1978

123

An apparatus for channeling experiments at torr pressures

I. Golecki, C. Jaccard

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 533 KB

english, 1978

124

Stopping power of 0.3–2.6 MeV 4He ions in Fe and Ni

J.E.E. Baglin, W.K. Chu

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 430 KB

english, 1978

125

A UHV chamber for metal-semiconductor and metal-metal thin film studies

C.A. Crider, J.M. Poate, J.E. Rowe, G.H. Wheatley

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 634 KB

english, 1978

126

Precision absolute thin film standard reference targets for nuclear reaction microanalysis of oxygen isotopes: Part I: 16O standards

G. Amsel, J.P. Nadai, C. Ortega, S. Rigo, J. Siejka

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 741 KB

english, 1978

127

Precision absolute thin film standard reference targets for nuclear reaction microanalysis of oxygen isotopes: Part II: 18O and 17O standards

G. Amsel, J.P. Nadai, C. Ortega, J. Siejka

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 752 KB

english, 1978

128

Precision absolute thin film standard reference targets for Rutherford backscattering microanalysis

S. Rigo, C. Cohen, A. L'hoir, E. Backelandt

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 548 KB

english, 1978

129

Standards for backscattering analysis

I.V. Mitchell, H.L. Eschbach

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 517 KB

english, 1978

130

Possible applications of a high brightness gallium source to ion microprobes

G.R. Ringo, V.E. Krohn

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 203 KB

english, 1978

131

Miniature ion sources for analytical instruments

R. Clampitt, D.K. Jefferies

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 692 KB

english, 1978

132

Change in stoichiometry of thin films of palladium chloride during ion beam analysis

J.L. Whitton, G. Sørensen, J.S. Williams

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 311 KB

english, 1978

133

A hybrid pulse pile-up rejection system as applied to Rutherford backscattering

R.A. Boie, K.R. Wildnauer

Journal:

Nuclear Instruments and Methods

Year:

1978

File:

PDF, 22 KB

1978

134

Author index

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 644 KB

english, 1978

135

The use of proton-excited X-rays for thin-film profiling

A.B. Campbell, B.D. Sartwell

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 41 KB

english, 1978

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