![](/img/cover-not-exists.png)
Surface layer analysis by MEIS using a solid state detector
D. Hoonhout, C.B.W. Kerkdijk, R.S. Bhattacharya, H.H. Kersten, W.C. Turkenburg, F.W. SarisVolume:
149
Year:
1978
Language:
english
Pages:
6
DOI:
10.1016/0029-554x(78)90887-x
File:
PDF, 527 KB
english, 1978