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On the annealing behaviour of dysprosium ion implanted nickel: A combined study using Rutherford backscattering, transmission electron microscopy, and total current spectroscopy
L.T. Chadderton, E. Johnson, S.A. KomolovVolume:
149
Year:
1978
Language:
english
Pages:
7
DOI:
10.1016/0029-554x(78)90943-6
File:
PDF, 785 KB
english, 1978